Patent Assignment
Reel/Frame 010502/0792
Corrective Assignment of Assignee's Name to "Lg Semicon Co., Ltd." Thereby Corresponding to the Name on the Executed Assignment Previously Recorded on Reel 10096, Frame 0168.
Recorded: 2000-01-04
Pages: 7
Assignor
KIM, HA ZOONG
Executed: 1999-05-28
Assignee
LG SEMICON CO., LTD.
1, HYANGJEONG-DONG, HEUNGDUK-KU, CHEONGJU-SI, CHUNGCHEONGBUK-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Tddb Test Pattern and Method for Testing Tddb of Mos Capacitor Dielectric
Patent:
6,351,135 →
Application:
09/342,514 →
Related Assignments
(6)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Jun 29, 1999
From: KIM, HA ZOONG
To: L G SEMICON CO., LTD.
Reel/Frame 010096/0168 →
Merger
Mar 9, 2014
From: HYUNDAI MICROELECTRONICS, CO., LTD.
To: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
Reel/Frame 032387/0342 →
Assignment of Assignor's Interest
Mar 9, 2014
From: SK HYNIX INC
To: INTELLECTUAL DISCOVERY CO., LTD.
Reel/Frame 032421/0488 →
Change of Name
Mar 9, 2014
From: HYNIX SEMICONDUCTOR, INC.
To: SK HYNIX INC
Reel/Frame 032421/0496 →
Change of Name
Mar 9, 2014
From: LG SEMICON CO., LTD.
To: HYUNDAI MICROELECTRONICS, CO., LTD.
Reel/Frame 032421/0536 →
Change of Name
Mar 9, 2014
From: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
To: HYNIX SEMICONDUCTOR, INC.
Reel/Frame 032421/0637 →