IP Library › Granted Patent US 12,630,924
Granted Patent B2
US 12,630,924 · App. 18/541,166 · Granted May 19, 2026

Transition metal deposition method

Inventors: Charles Dezelah (Helsinki, FI); Jan Maes Willem (Wilrijk, BE); Elina Färm (Helsinki, FI); Saima Ali (Helsinki, FI); Antti Niskanen (Uusimaa, FI)
Assignee: ASM IP Holding B.V.
C23C16/45553C23C16/18C23C16/45527C23C16/45544C23C16/45559C23C16/54
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Quick Facts
Patent No.
US 12,630,924
App. No.
18/541,166
Granted
May 19, 2026
Kind
B2
Abstract

Methods of depositing transition metal on a substrate. The disclosure further relates to a transition metal layer, to a structure and to a device comprising a transition metal layer. In the method, transition metal is deposited on a substrate by a cyclical deposition process, and the method comprises providing a substrate in a reaction chamber, providing a transition metal precursor to the reaction chamber in a vapor phase and providing a reactant to the reaction chamber in a vapor phase to form transition metal on the substrate. The transition metal precursor comprises a transition metal from any of groups 4 to 6, and the reactant comprises a group 14 element selected from Si, Ge or Sn.

Claims (24)

1 . A method of depositing a transition metal on a substrate by a cyclical deposition process, the method comprising:

providing a substrate in a reaction chamber;

providing a transition metal precursor to the reaction chamber in a vapor phase; and

providing a reactant to the reaction chamber in a vapor phase to form the transition metal on the substrate; wherein:

the transition metal precursor comprises titanium, zirconium, hafnium, vanadium, niobium, tantalum, chromium, or molybdenum,

the reactant comprises a group 14 element, and

at least 60% of the transition metal is deposited as elemental metal, and

the reactant has a general formula RaMXb or RcXdM-MRcXd, wherein a is 0-3, b is 4-a, c is 0, 1 or 2, d is 3-c, R is hydrocarbon, M is Ge or Sn, and each X is independently any ligand.

2 . The method according to claim 1 , wherein the reactant comprises silicon.

3 . The method according to claim 1 , wherein the reactant comprises carbon.

4 . The method according to claim 1 , wherein the transition metal comprises molybdenum.

5 . The method according to claim 1 , wherein the transition metal precursor comprises a metal-organic precursor.

6 . The method according to claim 5 , wherein the transition metal precursor comprises an additional ligand.

7 . The method according to claim 6 , wherein the additional ligand is a halide.

8 . The method according to claim 1 , wherein the transition metal precursor comprises a benzene or a cyclopentadienyl group.

9 . The method according to claim 1 , wherein the reactant comprises an organic group.

10 . The method according to claim 1 , wherein R is an alkyl or an aryl.

11 . The method according to claim 1 , wherein X is hydrogen, a substituted or an unsubstituted alkyl, a substituted or an unsubstituted aryl, or a halogen.

12 . The method according to claim 11 , wherein X is a substituted alkyl or the substituted aryl, and wherein the substituent is same as M.

13 . The method according to claim 1 , wherein the transition metal precursor is supplied in pulses, the reactant is supplied in pulses, and the reaction chamber is purged between consecutive pulses of the transition metal precursor and reactant.

14 . The method according to claim 1 , wherein the pressure in the reaction chamber is between 0.1 and 100 Torr.

15 . The method according to claim 1 , wherein the cyclical deposition process comprises a thermal deposition process.

16 . The method according to claim 1 , wherein the substrate comprises a dielectric surface and the transition metal is deposited on the dielectric surface.

17 . The method according to claim 1 , wherein the transition metal is a group 4 or a group 5 metal.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 15, 2023
From: DEZELAH, CHARLES; MAES, JAN WILLEM; FÄRM, ELINA; ALI, SAIMA; NISKANEN, ANTTI
To: ASM IP HOLDING B.V.
Reel/Frame 065881/0279 →
Continuity (3)
Continuation 17554009 · Dec 17, 2021
Provisional Application 63129024 · Dec 22, 2020
Related Publication 20240133032A1 · Apr 25, 2024
References Cited (33)
US 6524952B1 · Srinivas et al. · 2003 [cited by applicant]
US 7244858B2 · Meiere · 2007 [cited by applicant]
US 7964505B2 · Khandelwal · 2011 [cited by examiner]
US 10049924B2 · Haukka · 2018 [cited by examiner]
US 10643904B2 · Xie · 2020 [cited by examiner]
US 10714350B2 · Chen · 2020 [cited by examiner]
US 10847366B2 · Mattinen · 2020 [cited by examiner]
US 11885020B2 · Dezelah · 2024 [cited by examiner]
US 20030190424A1 · Sneh · 2003 [cited by applicant]
US 20050059241A1 · Kori et al. · 2005 [cited by applicant]
US 20050215805A1 · Meiere · 2005 [cited by applicant]
US 20080102204A1 · Elers · 2008 [cited by examiner]
US 20080102205A1 · Barry et al. · 2008 [cited by applicant]
US 20090053893A1 · Khandelwal · 2009 [cited by examiner]
US 20110293830A1 · Hatanpaa · 2011 [cited by examiner]
US 20150140776A1 · Yasuda · 2015 [cited by examiner]
US 20180122642A1 · Raisanen · 2018 [cited by examiner]
US 20180122709A1 · Xie · 2018 [cited by examiner]
US 20190249300A1 · Hatanpää et al. · 2019 [cited by examiner]
US 20190368039A1 · Arteaga · 2019 [cited by examiner]
US 20200115798A1 · Wright, Jr. · 2020 [cited by examiner]
US 20200232096A1 · Hatanpää et al. · 2020 [cited by examiner]
US 20240096632A1 · Färm · 2024 [cited by examiner]
WO 2001029280A1 · 2001 [cited by applicant]
WO 2018199642A1 · 2018 [cited by applicant]
WO WO2020003000A1 · 2020 [cited by examiner]
Klesko, Joseph P., et al., “Thermal Atomic Layer Deposition of Titanium Films Using Titanium Tetrachloride and 2 Methyl-1,4-bis(trimethylsilyl)-2,5-cyclohexadiene or 1,4-Bis(trimethylsilyl)-1,4-dihydropyrazine”. Chemist… [cited by examiner]
Zhang, Xingyu, et al., “Atomic layer deposition of Ti and its deposition method”. IOP Conf. Series: Materials Science and Engineering 772 (2020) 012018, pp. 1-8. [cited by examiner]
Tarre, Aivar, et al., “Atomic layer deposition of Cr2O3 thin films: Effect of crystallization on growth and properties”. Applied Surface Science 254 (2008) 5149-5156. [cited by examiner]
Boukhalfa, Sofiane, et al., “Atomic layer deposition of vanadium oxide on carbon nanotubes for high-power supercapacitor electrodes”. Energy & Environmental Science, 2012, 5, 6872-6879. [cited by examiner]
Lim, Booyong S., et al., “Atomic layer deposition of transition metals”. Nature Materials, vol.2, Nov. 2003, pp. 749-754. [cited by examiner]
Knisley, Thomas J., et al., “Precursors and chemistry for the atomic layer deposition of metallic first row transition metal films”. Coordination Chemistry Reviews 257 (2013) 3222-3231. [cited by examiner]
Shenai, Deo V., et al., “Safer alternative liquid germanium precursors for relaxed graded SiGe layers and strained silicon by MOVPE”, Journal of Crystal Growth, vol. 298, Jan. 2007, pp. 172-175. [cited by examiner]