IP Library Granted Patent US 8,823,466
Granted Patent B2
US 8,823,466 · App. 12/606,351 · Granted Sep 2, 2014

Miniaturized wide-band baluns for RF applications

Inventors: Kai Liu (Phoenix, AZ); Robert Charles Frye (Piscataway, NJ)
Assignee: STATS ChipPAC, Ltd.
H03H7/42H01F17/0013
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Quick Facts
Patent No.
US 8,823,466
App. No.
12/606,351
Granted
Sep 2, 2014
Kind
B2
Abstract

A wide-band balun device includes a first metallization deposited over a substrate and oriented in a first coil. The first coil extends horizontally across the substrate while maintaining a substantially flat vertical profile. A second metallization is deposited over the substrate and oriented in a second coil. The second coil is magnetically coupled to the first coil and a portion of the second coil oriented interiorly of the first coil. A third metallization is deposited over the substrate and oriented in a third coil. The third coil is magnetically coupled to the first and second coils. A first portion of the third coil is oriented interiorly of the second coil. The third coil has a balanced port connected to the third coil between second and third portions of the third coil.

Claims (40)

1. A wide-band balun device, comprising:

a first coil formed over a substrate in a spiral configuration extending horizontally across the substrate including a constant coil spacing and maintaining a substantially flat vertical profile;

a second coil formed over the substrate coplanar with the first coil and wound together with the first coil to form a nested spiral configuration adjacent to the first coil, the second coil including a constant coil spacing and being magnetically coupled to the first coil; and

a third coil formed over the substrate coplanar with the second coil and wound together with the second coil to form a nested spiral configuration adjacent to the second coil, the third coil including a constant coil spacing and being magnetically coupled to the first and second coils.

2. The wide-band balun device of claim 1 , wherein the substrate is made with silicon, glass, or ceramic material for structural support.

3. The wide-band balun device of claim 1 , wherein the first, second, and third coils include tube structures, the tube structures including a round, square, or rectangular cross-section.

4. The wide-band balun device of claim 1 , wherein the first, second, and third coils include copper or a copper alloy material.

5. The wide-band balun device of claim 1 , wherein the first, second, and third coils are organized over the substrate as a group of two coil structures.

6. The wide-band balun device of claim 1 , wherein the first, second, and third coils are arranged over the substrate as a single integrated structure.

7. The wide-band balun device of claim 1 , wherein the first, second, and third coils extend horizontally across the substrate in a geometrical pattern.

8. The wide-band balun device of claim 1 , wherein the first, second, and third coils each have a length, the first, second, and third coils including an associated mutual inductance along the length of the coils.

9. A balun device, comprising:

a first coil formed over a substrate in a spiral configuration extending horizontally across the substrate and maintaining a substantially flat vertical profile;

a second coil formed over the substrate including a length wound at a fixed spacing with respect to a length of the first coil in a nested spiral configuration, the second coil being magnetically coupled to the first coil; and

a third coil formed over the substrate including a length wound at a fixed spacing with respect to the length of the second coil to form a nested spiral configuration, the third coil being magnetically coupled to the first and second coils.

10. The balun device of claim 9 , wherein the first, second, and third coils are organized over the substrate as a group of two coil structures.

11. The balun device of claim 9 , wherein the first, second, and third coils are arranged over the substrate as a single integrated structure.

12. The balun device of claim 9 , wherein the substrate is made with silicon, glass, or ceramic material for structural support.

13. The balun device of claim 9 , wherein the first, second, and third coils include tube structures, the tube structures including a round, square, or rectangular cross-section.

14. A balun for a semiconductor device, comprising:

a first metallization formed over a substrate and patterned as a first coil extending horizontally across the substrate in a spiral configuration;

a second metallization formed over the substrate and patterned as a second coil coplanar with the first coil and wound together with the first coil in a nested spiral configuration, the second metallization being magnetically coupled to the first metallization; and

a third metallization formed over the substrate and patterned as a third coil coplanar with the second coil and wound together with the second coil in a nested spiral configuration, the third metallization being magnetically coupled to the second metallization.

15. The balun of claim 14 , wherein the substrate is made with silicon, glass, or ceramic material for structural support.

16. The balun of claim 14 , wherein the first, second, and third coils are organized over the substrate as a group of two coil structures.

17. The balun of claim 14 , wherein the first, second, and third coils are arranged over the substrate as a single integrated structure.

18. A method of making a balun, comprising:

forming a first metallization at a first level and a second level over a substrate and patterned as a first coil extending horizontally across the substrate in a spiral configuration including a constant coil spacing;

forming a second metallization at a third level over the substrate and patterned as a second coil between the first and second levels extending horizontally in a spiral configuration including a constant coil spacing, the second metallization being magnetically coupled to the first metallization; and

forming a third metallization at a fourth level over the substrate between the first and second levels patterned as a third coil in a spiral configuration, the third metallization being magnetically coupled to the second metallization.

19. The method of claim 18 , wherein the first and second coils are arranged over the substrate as a single integrated structure.

20. The method of claim 18 , wherein the first and second coils include tube structures, the tube structures including a round, square, or rectangular cross-section.

21. The method of claim 18 , wherein the first and second coils each have a length, the first and second coils including an associated mutual inductance along the length of the coils.

22. A method of making a balun, comprising:

forming a first metallization at a first level and a second level over a substrate and patterned as a first coil;

forming a second metallization at a third level over the substrate and patterned as a second coil between the first and second levels, the second metallization magnetically coupled to the first metallization; and

forming a third metallization between the first and second levels over the substrate and patterned as a third coil, the third metallization magnetically coupled to the second metallization.

23. The method of claim 22 , further including forming the third metallization over the substrate at multiple levels.

24. The method of claim 22 , further including forming the second metallization over the substrate at multiple levels.

25. The method of claim 22 , further including forming the first and second metallizations over the substrate as a single integrated structure.

Assignments (6)
CORRECTIVE ASSIGNMENT TO CORRECT THE SPELLING OF THE ASSIGNEE'S NAME ON THE COVER SHEET PREVIOUSLY RECORDED AT REEL: 038378 FRAME: 0161. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Sep 5, 2023
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTD.
Reel/Frame 064805/0735 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 18, 2019
From: STATS CHIPPAC PTE. LTD.
To: JCET SEMICONDUCTOR (SHAOXING) CO., LTD.
Reel/Frame 051365/0680 →
RELEASE OF SECURITY INTEREST Recorded Dec 13, 2019
From: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
To: STATS CHIPPAC, INC.; STATS CHIPPAC PTE. LTD. FORMERLY KNOWN AS STATS CHIPPAC LTD.
Reel/Frame 051285/0318 →
CHANGE OF NAME Recorded Apr 7, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 038378/0161 →
CHANGE OF NAME Recorded Apr 7, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 038378/0343 →
SECURITY INTEREST Recorded Aug 6, 2015
From: STATS CHIPPAC, INC.; STATS CHIPPAC LTD.
To: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
Reel/Frame 036288/0748 →
Continuity (2)
Continuation 11760207 · Jun 8, 2007
Related Publication 20100045398A1 · Feb 25, 2010