Superconductive integrated circuit devices with on-chip testing
On-chip testing of a superconductive integrated circuit device includes receiving a superconductive circuit design having superconductive logic elements. Further, a first testability characteristic for first test circuitry at a first node within the superconductive circuit design is determined. The first testability characteristic corresponds to one or more of a test generation control level and a test observability control level. An updated superconductive circuit design from the superconductive circuit design is generated based on the first testability characteristic for the first test circuitry. The superconductive circuit design includes the first test circuitry at the first node.
1. A method comprising:
receiving a superconductive circuit design comprising superconductive logic elements;
determining, via a processing device, a first testability characteristic for first test circuitry at a first node within the superconductive circuit design, wherein the first testability characteristic corresponds to one or more of a test generation control level and a test observability control level;
generating an updated superconductive circuit design from the superconductive circuit design based on the first testability characteristic for the first test circuitry, wherein the updated superconductive circuit design includes the first test circuitry at the first node; and
outputting the updated superconductive circuit design to a device, wherein the first test circuitry of the updated superconductive circuit design is used to detect one or more of a fault and a defect within the updated superconductive circuit design.
2. The method of claim 1 , wherein the first test circuitry is one or more of test insertion circuitry configured to receive a test signal and test extraction circuitry configured to output a test output signal.
3. The method of claim 1 , further comprising:
determining a second testability characteristic for a second test circuitry at the first node within the superconductive circuit design, wherein a type of the first test circuitry differs from a type of the second test circuitry.
4. The method of claim 3 further comprising:
wherein generating the updated superconductive circuit design to include the first test circuitry includes selecting the first test circuitry based on a comparison of the first testability characteristic and the second testability characteristic.
5. The method of claim 1 , wherein generating the updated superconductive circuit design to include the first test circuitry at the first node based on the first testability characteristic comprises determining that the first testability characteristic is less than a first threshold value.
6. The method of claim 1 , wherein generating the updated superconductive circuit design to include the first test circuitry is further based on a first overhead characteristic of the first test circuitry being less than a second threshold value.
7. The method of claim 6 , wherein the first overhead characteristic corresponds to one or more of circuit area, power dissipation, detection time, and processing delay.
8. A non-transitory computer readable medium comprising stored instructions, which when executed by a processor, cause the processor to:
receive a superconductive circuit design comprising superconductive logic elements;
determine a first testability characteristic for first test circuitry at a first node within the superconductive circuit design, wherein the first testability characteristic corresponds to one or more of a test generation control level and a test observability control level; and
generate an updated superconductive circuit design from the superconductive circuit design based on the first testability characteristic of the first test circuitry, wherein the superconductive circuit design includes the first test circuitry at the first node.
9. The non-transitory computer readable medium of claim 8 , wherein the first test circuitry is one or more of test insertion circuitry configured to receive a test signal and test extraction circuitry configured to output a test output signal.
10. The non-transitory computer readable medium of claim 8 , further comprising:
determining a second testability characteristic for a second test circuitry at the first node within the superconductive circuit design, wherein a type of the first test circuitry differs from a type of the second test circuitry.
11. The non-transitory computer readable medium of claim 10 , wherein generating the updated superconductive circuit design to include the first test circuitry includes selecting the first test circuitry based on a comparison of the first testability characteristic and the second testability characteristic.
12. The non-transitory computer readable medium of claim 8 , wherein generating the updated superconductive circuit design to include the first test circuitry at the first node based on the first testability characteristic and comprises determining that the first testability characteristic is less than a first threshold value.
13. The non-transitory computer readable medium of claim 8 , wherein generating the updated superconductive circuit design to include the first test circuitry is further based on a first overhead characteristic of the first test circuitry being less than a second threshold value.
14. The non-transitory computer readable medium of claim 13 , wherein the first overhead characteristic corresponds to one or more of circuit area, power dissipation, detection time, and processing delay.