Patent Assignment
Reel/Frame 032421/0637
Change of Name
Recorded: 2014-03-09
Pages: 32
Assignor
HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
Executed: 2001-04-06
Assignee
HYNIX SEMICONDUCTOR, INC.
SAN 136-1, AMI-RI, BUBAL-EUP, GYEONGGI-DO, ICHEON-SI, KOREA, REPUBLIC OF
Covered Properties
(39)
Method for Forming Rugged Tungsten Film and Method for Fabricating Semiconductor Device Utilizing the Same
Patent:
5,563,090 →
Application:
08/419,264 →
Method for Forming Rugged Tungsten Film and Method for Fabricating Semiconductor Device Utilizing the Same
Patent:
6,348,708 →
Application:
08/675,692 →
Semiconductor Device with Diagonal Capacitor Bit Line and Fabrication Method Thereof
Patent:
6,133,598 →
Application:
09/084,982 →
Trench Isolation Structure and Fabrication Method Thereof
Patent:
6,127,241 →
Application:
09/195,558 →
Nonvolatile Memory and Method for Fabricating the Same
Patent:
6,255,155 →
Application:
09/295,447 →
Tddb Test Pattern and Method for Testing Tddb of Mos Capacitor Dielectric
Patent:
6,351,135 →
Application:
09/342,514 →
Capacitor Using High Dielectric Constant Film for Semiconductor Memory Device and Fabrication Method Therefor
Patent:
6,344,965 →
Application:
09/369,255 →
Capacitor of Semiconductor Device and Method of Fabricating the Same
Patent:
6,358,794 →
Application:
09/383,232 →
Liquid Delivery System
Patent:
6,349,887 →
Application:
09/428,049 →
Electrostatic Discharge Protecting Circuit for Semiconductor Device
Patent:
6,344,960 →
Application:
09/457,890 →
Dram Cell Array Not Requiring a Device Isolation Layer Between Cells
Patent:
6,362,501 →
Application:
09/458,699 →
Circuit to Check Overerasing of Repair Fuse Cells
Patent:
6,404,680 →
Application:
09/468,933 →
Method for Forming Fine Metal Patterns by Using Damascene Technique
Patent:
6,348,414 →
Application:
09/471,575 →
Method for Fabricating Capacitor of Semiconductor Device
Patent:
6,355,519 →
Application:
09/474,676 →
Pattern for measuring focus of light exposing apparatus and method thereof
Patent:
6,365,302 →
Application:
09/551,594 →
Method of Manufacturing a Capacitor for Semiconductor Memory Devices
Patent:
6,372,667 →
Application:
09/602,780 →
Method for Compressing Output Data and a Packet Command Driving Type Memory Device
Patent:
7,013,413 →
Application:
09/604,086 →
Method for Fabricating Capacitor of Dram Using Self-Aligned Contact Etching Technology
Patent:
6,372,575 →
Application:
09/605,474 →
Trench isolation structure and fabrication method thereof
Patent:
6,376,893 →
Application:
09/638,866 →
Fabrication Method of Semiconductor Device with Diagonal Capacitor Bit Line
Patent:
6,344,391 →
Application:
09/660,337 →
Method of Manufacturing a Flash Memory Device
Patent:
6,403,419 →
Application:
09/717,049 →
Method of Monitoring a Source Contact in a Flash Memory
Patent:
6,391,665 →
Application:
09/722,112 →
Prefetch and restore method and apparatus of semiconductor memory device
Patent:
6,345,007 →
Application:
09/722,358 →
Method for Manufacturing a Gate Structure Incorporated Therein a High K Dielectric
Patent:
6,355,548 →
Application:
09/722,465 →
Word Line Voltage Regulation Circuit
Patent:
6,377,496 →
Application:
09/722,490 →
Synchronous Type Flip-Flop Circuit of Semiconductor Device
Nonvolatile Memory and Method for Fabricating the Same
Method of Manufacturing a Capacitor in a Semiconductor Device
Multi-Level Bonding Option Circuit
Method for the Formation of Gate Electrode of Semiconductor Device Using a Difference in Polishing Selection Ratio Between Polymer and Oxide Film
Method of Manufacturing a Contact Plug in a Semiconductor Device
Method for Manufacturing a Floating Gate in a Flash Memory Device
Method of Erasing a Flash Memory Device
Tddb Test Pattern and Method for Testing Tddb of Mos Capacitor Dielectric
Capacitor Using High Dielectric Constant Film for Semiconductor Memory Device and Fabrication Method Therefor
Method for Fabricating Dram Cell Array Not Requiring a Device Isolation Layer Between Cells
Capacitor of Semiconductor Device and Method of Fabricating the Same
Tddb Test Pattern and Method for Testing Tddb of Mos Capacitor Dielectric
Tddb Test Pattern and Method for Testing Tddb of Mos Capacitor Dielectric
Related Assignments
(25)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jun 24, 1996
From: LEE, YOUNG JONG; CHO, BOK WON
To: LG SEMICON CO., LTD.
Reel/Frame 008004/0797 →
Assignment of Assignor's Interest
May 28, 1998
From: LEE, CHANG-JAE; PARK, NAE-HAK
To: LG SEMICON CO., LTD.
Reel/Frame 009209/0858 →
Assignment of Assignor's Interest
Nov 19, 1998
From: RHA, KWA GOO
To: LG SEMICON CO., LTD.
Reel/Frame 009597/0141 →
Assignment of Assignor's Interest
Apr 21, 1999
From: LEE, KI JIK; YU, JAE MIN
To: LG SEMICON CO., LTD.
Reel/Frame 009917/0701 →
Assignment of Assignor's Interest
Jun 29, 1999
From: KIM, HA ZOONG
To: L G SEMICON CO., LTD.
Reel/Frame 010096/0168 →
Assignment of Assignor's Interest
Aug 6, 1999
From: ROH, JAE-SUNG
To: LG SEMICON CO., LTD.
Reel/Frame 010161/0564 →
Assignment of Assignor's Interest
Aug 26, 1999
From: OH, KI-YOUNG
To: HYUNDAI MICROELECTRONICS, CO., LTD.
Reel/Frame 010203/0879 →
Assignment of Assignor's Interest
Oct 27, 1999
From: PYO, SUNG GYU
To: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
Reel/Frame 010348/0897 →
Assignment of Assignor's Interest
Dec 10, 1999
From: SEO, DONG-HYUN; PARK, HONG-BAE
To: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
Reel/Frame 010467/0374 →
Assignment of Assignor's Interest
Dec 13, 1999
From: KIM, KWAN
To: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
Reel/Frame 010450/0887 →
Assignment of Assignor's Interest
Dec 21, 1999
From: YUN, HEE-YONG; CHANG, SUNG-KEUN
To: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
Reel/Frame 010505/0828 →
Assignment of Assignor's Interest
Dec 22, 1999
From: KWON, OH WON
To: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
Reel/Frame 010473/0918 →
Corrective Assignment of Assignee's Name to "Lg Semicon Co., Ltd." Thereby Corresponding to the Name on the Executed Assignment Previously Recorded on Reel 10096, Frame 0168.
Jan 4, 2000
From: KIM, HA ZOONG
To: LG SEMICON CO., LTD.
Reel/Frame 010502/0792 →
Assignment of Assignor's Interest
Mar 13, 2000
From: LEE, KEE-JEUNG
To: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
Reel/Frame 010702/0507 →
Assignment of Assignor's Interest
Apr 17, 2000
From: YANG, HYUN JO
To: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
Reel/Frame 010746/0307 →
Assignment of Assignor's Interest
Jun 28, 2000
From: LEE, JEONG KUG; KIM, JONG PHIL
To: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
Reel/Frame 010932/0709 →
Merger
Jul 11, 2000
From: LG SEMICON CO., LTD.
To: HYUNDAI ELECTRONICS INDUSTRIES, CO., LTD.
Reel/Frame 010951/0606 →
Merger
Jul 19, 2000
From: LG SEMICON CO., LTD.
To: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
Reel/Frame 011014/0462 →
Merger
Aug 15, 2000
From: LG SEMICON CO., LTD.
To: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
Reel/Frame 011049/0271 →
Assignment of Assignor's Interest
Oct 12, 2000
From: LEE, KEE JEUNG
To: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
Reel/Frame 011169/0301 →
Assignment of Assignor's Interest
Oct 12, 2000
From: KIM, SUNG WOOK; KIM, IN HONG
To: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
Reel/Frame 011169/0550 →
Assignment of Assignor's Interest
Mar 29, 2001
From: KIM, KI JUN; SHIN, YOUNG KI; PARK, BYUNG SOO; LEE, HEE YOUL
To: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
Reel/Frame 011718/0376 →
Assignment of Assignor's Interest
Apr 11, 2001
From: CHANG, SANG HOAN; KIM, KI SEOG; SHIN, JIN; LEE, KEUN WOO
To: HYUNDAI ELECTRONICS INDUSRIES CO., LTD.
Reel/Frame 011702/0715 →
Assignment of Assignor's Interest
Apr 24, 2001
From: LEE, POONG YEUB; HA, IM CHEOL; SHIN, KYE WAN; KWON, OH WON
To: HYUNDIA ELECTRONICS INDUSTRIES CO., LTD.
Reel/Frame 011744/0223 →
Change of Name
Apr 25, 2001
From: LG SEMICON CO., LTD.
To: HYUNDAI ELECTRONICS INDUSTRIES CO., LTD.
Reel/Frame 011737/0919 →