IP Library › Granted Patent US 12,740,285
Granted Patent B2
US 12,740,285 · App. 18/039,860 · Granted Sep 15, 2026

Method for fabricating display apparatus comprising forming conductive layer electrically connected to cathodes of light-emitting elements

Inventors: Shunpei Yamazaki (Tokyo, JP); Shingo Eguchi (Atsugi, JP); Kenichi Okazaki (Atsugi, JP); Koji Kusunoki (Isehara, JP); Kensuke Yoshizumi (Atsugi, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H10K59/80522H10K59/1201H10K71/231H10K71/621
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,740,285
App. No.
18/039,860
Granted
Sep 15, 2026
Kind
B2
Abstract

A novel method for fabricating a display apparatus is provided. An anode is formed over an insulating layer, an EL layer is formed over the anode, and a cathode is formed over the EL layer. A plurality of light-emitting elements are formed without provision of a partition by selectively removing parts of the anode, the EL layer, and the cathode. A conductive layer having a light-transmitting property is formed to cover the plurality of light-emitting elements. The cathodes of the plurality of light-emitting elements are electrically connected to the conductive layer.

Claims (46)

1 . A method for fabricating a display apparatus, comprising:

a step of forming an anode over an insulating layer;

a step of forming an EL layer over the anode;

a step of forming a cathode over the EL layer;

a step of selectively removing parts of the anode, the EL layer, and the cathode to expose a top surface of the insulating layer and to form a plurality of light-emitting elements; and

a step of forming a conductive layer covering the plurality of light-emitting elements,

wherein the cathode of each of the plurality of light-emitting elements is electrically connected to the conductive layer, and

wherein the conductive layer has a light-transmitting property.

2 . The method for fabricating the display apparatus according to claim 1 , further comprising:

a step of forming a plurality of transistors over a substrate; and

a step of forming the insulating layer over the plurality of transistors,

wherein the insulating layer comprises a surface of the insulating layer serving as a formation surface with reduced unevenness.

3 . The method for fabricating the display apparatus according to claim 2 ,

wherein the transistor comprises an oxide semiconductor.

4 . The method for fabricating the display apparatus according to claim 3 ,

wherein the oxide semiconductor comprises at least one of indium and zinc.

5 . The method for fabricating the display apparatus according to claim 1 ,

wherein an interval between two of the light-emitting elements adjacent to each other is less than or equal to 10 μm.

6 . The method for fabricating the display apparatus according to claim 1 ,

wherein each of the plurality of light-emitting elements is of a top-emission type.

7 . The method for fabricating the display apparatus according to claim 1 ,

wherein the parts of the EL layer are etched by a dry etching method in the step of selectively removing the parts of the EL layer.

8 . The method for fabricating the display apparatus according to claim 1 , wherein side surfaces of the anode, the EL layer, and the cathode in each of the plurality of light-emitting elements are aligned or substantially aligned with each other.

9 . A method for fabricating a display apparatus, comprising:

a step of forming an anode over an insulating layer;

a step of forming an EL layer over the anode;

a step of forming a cathode over the EL layer;

a step of selectively removing parts of the anode, the EL layer, and the cathode to expose a top surface of the insulating layer and to form a plurality of light-emitting elements; and

a step of forming a conductive layer over the plurality of light-emitting elements,

wherein the parts of the anode, the EL layer, and the cathode are collectively removed using a resist mask, and

wherein at least in two of the plurality of light-emitting elements, the cathodes of the light-emitting elements adjacent to each other are electrically connected to the conductive layer.

10 . The method for fabricating the display apparatus according to claim 9 , further comprising:

a step of forming a plurality of transistors over a substrate; and

a step of forming the insulating layer over the plurality of transistors,

wherein the insulating layer comprises a surface of the insulating layer serving as a formation surface with reduced unevenness.

11 . The method for fabricating the display apparatus according to claim 10 ,

wherein the transistor comprises an oxide semiconductor.

12 . The method for fabricating the display apparatus according to claim 11 ,

wherein the oxide semiconductor comprises at least one of indium and zinc.

13 . The method for fabricating the display apparatus according to claim 9 ,

wherein an interval between the two of the light-emitting elements adjacent to each other is less than or equal to 10 μm.

14 . The method for fabricating the display apparatus according to claim 9 ,

wherein each of the plurality of light-emitting elements is of a top-emission type.

15 . The method for fabricating the display apparatus according to claim 9 ,

wherein the parts of the EL layer are etched by a dry etching method in the step of selectively removing the parts of the EL layer.

16 . The method for fabricating the display apparatus according to claim 9 , wherein side surfaces of the anode, the EL layer, and the cathode in each of the plurality of light-emitting elements are aligned or substantially aligned with each other.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 1, 2023
From: YAMAZAKI, SHUNPEI; EGUCHI, SHINGO; OKAZAKI, KENICHI; KUSUNOKI, KOJI; YOSHIZUMI, KENSUKE
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 063831/0028 →
Priority Claims (1)
JP 2020-202409 · Dec 7, 2020 · national
Continuity (1)
Related Publication 20240023371A1 · Jan 18, 2024
References Cited (67)
US 5953985A · Kobayashi · 1999 [cited by applicant]
US 6120338A · Hirano et al. · 2000 [cited by applicant]
US 6906344B2 · Yamazaki et al. · 2005 [cited by applicant]
US 7154119B2 · Yamazaki et al. · 2006 [cited by applicant]
US 7535022B2 · Yamazaki et al. · 2009 [cited by applicant]
US 20010049030A1 · Okada et al. · 2001 [cited by applicant]
US 20020072139A1 · Kashiwabara · 2002 [cited by applicant]
US 20030006699A1 · Ogino · 2003 [cited by examiner]
US 20030015703A1 · Yamazaki et al. · 2003 [cited by applicant]
US 20030232563A1 · Kamiyama et al. · 2003 [cited by applicant]
US 20110148290A1 · Oota · 2011 [cited by applicant]
US 20120256204A1 · Yoshizumi et al. · 2012 [cited by applicant]
US 20120273804A1 · Hatano · 2012 [cited by applicant]
US 20120276484A1 · Izumi et al. · 2012 [cited by applicant]
US 20130084531A1 · Hamaguchi et al. · 2013 [cited by applicant]
US 20130084664A1 · Yoshitoku et al. · 2013 [cited by applicant]
US 20130084666A1 · Oshige · 2013 [cited by applicant]
US 20130280839A1 · Sonoda et al. · 2013 [cited by applicant]
US 20130295705A1 · Sonoda et al. · 2013 [cited by applicant]
US 20140004640A1 · Hamaguchi et al. · 2014 [cited by applicant]
US 20140004642A1 · Otsuka et al. · 2014 [cited by applicant]
US 20140175469A1 · Dozen et al. · 2014 [cited by applicant]
US 20150060826A1 · Matsumoto et al. · 2015 [cited by applicant]
US 20150069360A1 · Sato · 2015 [cited by applicant]
US 20150076476A1 · Odaka et al. · 2015 [cited by applicant]
US 20160172595A1 · Malinowski et al. · 2016 [cited by applicant]
US 20160315133A1 · Sato · 2016 [cited by applicant]
US 20170141167A1 · Naganuma · 2017 [cited by applicant]
US 20170256754A1 · Defranco et al. · 2017 [cited by applicant]
US 20180190908A1 · Ke et al. · 2018 [cited by applicant]
US 20180261792A1 · Kwon et al. · 2018 [cited by applicant]
US 20200203662A1 · Mollard et al. · 2020 [cited by applicant]
US 20240155869A1 · Eguchi · 2024 [cited by examiner]
US 20240306423A1 · Yamazaki · 2024 [cited by examiner]
CN 108574057A · 2018 [cited by applicant]
CN 109509765A · 2019 [cited by applicant]
JP 10208883A · 1998 [cited by applicant]
JP 2000036385A · 2000 [cited by applicant]
JP 2003051599A · 2003 [cited by applicant]
JP 2003059663A · 2003 [cited by applicant]
JP 2003157973A · 2003 [cited by applicant]
JP 2003347053A · 2003 [cited by applicant]
JP 2008098106A · 2008 [cited by applicant]
JP 2008147072A · 2008 [cited by applicant]
JP 2008251270A · 2008 [cited by applicant]
JP 2014120218A · 2014 [cited by applicant]
JP 2014123527A · 2014 [cited by applicant]
JP 2014135251A · 2014 [cited by applicant]
JP 2014232568A · 2014 [cited by applicant]
JP 2015115178A · 2015 [cited by applicant]
JP 2016197494A · 2016 [cited by applicant]
JP 2019179696A · 2019 [cited by applicant]
JP 2020160305A · 2020 [cited by applicant]
KR 20180104227A · 2018 [cited by applicant]
Zakhidov.A et al., “Orthogonal processing: A new strategy for organic electronics”, Chem. Sci. (Chemical Science), Apr. 7, 2011, vol. 2, No. 6, pp. 1178-1182. [cited by applicant]
Malinowski.P et al., “High resolution photolithography for direct view active matrix organic light-emitting diode augmented reality displays”, J. Soc. Inf. Display (Journal of the Society for Information Display), Apr. … [cited by applicant]
Malinowski.P et al., “Photolithographic patterning of organic photodetectors with a non-fluorinated photoresist system”, Organic Electronics, Jul. 12, 2014, vol. 15, No. 10, pp. 2355-2359. [cited by applicant]
Malinowski.P et al., “Multicolor 1250 ppi OLED Arrays Patterened by Photolithography”, SID Digest '16 : SID International Symposium Digest of Technical Papers, May 22, 2016, vol. 47, No. 1, pp. 1009-1012. [cited by applicant]
Papadopoulos.N et al., “AMOLED Displays with In-Pixel Photodetector”, Liquid Crystals and Display Technology, Jul. 9, 2020, pp. 1-19. [cited by applicant]
Ke.T et al., “Technology Developments in High-Resolution FMM-free OLED and BEOL IGZO TFTs for Power-Efficient Microdisplays”, SID Digest '21 : SID International Symposium Digest of Technical Papers, May 1, 2021, vol. 52… [cited by applicant]
Malinowski.P et al., “Integration of additional functionalities into the frontplane of AMOLED displays”, SID Digest '20 : SID International Symposium Digest of Technical Papers, Aug. 1, 2020, vol. 51, No. 1, pp. 646-649. [cited by applicant]
Malinowski.P et al., “Organic photolithography for displays with integrated fingerprint scanner”, SID Digest '19 : SID International Symposium Digest of Technical Papers, May 29, 2019, vol. 50, No. 1, pp. 1007-1010. [cited by applicant]
Ke.T et al., “Island and Hole Fabrication on OLED Stack for High-Resolution Sensor in Display Application”, IDW '20 : Proceedings of the 27th International Display Workshops, Dec. 9, 2020, vol. 27, pp. 902-905. [cited by applicant]
Gather.M et al., “Solution-Processed Full-Color Polymer-OLED Displays Fabricated by Direct Photolithography”, SID Digest '06 : SID International Symposium Digest of Technical Papers, Jun. 1, 2006, vol. 37, No. 1, pp. 90… [cited by applicant]
Malinowski.P et al., “Photolithography as Enabler of AMOLED Displays Beyond 1000 ppi”, SID Digest '17 : SID International Symposium Digest of Technical Papers, May 1, 2017, vol. 48, No. 1, pp. 623-626. [cited by applicant]
International Search Report (Application No. PCT/IB2021/060953) Dated Mar. 22, 2022. [cited by applicant]
Written Opinion (Application No. PCT/IB2021/060953) Dated Mar. 22, 2022. [cited by applicant]