IP Library › Granted Patent US 6,815,338
Granted Patent Utility
US 6,815,338 · Confirmation No. 6786

MULTILAYER WIRING STRUCTURE OF SEMICONDUCTOR DEVICE, METHOD OF PRODUCING SAID MULTILAYER WIRING STRUCTURE AND SEMICONDUCTOR DEVICE TO BE USED FOR RELIABILITY EVALUATION

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2014-08-25 N570 Communication - Re: Power of Attorney (PTOL-308) 1 View
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2004-08-30 XRUSH Internal Response to Printer Query from Technology Center(TC) 1 View
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2004-07-07 CTMS Miscellaneous Action with shortened statutory period (SSP) 2 View
2004-07-07 1449 List of References cited by applicant and considered by examiner 1 View
2004-06-28 XRUSH Internal Response to Printer Query from Technology Center(TC) 1 View
2004-06-10 IDS Information Disclosure Statement (IDS) Form (SB08) 6 View
2004-04-06 IFEE Issue Fee Payment (PTO-85B) 1 View
2004-03-29 RUSH Printer Query form, used by the publications branch 2 View
2004-02-10 NOA Notice of Allowance and Fees Due (PTOL-85) 6 View
2004-02-10 892 List of references cited by examiner 1 View
2004-02-10 SRFW Search information including classification, databases and other search related notes 1 View
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2004-02-02 LET. Miscellaneous Incoming Letter 1 View
2003-12-30 ELC. Response to Election / Restriction Filed 1 View
2003-12-12 CTRS Requirement for Restriction/Election 4 View
2003-05-23 TRNA Transmittal of New Application 3 View
2003-05-23 SPEC Specification 37 View
2003-05-23 CLM Claims 8 View
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2003-05-23 WFEE Fee Worksheet (SB06) 1 View
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2003-05-23 IDS Information Disclosure Statement (IDS) Form (SB08) 3 View
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Quick Facts
Patent No.
US 6,815,338
App. No.
10/443,826
Filed
2003-05-23
Granted
2004-11-09
Pub. No.
US20040092097A1
Art Unit
2812
PTA
0 days