IP Library Granted Patent US 7,736,930
Granted Patent B2
US 7,736,930 · App. 12/353,489 · Granted Jun 15, 2010

Optical die-down quad flat non-leaded package

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,736,930
App. No.
12/353,489
Granted
Jun 15, 2010
Kind
B2
Abstract

An optical sensor package that includes an optical sensor die is mounted by flip chip interconnect onto a lead frame in a “die-down” orientation, that is, with the active side of the optical sensor die facing the lead frame. An opening is provided in the lead frame die paddle (pad), and light passes from outside the package through the opening in the lead frame die pad onto light collection elements on the active side of the chip.

Claims (45)

1. A method of making a low-profile optical sensor package, comprising:

providing a leadframe having a die pad and interconnect leads electrically isolated from and surrounding the die pad, the die pad having an opening centrally located with respect to a surface area of the die pad;

mounting a semiconductor die to the die pad, the semiconductor die having an optically active surface facing the die pad and aligned to the opening;

disposing a barrier layer around the opening and connecting the semiconductor die and die pad;

disposing an encapsulant over a portion of the semiconductor die and the leadframe, wherein the barrier layer isolates the encapsulant from the optically active surface of the semiconductor die; and

mounting a light-transmitting cover across the opening in the die pad;

wherein the low-profile optical sensor package has a thickness of less than 0.7 millimeters.

2. The method of claim 1 , wherein the barrier layer includes an adhesive material.

3. The method of claim 1 , wherein the opening is circular or rectangular.

4. The method of claim 1 , wherein the optically active surface includes a charge-coupled image sensor.

5. The method of claim 1 , wherein the optically active surface includes a monochrome image sensor.

6. The method of claim 1 , wherein the light-transmitting cover reduces the intensity of light transmitted through the opening to the optically active surface of the semiconductor die.

7. The method of claim 1 , wherein the low-profile optical sensor package is a quad flat non-leaded package.

8. A method of making a semiconductor package, comprising:

providing a leadframe having a die pad and interconnect leads electrically isolated from the die pad;

mounting a semiconductor die to the die pad, the semiconductor die having an optically active surface facing the die pad and aligned to a centrally located opening in the die pad;

disposing a barrier layer around the centrally located opening and connecting the semiconductor die and die pad;

disposing an encapsulant over a portion of the semiconductor die and the leadframe, wherein the barrier layer isolates the encapsulant from the optically active surface of the semiconductor die; and

mounting a light-transmitting cover across the centrally located opening in the die pad by etching the die pad to retain the light-transmitting cover.

9. The method of claim 8 , wherein the semiconductor package has a thickness of less than 0.7 millimeters.

10. The method of claim 8 , wherein the barrier layer includes an adhesive material.

11. The method of claim 8 , wherein the centrally located opening is circular or rectangular.

12. The method of claim 8 , wherein the optically active surface includes a charge-coupled image sensor.

13. The method of claim 8 , wherein the light-transmitting cover reduces the intensity of light transmitted through the centrally located opening to the optically active surface of the semiconductor die.

14. The method of claim 8 , wherein the semiconductor package is a quad flat nonleaded package.

15. A method of making an optical semiconductor package, comprising:

providing a leadframe having a die pad and interconnect leads electrically isolated from the die pad;

mounting a semiconductor die to the die pad, the semiconductor die having an optically active surface facing the die pad and aligned to an opening in the die pad;

disposing a barrier layer around the opening and connecting the semiconductor die and die pad;

disposing an encapsulant over a portion of the semiconductor die and the leadframe, wherein the barrier layer isolates the encapsulant from the optically active surface of the semiconductor die; and

mounting a light-transmitting cover across the opening in the die pad by etching the die pad to retain the light transmitting cover.

16. The method of claim 15 , wherein the semiconductor package has a thickness of less than 0.7 millimeters.

17. The method of claim 15 , wherein the barrier layer includes an adhesive material.

18. The method of claim 15 , wherein the optically active surface includes a charge-coupled image sensor.

19. The method of claim 15 , wherein the optical semiconductor package is a quad flat nonleaded package.

20. A method of making an optical semiconductor package, comprising:

providing a leadframe having a die pad and interconnect leads electrically isolated from the die pad;

mounting a semiconductor die to the die pad, the semiconductor die having an optically active surface facing the die pad and aligned to an opening in the die pad;

disposing a barrier layer around the opening and connecting the semiconductor die and die pad; and

disposing an encapsulant over a portion of the semiconductor die and the leadframe, wherein the barrier layer isolates the encapsulant from the optically active surface of the semiconductor die.

21. The method of claim 20 , further including mounting a light-transmitting cover across the opening in the die pad.

22. The method of claim 21 , further including etching the die pad to retain the light-transmitting cover.

23. The method of claim 21 , wherein the light-transmitting cover reduces the intensity of light transmitted through the opening to the optically active surface of the semiconductor die.

24. The method of claim 20 , wherein the semiconductor package has a thickness of less than 0.7 millimeters.

25. The method of claim 20 , wherein the semiconductor package is a quad flat nonleaded package.

Assignments (7)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 3, 2025
From: STATS CHIPPAC PTE. LTD.
To: STATS CHIPPAC MANAGEMENT PTE. LTD.
Reel/Frame 072788/0917 →
CORRECTIVE ASSIGNMENT TO CORRECT THE THE NAME OF CONVEYING PARTY DATA FROM STATS CHIPPAC PTE. LTE. TO STATS CHIPPAC LTD. AND CORRECT THE NAME OF RECEIVING PARTY DATA FROM STATS CHIPPAC PTE. LTE. TO STATS CHIPPAC PTE. LTD. PREVIOUSLY RECORDED AT REEL: 64838 FRAME: 948. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded May 30, 2024
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTD.
Reel/Frame 067958/0190 →
CORRECT ERROR IN ASSIGNMENT NAME FROM STATS CHIPPAC PTE. LTE. TO STATS CHIPPAC PTE. LTD. (REEL: 038378 FRAME: 0328 Recorded Aug 30, 2023
From: STATS CHIPPAC PTE. LTE.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 064838/0948 →
RELEASE OF SECURITY INTEREST Recorded Jun 15, 2020
From: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
To: STATS CHIPPAC, INC.; STATS CHIPPAC PTE. LTD. FORMERLY KNOWN AS STATS CHIPPAC LTD.
Reel/Frame 052935/0327 →
CHANGE OF NAME Recorded Apr 7, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 038378/0343 →
CHANGE OF NAME Recorded Apr 7, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 038378/0328 →
SECURITY INTEREST Recorded Aug 6, 2015
From: STATS CHIPPAC, INC.; STATS CHIPPAC LTD.
To: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
Reel/Frame 036288/0748 →