IP Library › Granted Patent US 12,740,113
Granted Patent B2
US 12,740,113 · App. 18/481,632 · Granted Sep 15, 2026

Bipolar transistor structures with cavity below extrinsic base and methods to form same

Inventors: Uppili S. Raghunathan (Essex Junction, VT); Alexander M. Derrickson (Saratoga Springs, NY); Sarah A. McTaggart (Essex Junction, VT); Judson Robert Holt (Ballston Lake, NY); Vibhor Jain (Clifton Park, NY)
Assignee: GlobalFoundries U.S. Inc.
H10D62/184H10D10/01H10D10/054H10D10/061H10D62/115H10D62/134
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Quick Facts
Patent No.
US 12,740,113
App. No.
18/481,632
Granted
Sep 15, 2026
Kind
B2
Abstract

The disclosure provides bipolar transistor structures with a cavity below an extrinsic base, and methods to form the same. A structure of the disclosure provides a bipolar transistor structure including an extrinsic base protruding from an intrinsic base of a bipolar transistor. The extrinsic base extends over a cavity. An insulator is horizontally adjacent the cavity and below a portion of the extrinsic base. A collector extension region of the bipolar transistor structure extends laterally below the insulator and the cavity.

Claims (40)

1 . A structure comprising:

a bipolar transistor structure including an extrinsic base protruding from an intrinsic base of the bipolar transistor structure, wherein an upper surface of the extrinsic base includes a notch;

an insulator below a portion of the extrinsic base, wherein a collector extension region of the bipolar transistor structure extends laterally below the insulator; and

a cavity encapsulated within the insulator, wherein the cavity is vertically between the collector extension region and the portion of the extrinsic base, and horizontally offset from the notch.

2 . The structure of claim 1 , wherein the extrinsic base includes a monocrystalline semiconductor.

3 . The structure of claim 1 , wherein the collector extension region includes a silicide region extending laterally below the cavity to the insulator such the cavity is vertically between the silicide region and the extrinsic base.

4 . The structure of claim 1 , wherein the insulator includes:

a nitride encapsulating the cavity, and

an oxide below a portion of the nitride and adjacent a portion of the collector.

5 . The structure of claim 4 , wherein the oxide includes a lower portion adjacent the collector and an upper portion between the nitride and the intrinsic base.

6 . The structure of claim 1 , further comprising a void within the extrinsic base above the insulator, wherein the void electrically separates an emitter of the bipolar transistor structure from an adjacent emitter.

7 . The structure of claim 1 , further comprising a spacer material within the notch on the upper surface of the extrinsic base.

8 . A structure comprising:

a vertical bipolar transistor structure including:

a collector on a substrate,

an intrinsic base on the collector,

an extrinsic base protruding from the intrinsic base,

wherein an upper surface of the extrinsic base includes a notch, and

an emitter on a portion of the intrinsic base;

an insulator below a portion of the extrinsic base, wherein a collector extension region of the bipolar transistor structure extends laterally below the insulator; and

a cavity encapsulated within the insulator, wherein the cavity is vertically between the collector extension region and the portion of the extrinsic base, and horizontally offset from the notch.

9 . The structure of claim 8 , wherein the intrinsic base includes silicon germanium (SiGe), and wherein the extrinsic base includes a monocrystalline semiconductor.

10 . The structure of claim 8 , wherein the collector includes a silicide region extending laterally below the cavity to the insulator such the cavity is vertically between the silicide region and the extrinsic base.

11 . The structure of claim 8 , wherein the insulator includes:

a nitride encapsulating the cavity, and

an oxide below a portion of the nitride and adjacent a portion of the collector.

12 . The structure of claim 11 , wherein the oxide includes a lower portion adjacent the collector and an upper portion between the nitride and the intrinsic base.

13 . The structure of claim 8 , further comprising a void within the extrinsic base above the insulator, wherein the void electrically separates an emitter of the vertical bipolar transistor structure from an adjacent emitter.

14 . The structure of claim 8 , further comprising a silicide material on an upper surface, a sidewall, and a lower surface of the extrinsic base.

15 . A method comprising:

forming a bipolar transistor structure including an extrinsic base protruding from an intrinsic base of the bipolar transistor structure, wherein an upper surface of the extrinsic base includes a notch;

forming an insulator and below a portion of the extrinsic base, wherein a collector extension region of the bipolar transistor structure extends laterally below the insulator; and

forming a cavity encapsulated within the insulator, wherein the cavity is vertically between the collector extension region and the portion of the extrinsic base, and horizontally offset from the notch.

16 . The method of claim 15 , further comprising forming a silicide region within the collector, the silicide region extending laterally below the cavity to the insulator such the cavity is vertically between the silicide region and the extrinsic base.

17 . The method of claim 15 , wherein forming the insulator includes:

forming a nitride to encapsulate the cavity, and

forming an oxide below a portion of the nitride and adjacent a portion of the collector.

18 . The method of claim 17 , wherein the oxide includes a lower portion adjacent the collector and an upper portion between the nitride and the intrinsic base of the bipolar transistor structure.

19 . The method of claim 15 , wherein forming the insulator includes forming a spacer material to fill the notch within an upper surface of the extrinsic base.

20 . The method of claim 15 , further comprising forming a void within the extrinsic base above the insulator, wherein the void electrically separates an emitter of the bipolar transistor structure from an adjacent emitter.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 10, 2023
From: RAGHUNATHAN, UPPILI S.; DERRICKSON, ALEXANDER M.; MCTAGGART, SARAH A.; HOLT, JUDSON ROBERT; JAIN, VIBHOR
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 065166/0810 →
Continuity (1)
Related Publication 20250120144A1 · Apr 10, 2025
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