Patent Assignment
Reel/Frame 010096/0168
Assignment of Assignor's Interest
Recorded: 1999-06-29
Pages: 3
Assignor
KIM, HA ZOONG
Executed: 1999-05-28
Assignee
L G SEMICON CO., LTD.
1, HYANGJEONG-DONG, HEUNGDUK-KU, CHEONGJU-SI, CHUNGCHEONGBUK-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Tddb Test Pattern and Method for Testing Tddb of Mos Capacitor Dielectric
Patent:
6,351,135 →
Application:
09/342,514 →
Related Assignments
(6)
Other recorded transfers of the patent in this record — the chain of ownership.
Corrective Assignment of Assignee's Name to "Lg Semicon Co., Ltd." Thereby Corresponding to the Name on the Executed Assignment Previously Recorded on Reel 10096, Frame 0168.
Jan 4, 2000
From: KIM, HA ZOONG
To: LG SEMICON CO., LTD.
Reel/Frame 010502/0792 →
Merger
Mar 9, 2014
From: HYUNDAI MICROELECTRONICS, CO., LTD.
To: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
Reel/Frame 032387/0342 →
Assignment of Assignor's Interest
Mar 9, 2014
From: SK HYNIX INC
To: INTELLECTUAL DISCOVERY CO., LTD.
Reel/Frame 032421/0488 →
Change of Name
Mar 9, 2014
From: HYNIX SEMICONDUCTOR, INC.
To: SK HYNIX INC
Reel/Frame 032421/0496 →
Change of Name
Mar 9, 2014
From: LG SEMICON CO., LTD.
To: HYUNDAI MICROELECTRONICS, CO., LTD.
Reel/Frame 032421/0536 →
Change of Name
Mar 9, 2014
From: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
To: HYNIX SEMICONDUCTOR, INC.
Reel/Frame 032421/0637 →