Patent Assignment
Reel/Frame 039256/0711
Release of Security Interest
Recorded: 2016-07-05
Pages: 9
Assignor
JPMORGAN CHASE BANK, N.A.
Executed: 2016-06-23
Assignee
ORBOTECH LIMITED
7 SANHEDRIN BOULEVARD, NO. INDUSTRIAL ZONE, YAVNE, 8110101, ISRAEL
Covered Properties
(63)
Automatic Visual Inspection System
Patent:
5,774,572 →
Application:
08/061,344 →
Apparatus and Methods for the Inspection of Objects
Patent:
7,206,443 →
Application:
09/633,756 →
Illuminator for Inspecting Substantially Flat Surfaces
Patent:
6,847,442 →
Application:
09/719,728 →
System and Method for Side to Side Registration in a Printed Circuit Imager
Laser Repetition Rate Multiplier
Laser Drill for Use in Electrical Circuit Fabrication
Multi-Layer Printed Circuit Board Fabrication System and Method
Adaptive Tolerance Reference Inspection System
System and Method for Forming Holes in Substrates Containing Glass
Multiple Beam Micro-Machining System and Method
Illumination for Inspecting Surfaces of Articles
Illumination and Image Acquisition System
Multi-Layer Printed Circuit Board Fabrication System and Method
Laser Energy Delivery System Outputting Beams Having a Selectable Energy
Micro-Machining System Employing a Two Stage Beam Steering Mechanism
Multiple Beam Micromachining System for Removing at Least Two Different Layers of a Substrate
Reduction of False Alarms in Pcb Inspection
Patent:
7,177,458 →
Application:
10/363,982 →
Multi-Layer Printed Circuit Board Fabrication System and Method
System and Method for Manufacturing Printed Circuit Boards Employing Non-Uniformly Modified Images
Multiple Beam Micro-Machining System and Method
Multiple Beam Micro-Machining System and Method
Selectable Area Laser Assisted Processing of Substrates
Apparatus and Methods for the Inspection of Objects
Micro-Machining Employing Multiple Independently Focused and Independently Steered Beams
Dynamic Beam Splitter Outputting a Selectable Number of Beams
System and Method for Inspecting Electrical Circuits Utilizing Reflective and Fluorescent Imagery
Electrical Circuit Conductor Inspection
Verification of Non-Recurring Defects in Pattern Inspection
High-Sensitivity Optical Scanning Using Memory Integration
Automatic Repair of Electric Circuits
Pulse Light Pattern Writer
System and Method for Inspecting Workpieces Having Microscopic Features
System and Method for Inspecting Patterned Devices Having Microscopic Conductors
Tilting Device
Inkjet Printing of Color Filters
High-Sensitivity Optical Scanning Using Memory Integration
Linear Light Concentrator
Alignment of Printed Circuit Board Targets
Method and System of Machining Using a Beam of Photons
Photoconductive Based Electrical Testing of Transistor Arrays
Illumination Angle Control Using Dichroic Filters
Imaging Device and Method for High-Sensitivity Optical Scanning and Integrated Circuit Therefor
Optimal Test Ordering in Cascade Architectures
Multiple Beam Micro-Machining System and Method
Multi-Modal Imaging
Inspection of a Substrate Using Multiple Cameras
Multiple Beam Drilling System
Multiple Mirror Calibration System
System and Method for Optical Shearing
Efficient Telecentric Optical System (Etos)
Vacuum Hold-Down Apparatus
Imaging Device and Method for High-Sensitivity Optical Scanning and Integrated Circuit Therefor
Producing Electrical Circuit Patterns Using Multi-Population Transformation
System and Method for Direct Imaging
Imaging Device and Method for High-Sensitivity Optical Scanning and Integrated Circuit Therefor
Light Engine
Lighting System
Application:
13/814,151 →
Publication:
US 2013/0147943
System and Method for Direct Imaging
Method Producing a Conductive Path on a Substrate
Imaging Device and Method for High-Sensitivity Optical Scanning and Integrated Circuit Therefor
Electrical Inspection of Electronic Devices Using Electron-Beam Induced Plasma Probes
Two-Step, Direct-Write Laser Metallization
Imaging Device and Method for High-Sensitivity Optical Scanning and Integrated Circuit Therefor
Application:
14/964,781 →
Publication:
US 2016/0094760
Related Assignments
(1)
Other recorded transfers of the patents in this record — the chain of ownership.