Semiconductor device and method of forming through hole vias in die extension region around periphery of die
A semiconductor wafer contains a plurality of semiconductor die. The semiconductor wafer is diced to separate the semiconductor die. The semiconductor die are transferred onto a carrier. A die extension region is formed around a periphery of the semiconductor die on the carrier. The carrier is removed. A plurality of through hole vias (THV) is formed in first and second offset rows in the die extension region. A conductive material is deposited in the THVs. A first RDL is formed between contact pads on the semiconductor die and the THVs. A second RDL is formed on a backside of the semiconductor die in electrical contact with the THVs. An under bump metallization is formed in electrical contact with the second RDL. Solder bumps are formed on the under bump metallization. The die extension region is singulated to separate the semiconductor die.
1. A semiconductor device, comprising:
a semiconductor die;
a die extension region including a polymer material formed around a periphery of the semiconductor die with a back surface of the semiconductor die exposed from the polymer material;
a plurality of conductive vias formed through the die extension region including singulated surfaces of the conductive vias exposed at an edge of the semiconductor device;
a first conductive layer formed between contact pads over an active surface of the semiconductor die and the conductive vias;
a second conductive layer formed over the back surface of the semiconductor die, opposite the active surface, electrically connected to the conductive vias; and
a first interconnect structure formed over the back surface of the semiconductor die electrically connected to the second conductive layer.
2. The semiconductor device of claim 1 , wherein the polymer material includes a molding compound or epoxy.
3. The semiconductor device of claim 1 , further including a second interconnect structure formed over the active surface of the semiconductor die electrically connected to the first conductive layer.
4. The semiconductor device of claim 3 , wherein the second interconnect structure includes:
an insulating layer formed over the first conductive layer; and
an under bump metallization (UBM) formed over the first conductive layer.
5. The semiconductor device of claim 1 , wherein the first interconnect structure includes:
an insulating layer formed over the second conductive layer;
an under bump metallization (UBM) formed over the second conductive layer; and
a bump formed over the UBM.
6. The semiconductor device of claim 1 , further including first and second offset rows of conductive vias formed in the die extension region.
7. A semiconductor device, comprising:
a semiconductor die;
a die extension region including an insulating material formed around the semiconductor die;
a plurality of conductive vias formed through the die extension region including an exposed singulated surface;
a first conductive layer formed over an active surface of the semiconductor die electrically connected to the conductive vias; and
a second conductive layer formed over a back surface of the semiconductor die, opposite the active surface, electrically connected to the conductive vias.
8. The semiconductor device of claim 7 , further including an interconnect structure formed over the back surface of the semiconductor die electrically connected to the second conductive layer.
9. The semiconductor device of claim 8 , wherein the interconnect structure includes:
an insulating layer formed over the second conductive layer;
an under bump metallization (UBM) formed over the second conductive layer; and
a bump formed over the UBM.
10. The semiconductor device of claim 7 , further including an interconnect structure formed over the active surface of the semiconductor die electrically connected to the first conductive layer.
11. The semiconductor device of claim 10 , wherein the interconnect structure includes:
an insulating layer formed over the first conductive layer; and
an under bump metallization (UBM) formed over the first conductive layer.
12. The semiconductor device of claim 7 , wherein the insulating material includes a polymer, molding compound, or epoxy.
13. The semiconductor device of claim 7 , further including a plurality of stacked semiconductor devices electrically connected through the conductive vias.
14. A semiconductor device, comprising:
a semiconductor die;
a die extension region including an insulating material formed around the semiconductor die with a back surface of the semiconductor die exposed from the insulating material;
a plurality of conductive vias formed through the die extension region; and
a first conductive layer formed over an active surface of the semiconductor die electrically connected to the conductive vias.
15. The semiconductor device of claim 14 , further including a second conductive layer formed over the back surface of the semiconductor die, opposite the active surface, electrically connected to the conductive vias.
16. The semiconductor device of claim 15 , further including an interconnect structure formed over the back surface of the semiconductor die electrically connected to the second conductive layer.
17. The semiconductor device of claim 14 , further including an interconnect structure formed over the active surface of the semiconductor die electrically connected to the first conductive layer.
18. The semiconductor device of claim 14 , wherein the insulating material includes a polymer, molding compound, or epoxy.
19. The semiconductor device of claim 14 , further including a plurality of stacked semiconductor devices electrically connected through the conductive vias.
20. The semiconductor device of claim 14 , further including first and second offset rows of conductive vias formed in the die extension region.
21. A semiconductor device, comprising:
a semiconductor die with a die extension region including an insulating material formed around the semiconductor die;
a plurality of conductive vias including singulated surfaces formed through the die extension region; and
a first conductive layer formed over an active surface of the semiconductor die electrically connected to the conductive vias.
22. The semiconductor device of claim 21 , further including a second conductive layer formed over a back surface of the semiconductor die, opposite the active surface, electrically connected to the conductive vias.
23. The semiconductor device of claim 22 , further including an interconnect structure formed over the back surface of the semiconductor die electrically connected to the second conductive layer.
24. The semiconductor device of claim 21 , further including an interconnect structure formed over the active surface of the semiconductor die electrically connected to the first conductive layer.
25. The semiconductor device of claim 21 , wherein the insulating material includes a polymer, molding compound, or epoxy.