Patent Assignment
Reel/Frame 049987/0361
Assignment of Assignor's Interest
Recorded: 2019-08-07
Pages: 9
Assignor
WALKER, DARRYL G.
Executed: 2019-08-05
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Properties
(51)
Semiconductor Devices, Circuits and Methods for Read and/or Write Assist of an Sram Circuit Portion Based on Voltage Detection and/or Temperature Detection Circuits
PCT:
PCT/US2017/038395 ↗
Semiconductor Device Having Temperature Sensor Circuit That Detects a Temperature Range Upper Limit Value and a Temperature Range Lower Limit Value
Power Up of Semiconductor Device Having a Temperature Circuit and Method Therefor
Semiconductor Device Having Subthreshold Operating Circuits Including a Back Body Bias Potential Based on Temperature Range
Semiconductor Device Having a Temperature Circuit That Provides a Plurality of Temperature Operating Ranges
Ssemiconductor Device Having Temperature Sensor Circuits
Semiconductor Device Including Temperature Ranges Having Temperature Thresholds and Method of Determining Therefor
Application:
14/484,529 →
Publication:
US 2016/0054374
Testing and Setting Performance Parameters in a Semiconductor Device and Method Therefor
Testing and Setting Performance Parameters in a Semiconductor Device and Method Therefor
Application:
14/484,575 →
Publication:
US 2016/0054378
Testing and Setting Performance Parameters in a Semiconductor Device and Method Therefor
Testing and Setting Performance Parameters in a Semiconductor Device and Method Therefor
Multi-Chip Non-Volatile Semiconductor Memory Package Including Heater and Sensor Elements
Patent:
9,613,719 →
Application:
14/639,270 →
Multi-Chip Non-Volatile Semiconductor Memory Package Including Heater and Sensor Elements
Patent:
10,141,058 →
Application:
14/639,301 →
Multi-Chip Non-Volatile Semiconductor Memory Package Including Heater and Sensor Elements
Patent:
9,928,925 →
Application:
14/639,313 →
Multi-Chip Non-Volatile Semiconductor Memory Package Including Heater and Sensor Elements
Patent:
9,286,991 →
Application:
14/639,325 →
Package Including a Plurality of Stacked Semiconductor Devices Including a Capacitance Enhanced Through via and Method of Manufacture
Patent:
9,378,778 →
Application:
14/755,157 →
Package Including a Plurality of Stacked Semiconductor Devices Including a Capacitance Enhanced Through via and Method of Manufacture
Patent:
9,455,189 →
Application:
14/755,193 →
Power Up of Semiconductor Device Having a Temperature Circuit and Method Therefor
Semiconductor Device Having Temperature Sensor Circuits
Multi-Chip Non-Volatile Semiconductor Memory Package Including Heater and Sensor Elements
Patent:
9,548,126 →
Application:
15/057,959 →
Package Including a Plurality of Stacked Semiconductor Devices Including a Capacitance Enhanced Through via and Method of Manufacture
Patent:
9,431,088 →
Application:
15/161,468 →
Package Including a Plurality of Stacked Semiconductor Devices Including a Capacitance Enhanced Through via and Method of Manufacture
Patent:
9,508,692 →
Application:
15/245,563 →
Package Including a Plurality of Stacked Semiconductor Devices Having Area Efficient Esd Protection
Patent:
9,711,500 →
Application:
15/259,693 →
Package Including a Plurality of Stacked Semiconductor Devices Having Area Efficient Esd Protection
Patent:
10,128,215 →
Application:
15/259,735 →
Package Including a Plurality of Stacked Semiconductor Devices Having Area Efficient Esd Protection
Patent:
10,134,720 →
Application:
15/259,759 →
Package Including a Plurality of Stacked Semiconductor Devices Including a Capacitance Enhanced Through via and Method of Manufacture
Patent:
9,607,969 →
Application:
15/357,829 →
Package Including a Plurality of Stacked Semiconductor Devices Including a Capacitance Enhanced Through via and Method of Manufacture
Patent:
9,685,427 →
Application:
15/469,448 →
Semiconductor Devices, Circuits and Methods for Read and/or Write Assist of an Sram Circuit Portion Based on Voltage Detection and/or Temperature Detection Circuits
Semiconductor Devices, Circuits and Methods for Read and/or Write Assist of an Sram Circuit Portion Based on Power Supply Voltage Detection Circuits
Semiconductor Devices, Circuits and Methods for Read and/or Write Assist of an Sram Circuit Portion Based on Voltage Detection and/or Temperature Detection Circuits
Application:
15/587,923 →
Publication:
US 2017/0372775
Semiconductor Devices, Circuits and Methods for Read and/or Write Assist of an Sram Circuit Portion Based on Voltage Detection and/or Temperature Detection Circuits
Semiconductor Devices, Circuits and Methods for Read and/or Write Assist of an Sram Circuit Portion Based on Voltage Detection and/or Temperature Detection Circuits
Package Including a Plurality of Stacked Semiconductor Devices Including a Capacitance Enhanced Through via and Method of Manufacture
Patent:
9,842,830 →
Application:
15/626,534 →
Testing a Semiconductor Device Including a Voltage Detection Circuit and Temperature Detection Circuit That Can Be Used to Generate Read Assist and/or Write Assist in an Sram Circuit Portion and Method Therefor
Testing a Semiconductor Device Including a Voltage Detection Circuit and Temperature Detection Circuit That Can Be Used to Generate Read Assist and/or Write Assist in an Sram Circuit Portion and Method Therefor
Package Including a Plurality of Stacked Semiconductor Devices Having Area Efficient Esd Protection
Patent:
9,997,513 →
Application:
15/645,196 →
Semiconductor Device Having Temperature Sensor Circuit That Detects a Temperature Range Upper Limit Value and a Temperature Range Lower Limit Value
Semiconductor Device Having Temperature Circuit That Sets Temperature Ranges and Is Disabled Upon Power Supply Transition
Package Including a Plurality of Stacked Semiconductor Devices an Interposer and Interface Connections
Patent:
9,929,127 →
Application:
15/836,851 →
Package Including a Plurality of Stacked Semiconductor Devices, an Interposer and Interface Connections
Patent:
10,115,710 →
Application:
15/934,183 →
Semiconductor Device Having Temperature Sensor Circuit That Detects a Temperature Range Upper Limit Value and a Temperature Range Lower Limit Value
Semiconductor Devices, Circuits and Methods for Read and/or Write Assist of an Sram Circuit Portion Based on Voltage Detection and/or Temperature Detection Circuits
Semiconductor Memory Device and Method Having Temperature Sensing Circuit and Count Value for Adjusting Circuit Operations
Package Including a Plurality of Stacked Semiconductor Devices Having Area Efficient Esd Protection
Patent:
10,418,346 →
Application:
16/002,183 →
Testing and Setting Performance Parameters in a Semiconductor Device and Method Therefor
Package Including a Plurality of Stacked Semiconductor Devices, an Interposer and Interface Connections
Patent:
10,262,975 →
Application:
16/130,962 →
Package Including a Plurality of Stacked Semiconductor Devices, an Interposer and Interface Connections
Patent:
10,177,121 →
Application:
16/132,409 →
Semiconductor Devices, Circuits and Methods for Read and/or Write Assist of an Sram Circuit Portion Based on Voltage Detection and/or Temperature Detection Circuits
Testing a Semiconductor Device Including a Voltage Detection Circuit and Temperature Detection Circuit That Can Be Used to Generate Read Assist and/or Write Assist in an Sram Circuit Portion and Method Therefor
Package Including a Plurality of Stacked Semiconductor Devices, an Interposer and Interface Connections
Patent:
10,262,976 →
Application:
16/238,760 →
Package Including a Plurality of Stacked Semiconductor Devices, an Interposer and Interface Connections
Patent:
10,453,823 →
Application:
16/382,545 →