IP Library Granted Patent US 9,257,382
Granted Patent B2
US 9,257,382 · App. 13/939,044 · Granted Feb 9, 2016

Semiconductor device and method of forming guard ring around conductive TSV through semiconductor wafer

Inventors: Duk Ju Na (Singapore, SG); Lai Yee Chia (Singapore, SG); Chang Beom Yong (Singapore, SG)
Assignee: STATS ChipPAC, Ltd.
H01L23/49827H01L21/561H01L21/568H01L21/6836H01L21/76801H01L21/76898H01L23/481H01L24/05H01L24/03H01L24/06H01L24/11H01L24/13H01L24/16H01L24/94H01L2221/6834H01L2221/68327H01L2224/02166H01L2224/0345H01L2224/0346H01L2224/0391H01L2224/0401H01L2224/04042H01L2224/05015H01L2224/0557H01L2224/05555H01L2224/05567H01L2224/05571H01L2224/05666H01L2224/05681H01L2224/06181H01L2224/1132H01L2224/1145H01L2224/1146H01L2224/11334H01L2224/11849H01L2224/13025H01L2224/13111H01L2224/13113H01L2224/13116H01L2224/13124H01L2224/13139H01L2224/13144H01L2224/13147H01L2224/13155H01L2224/16146H01L2224/16225H01L2224/27002H01L2224/27005H01L2224/27312H01L2224/2919H01L2224/48091H01L2224/48247H01L2224/73104H01L2224/73204H01L2224/73265H01L2224/94H01L2924/01322H01L2924/12041H01L2924/1306H01L2924/13091H01L2924/15311
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Quick Facts
Patent No.
US 9,257,382
App. No.
13/939,044
Granted
Feb 9, 2016
Kind
B2
Abstract

A semiconductor device has a plurality of conductive vias formed into a semiconductor wafer. An insulating lining is formed around the conductive vias and a conductive layer is formed over the insulating lining. A portion of the semiconductor wafer is removed so the conductive vias extend above a surface of the semiconductor wafer. A first insulating layer is formed over the surface of the semiconductor wafer and conductive vias. A first portion of the first insulating layer is removed and a second portion of the first insulating layer remains as guard rings around the conductive vias. A conductive layer is formed over the conductive vias. A second insulating layer is formed over the surface of the semiconductor wafer, guard rings, and conductive vias. A portion of the second insulating layer is removed to expose the conductive vias and a portion of the guard rings.

Claims (45)

1. A method of making a semiconductor device, comprising:

providing a semiconductor die;

forming a conductive via through the semiconductor die with a portion of the conductive via extending above a first surface of the semiconductor die; and

forming a guard ring overlaying the first surface of the semiconductor die within a height of the conductive via.

2. The method of claim 1 , further including forming an insulating layer over the first surface of the semiconductor die.

3. The method of claim 1 , wherein forming the guard ring includes:

forming an insulating layer over the first surface of the semiconductor die; and

removing a first portion of the insulating layer while leaving a second portion of the insulating layer.

4. The method of claim 1 , wherein forming the conductive via includes:

forming a via through the semiconductor die; and

depositing a conductive material in the via.

5. The method of claim 4 , wherein forming the conductive via further includes forming an insulating layer in the via.

6. The method of claim 1 , further including forming a conductive layer over the conductive via.

7. A method of making a semiconductor device, comprising:

providing a substrate;

forming a conductive via through the substrate with a portion of the conductive via extending above a first surface of the substrate; and

forming a guard ring overlaying the first surface of the substrate and around the portion of the conductive via extending above the first surface of the substrate.

8. The method of claim 7 , further including forming an insulating layer over the first surface of the substrate.

9. The method of claim 8 , wherein the insulating layer extends over the conductive via.

10. The method of claim 9 , further including removing a portion of the insulating layer to expose the conductive via.

11. The method of claim 7 , wherein forming the guard ring includes:

forming an insulating layer over the first surface of the substrate; and

removing a first portion of the insulating layer while leaving a second portion of the insulating layer.

12. The method of claim 7 , wherein forming the conductive via includes:

forming a via in the substrate; and

forming a conductive layer within the via.

13. The method of claim 7 , further including forming a conductive layer over the conductive via.

14. A semiconductor device, comprising:

a semiconductor die;

a conductive via formed through the semiconductor die with a portion of the conductive via extending above a surface of the semiconductor die; and

a guard ring contacting the surface of the semiconductor die and formed around the portion of the conductive via extending above the surface of the semiconductor die.

15. The semiconductor device of claim 14 , further including an insulating layer formed over the surface of the semiconductor die.

16. The semiconductor device of claim 15 , wherein the insulating layer extends over the guard ring.

17. The semiconductor device of claim 15 , wherein the insulating layer extends over the conductive via.

18. The semiconductor device of claim 14 , wherein the guard ring includes an insulating layer formed over the surface of the semiconductor die around the conductive via.

19. The semiconductor device of claim 14 , further including a conductive layer formed over the conductive via.

20. A semiconductor device, comprising:

a substrate;

a conductive via formed through the substrate with a portion of the conductive via extending above a surface of the substrate; and

a guard ring contacting the surface of the substrate and formed around the conductive via.

21. The semiconductor device of claim 20 , further including an insulating layer formed over the surface of the substrate.

22. The semiconductor device of claim 21 , wherein the insulating layer extends over the guard ring.

23. The semiconductor device of claim 21 , wherein the insulating layer extends over the conductive via.

24. The semiconductor device of claim 20 , wherein the guard ring includes an insulating layer formed over the surface of the substrate around the conductive via.

25. The semiconductor device of claim 20 , further including a conductive layer formed over the conductive via.

Assignments (5)
CORRECTIVE ASSIGNMENT TO CORRECT THE CORRECT THE SPELLING OF ASSIGNEE'S NAME FROM "STATS CHIPPAC PTE. LTE. " TO STATS CHIPPAC PTE. LTD." PREVIOUSLY RECORDED AT REEL: 038378 FRAME: 0391. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Sep 5, 2023
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTD.
Reel/Frame 064809/0877 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 18, 2019
From: STATS CHIPPAC PTE. LTD.
To: JCET SEMICONDUCTOR (SHAOXING) CO., LTD.
Reel/Frame 051365/0680 →
RELEASE OF SECURITY INTEREST Recorded Dec 13, 2019
From: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
To: STATS CHIPPAC, INC.; STATS CHIPPAC PTE. LTD. FORMERLY KNOWN AS STATS CHIPPAC LTD.
Reel/Frame 051285/0318 →
CHANGE OF NAME Recorded Apr 7, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 038378/0391 →
SECURITY INTEREST Recorded Aug 6, 2015
From: STATS CHIPPAC, INC.; STATS CHIPPAC LTD.
To: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
Reel/Frame 036288/0748 →
Continuity (2)
Continuation 13315033 · Dec 8, 2011
Related Publication 20130299998A1 · Nov 14, 2013