IP Library Assignment 074650/0428
Patent Assignment
Reel/Frame 074650/0428

Change of Name

Recorded: 2026-05-13 Pages: 7
Assignor
SEMILAB USA LLC
Executed: 2026-02-05
Assignee
ONTO INNOVATION SDI LLC
12415 TELECOM DR., TAMPA, FLORIDA, 33637
Covered Property (1)
Non-Contact Method for Acquiring Charge-Voltage Data on Miniature Test Areas of Semiconductor Product Wafers
Patent: 7,202,691 →
Application: 11/191,093 →
Publication: US 2006/0267622
Related Assignments (5)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 19, 2005
From: LAGOWSKI, JACEK; EDELMAN, PIOTR; MARINSKIY, DMITRIY; KOCHEY, JOSEPH NICHOLAS
To: SEMICONDUCTOR DIAGNOSTICS, INC.
Reel/Frame 016912/0991 →
Assignment of Assignor's Interest May 8, 2017
From: SEMICONDUCTOR DIAGNOSTICS, INC.
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 042271/0789 →
Assignment of Assignor's Interest Feb 27, 2025
From: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
To: SEMILAB SDI
Reel/Frame 070349/0780 →
Patent Assignment Agreement Oct 20, 2025
From: SEMICONDUCTOR DIAGNOSTICS, INC.
To: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
Reel/Frame 073165/0319 →
Assignment of Assignor's Interest Nov 13, 2025
From: SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
To: SEMILAB USA, LLC
Reel/Frame 072891/0915 →