Patent Assignment
Reel/Frame 039117/0281
Assignment of Assignor's Interest
Recorded: 2016-06-22
Pages: 12
Assignor
FORMFACTOR, INC.
Executed: 2015-07-13
Assignee
MARTEK, INC.
112 SOUTH ROCKFORD DRIVE, SUITE 103, TEMPE, ARIZONA, 85281
Covered Properties
(50)
Control System for Magnetic Positioning Device
Patent:
4,009,428 →
Application:
05/323,387 →
Damping Control for Positioning Apparatus
Patent:
3,940,676 →
Application:
05/513,966 →
Micro-Circuit Test Probe
Patent:
4,001,685 →
Application:
05/514,017 →
High Speed Precision Chuck Assembly
Patent:
4,066,943 →
Application:
05/630,662 →
Universal High Speed Holder
Patent:
4,324,047 →
Application:
06/150,553 →
Linear Motor
Patent:
4,335,338 →
Application:
06/164,827 →
System for Linear Motor Control
Patent:
4,455,512 →
Application:
06/371,426 →
Height Measuring System
Patent:
4,607,525 →
Application:
06/659,210 →
Method of Moving Head to Correct for Hysteresis
Patent:
4,935,676 →
Application:
07/352,136 →
Ball Screw Supported Z Stage
Patent:
5,010,295 →
Application:
07/365,878 →
Contact Sensing for Integrated Circuit Testing
Patent:
5,019,771 →
Application:
07/527,661 →
Ball Bearing Assembly
Patent:
5,344,238 →
Application:
07/992,994 →
Optical Character Recognition Illumination Method and System
Patent:
5,515,452 →
Application:
07/999,294 →
Method and Apparatus for Determining an Objects Position, Topography and for Imaging
Patent:
5,450,203 →
Application:
08/172,426 →
System and Method for Recognizing Visual Indicia
Patent:
5,553,168 →
Application:
08/185,610 →
Prober and Tester with Contact Interface for Integrated Circuits- Containing Wafer Held Docked in a Vertical Plane
Patent:
5,656,942 →
Application:
08/505,419 →
System and Method for Recognizing Visual Indicia
Patent:
5,703,969 →
Application:
08/602,998 →
Rotary Wafer Positioning System and Method
Patent:
5,982,132 →
Application:
08/947,768 →
Method and Apparatus for Direct Probe Sensing
Patent:
6,096,567 →
Application:
08/980,595 →
Measuring Angular Rotation of an Object
Patent:
6,310,985 →
Application:
09/126,019 →
Electromagnetic Actuating Mechanism
Patent:
6,114,780 →
Application:
09/200,286 →
Method and Apparatus for Passively Trimming Sawyer Motors to Correct for Yaw Errors
Patent:
6,127,790 →
Application:
09/200,423 →
Apparatus and Method for Projecting an Alignment Image
Patent:
6,549,649 →
Application:
09/262,947 →
Apparatus and Method for Testing a Substrate Having a Plurality of Terminals
Method and Apparatus for Motion Control
Patent:
6,389,702 →
Application:
09/569,775 →
Apparatus for Electrical Testing of a Substrate Having a Plurality of Terminals
Patent:
6,417,683 →
Application:
09/604,859 →
Method and Apparatus for Illuminating Projecting Features on the Surface of a Semiconductor Wafer
Method and Apparatus for Measuring Angular Rotation of an Object
Testing Circuits on Substrate
Patent:
6,781,394 →
Application:
10/035,457 →
Testing Circuits on Substrates
Patent:
6,771,060 →
Application:
10/035,482 →
Testing Circuits on Substrates
Patent:
6,861,859 →
Application:
10/035,508 →
Method and apparatus for generating values for selected pixels used in evaluating semiconductor wafer bumps
Application:
10/047,980 →
Publication:
US 2002/0158643
Apparatus for Electrical Testing of a Substrate Having a Plurality of Terminals
Apparatus and Method for Projecting an Alignment Image
Testing Circuits on Substrates
Testing Circuits on Substrates
Testing Circuits on Substrate
Method and Apparatus for Cleaning a Probe Card
Testing Circuits on Substrates
Method for Probing Impact Sensitive and Thin Layered Substrate
Patent:
7,362,116 →
Application:
11/271,416 →
Methods and Apparatuses for Dynamic Probe Adjustment
Methods and Apparatuses for Improved Stabilization in a Probing System
Methods and Apparatuses for Improved Positioning in a Probing System
Testing Circuits on Substrate
Methods and Apparatuses for Improved Stabilization in a Probing System
Method for Probing Impact Sensitve and Thin Layered Substrate
Application:
12/042,286 →
Publication:
US 2008/0150559
Methods and Apparatuses for Improved Positioning in a Probing System
Compliance Control Methods and Apparatuses
Method for Improving Motion Times of a Stage
Method for Improving Motion Times of a Stage
Related Assignments
(1)
Other recorded transfers of the patents in this record — the chain of ownership.