IP Library › Assignment 025929/0989
Patent Assignment
Reel/Frame 025929/0989

Assignment of Assignor's Interest

Recorded: 2011-03-09 Pages: 7
Assignor
REAL TIME METROLOGY INC.
Executed: 2010-12-09
Assignee
NANOMETRICS INCORPORATED
1550 BUCKEYE DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Properties (3)
Optical Inspection Module and Method for Detecting Particles and Defects on Substrates in Integrated Process Tools
Patent: 5,909,276 →
Application: 09/050,267 →
Optical Method and Apparatus for Inspecting Large Area Planar Objects
Patent: 6,630,996 →
Application: 09/994,021 →
Publication: US 2002/0088952
Optical Method and Apparatus for Inspecting Large Area Planar Objects
Patent: 6,809,809 →
Application: 10/379,016 →
Publication: US 2004/0012775
Related Assignments (5)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Jun 19, 1998
From: KINNEY, PATRICK D.; RAO, NAGARAJA P.
To: MICROTHERM, LLC
Reel/Frame 009272/0924 →
Assignment of Assignor's Interest Jul 11, 2003
From: RAO, NAGARAJA P.; KINNEY, PATRICK D.
To: REAL TIME METROLOGY, INC.
Reel/Frame 014263/0773 →
Assignment of Assignor's Interest Jul 17, 2003
From: KINNEY, PATRICK D.; GUPTA, ANAND; RAO, NAGARAJA P.
To: REAL TIME METROLOGY, INC.
Reel/Frame 014296/0653 →
Merger Jun 24, 2010
From: MICROTHERM, LLC
To: REAL TIME METROLOGY, INC.
Reel/Frame 024588/0034 →
Change of Name Apr 30, 2020
From: NANOMETRICS INCORPORATED
To: ONTO INNOVATION INC.
Reel/Frame 052544/0224 →