IP Library Granted Patent US 9,422,455
Granted Patent B2
US 9,422,455 · App. 14/568,311 · Granted Aug 23, 2016

CMP compositions exhibiting reduced dishing in STI wafer polishing

Inventors: Sudeep Pallikkara Kuttiatoor (Aurora, IL); Kevin Dockery (Aurora, IL); Prativa Pandey (Aurora, IL); Renhe Jia (Naperville, IL)
Assignee: Cabot Microelectronics Corporation
C09G1/02C03C15/00C23F1/16H01L21/31111
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Quick Facts
Patent No.
US 9,422,455
App. No.
14/568,311
Granted
Aug 23, 2016
Kind
B2
Abstract

The invention provides a chemical-mechanical polishing composition containing a ceria abrasive, an ionic polymer of formula I: wherein X 1 and X 2 , Z 1 and Z 2 , R 1 , R 2 , R 3 , and R 4 , and n are as defined herein, a polyhydroxy aromatic compound, a polyvinyl alcohol, and water, wherein the polishing composition has a pH of about 1 to about 4.5. The invention further provides a method of chemically-mechanically polishing a substrate with the inventive chemical-mechanical polishing composition. Typically, the substrate contains silicon oxide, silicon nitride, and/or polysilicon.

Claims (44)

1. A chemical-mechanical polishing composition comprising:

(a) a wet-process ceria abrasive,

(b) an ionic polymer of formula (I):

wherein X 1 and X 2 are independently selected from hydrogen, —OH, and —COOH and wherein at least one of X 1 and X 2 is —COOH,

Z 1 and Z 2 are independently O or S,

R 1 , R 2 , R 3 , and R 4 are independently selected from hydrogen, C 1 -C 6 alkyl, and C 7 -C 10 aryl, and

n is an integer of about 3 to about 500,

(c) a polyhydroxy aromatic compound,

(d) a polyvinyl alcohol, and

(e) water,

wherein the polishing composition has a pH of about 1 to about 4.5.

2. The polishing composition of claim 1 , wherein X 1 and X 2 are both —COOH.

3. The polishing composition of claim 2 , wherein Z 1 and Z 2 are both O, and R 1 , R 2 , R 3 , and R 4 are hydrogen.

4. The polishing composition of claim 1 , wherein the ionic polymer has a molecular weight of about 500 daltons to about 10,000 daltons, and wherein n is an integer with a value of 8 or greater.

5. The polishing composition of claim 1 , wherein the ionic polymer is present in an amount of about 0.01 wt. % to about 0.5 wt. % of the polishing composition.

6. The polishing composition of claim 1 , wherein the wet-process ceria abrasive is present in an amount of about 0.05 wt. % to about 1 wt. % of the polishing composition.

7. The polishing composition of claim 1 , wherein the polyvinyl alcohol has a molecular weight of about 20,000 daltons to about 200,000 daltons.

8. The polishing composition of claim 1 , wherein the polyvinyl alcohol is a branched polyvinyl alcohol.

9. The polishing composition of claim 1 , wherein the polyhydroxy aromatic compound is selected from 1,3-dihydroxybenzene and 1,3,5-trihydroxybenzene.

10. A method of chemically-mechanically polishing a substrate comprising:

(i) contacting a substrate with a polishing pad and a chemical-mechanical polishing composition comprising:

(a) a wet-process ceria abrasive,

(b) an ionic polymer of formula (I):

wherein X 1 and X 2 are independently selected from hydrogen, —OH, and —COOH and wherein at least one of X 1 and X 2 is —COOH,

Z 1 and Z 2 are independently O or S,

R 1 , R 2 , R 3 and R 4 are independently selected from hydrogen, C 1 -C 6 alkyl, and C 7 -C 10 aryl, and

n is an integer of about 3 to about 500,

(c) a polyhydroxy aromatic compound,

(d) a polyvinyl alcohol, and

(e) water,

wherein the polishing composition has a pH of about 1 to about 4.5,

(ii) moving the polishing pad and the chemical-mechanical polishing composition relative to the substrate, and

(iii) abrading at least a portion of the substrate to polish the substrate.

11. The method of claim 10 , wherein X 1 and X 2 are both —COOH.

12. The method of claim 11 , wherein Z 1 and Z 2 are both O, and R 1 , R 2 , R 3 , and R 4 are hydrogen.

13. The method of claim 10 , wherein the ionic polymer has a molecular weight of about 500 daltons to about 10,000 daltons, and wherein n is an integer with a value of 8 or greater.

14. The method of claim 10 , wherein the ionic polymer is present in an amount of about 0.01 wt. % to about 0.5 wt. % of the polishing composition.

15. The method of claim 10 , wherein the wet-process ceria abrasive is present in an amount of about 0.1 wt. % to about 1 wt. % of the polishing composition.

16. The method of claim 10 , wherein the polyvinyl alcohol has a molecular weight of about 20,000 daltons to about 200,000 daltons.

17. The method of claim 10 , wherein the polyvinyl alcohol is a branched polyvinyl alcohol.

18. The method of claim 10 , wherein the polyhydroxy aromatic compound is selected from 1,3-dihydroxybenzene and 1,3,5-trihydroxybenzene.

19. The method of claim 10 , wherein the substrate comprises silicon oxide, and wherein at least a portion of the silicon oxide is abraded to polish the substrate.

20. The method of claim 19 , wherein the substrate further comprises silicon nitride, and wherein at least a portion of the silicon nitride is abraded to polish the substrate.

21. The method of claim 19 , wherein the substrate further comprises polysilicon, and wherein at least a portion of the polysilicon is abraded to polish the substrate.

Assignments (8)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 30, 2015
From: PALLIKKARA KUTTIATOOR, SUDEEP; DOCKERY, KEVIN; PANDEY, PRATIVA; JIA, RENHE
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 034858/0428 →
Continuity (1)
Related Publication 20160168421A1 · Jun 16, 2016