IP Library Granted Patent US 9,944,828
Granted Patent B2
US 9,944,828 · App. 14/919,526 · Granted Apr 17, 2018

Slurry for chemical mechanical polishing of cobalt

Inventors: Elise Sikma (Bartlett, IL); Witold Paw (Aurora, IL); Benjamin Petro (Aurora, IL); Jeffrey Cross (Batavia, IL); Glenn Whitener (Batavia, IL)
Assignee: Cabot Microelectronics Corporation
C09G1/02B24B37/044C23F3/04C23F3/06H01L21/3212
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Quick Facts
Patent No.
US 9,944,828
App. No.
14/919,526
Granted
Apr 17, 2018
Kind
B2
Abstract

The invention provides a chemical-mechanical polishing composition including (a) an abrasive comprising alumina particles, silica particles, or a combination thereof, (b) a rate accelerator comprising a phosphonic acid, an N-heterocyclic compound, or a combination thereof, (c) a corrosion inhibitor comprising an amphoteric surfactant, a sulfonate, a phosphonate, a carboxylate, a fatty acid amino acid, an amine, an amide, or a combination thereof, (d) an oxidizing agent, and (e) an aqueous carrier. The invention also provides a method of polishing a substrate, especially a substrate comprising a cobalt layer, with the polishing composition.

Claims (24)

1. A chemical-mechanical polishing composition comprising:

(a) about 0.1 wt. % to about 13 wt. % of an abrasive comprising alumina particles, silica particles, or a combination thereof,

(b) about 0.05 wt. % to about 5 wt. % of a rate accelerator comprising a phosphonic acid, an N-heterocyclic compound, or a combination thereof,

(c) a corrosion inhibitor comprising an amphoteric surfactant, a sulfonate, a fatty acid amino acid, an amide, or a combination thereof,

(d) about 0.1 wt. % to about 5 wt. % of an oxidizing agent, and

(e) an aqueous carrier, wherein the polishing composition further comprises a secondary rate accelerator comprising a phosphate salt, a borate salt, or a combination thereof, at a concentration of about 0.1 wt. % to about 1 wt. %.

2. The chemical-mechanical polishing composition of claim 1 , wherein the abrasive comprises alumina particles, wherein the alumina particles are alpha alumina particles, and wherein at least a portion of the surface of the alpha alumina particles is coated with a negatively-charged polymer or copolymer.

3. The chemical-mechanical polishing composition of claim 1 , wherein the abrasive comprises silica particles, and wherein the silica particles are colloidal silica particles.

4. The chemical-mechanical polishing composition of claim 1 , wherein the abrasive is present in the polishing composition at a concentration of about 0.3 wt. % to about 4 wt. %.

5. The chemical-mechanical polishing composition of claim 1 , wherein the rate accelerator is present in the polishing composition at a concentration of about 0.2 wt. % to about 1 wt. %.

6. The chemical-mechanical polishing composition of claim 1 , wherein the rate accelerator comprises a phosphonic acid.

7. The chemical-mechanical polishing composition of claim 6 , wherein the phosphonic acid is an amino tri(methylene phosphonic acid).

8. The chemical-mechanical polishing composition of claim 1 , wherein the rate accelerator comprises an N-heterocyclic compound.

9. The chemical-mechanical polishing composition of claim 8 , wherein the N-heterocyclic compound is picolinic acid, L-histidine, 2-mercapto-1-methylimidazole, or imidazole.

10. The chemical-mechanical polishing composition of claim 1 , wherein the corrosion inhibitor is present in the polishing composition at a concentration of about 0.001 wt. % to about 0.25 wt. %.

11. The chemical-mechanical polishing composition of claim 1 , wherein the corrosion inhibitor is a fatty acid amino acid.

12. The chemical-mechanical polishing composition of claim 11 , wherein the fatty acid amino acid is sodium lauroyl sarcosinate, sodium cocoyl alaninate, cocoyl glutamate, cocoyl sarcosinate, or myristoyl sarcosinate.

13. The chemical-mechanical polishing composition of claim 1 , wherein the corrosion inhibitor is a sodium C 14-17 sec-alkyl sulfonate.

14. The chemical-mechanical polishing composition of claim 1 , wherein the corrosion inhibitor is a cocoyl diethanolamide.

15. The chemical-mechanical polishing composition of claim 1 , wherein the polishing composition further comprises an ethylene oxide/propylene oxide block copolymer.

16. The chemical-mechanical polishing composition of claim 15 , wherein the ethylene oxide/propylene oxide block copolymer is present in the polishing composition at a concentration of about 0.005 wt. % to about 0.1 wt. %.

17. The chemical-mechanical polishing composition of claim 1 , wherein the polishing composition further comprises polyacrylic acid.

18. The chemical-mechanical polishing composition of claim 1 , wherein the pH of the polishing composition is about 4 to about 7.

19. The chemical-mechanical polishing composition of claim 1 , wherein the pH of the polishing composition is about 8 to about 11.

Assignments (8)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 21, 2017
From: SIKMA, ELISE; PAW, WITOLD; PETRO, BENJAMIN; CROSS, JEFFREY; WHITENER, GLENN
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 043067/0442 →
Continuity (2)
Provisional Application 62066484 · Oct 21, 2014
Related Publication 20160108286A1 · Apr 21, 2016