IP Library Granted Patent US 9,771,496
Granted Patent B2
US 9,771,496 · App. 14/924,997 · Granted Sep 26, 2017

Tungsten-processing slurry with cationic surfactant and cyclodextrin

Inventors: Kevin Dockery (Aurora, IL); Helin Huang (Aurora, IL); Lin Fu (Naperville, IL); Tina Li (Warrenville, IL)
Assignee: Cabot Microelectronics Corporation
C09G1/02B24B37/24C23F3/04
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Quick Facts
Patent No.
US 9,771,496
App. No.
14/924,997
Granted
Sep 26, 2017
Kind
B2
Abstract

Described are chemical-mechanical polishing compositions (e.g., slurries) and methods of using the slurries for chemical-mechanical polishing (or planarizing) a surface of a substrate that contains tungsten, the compositions containing cationic surfactant and cyclodextrin.

Claims (49)

1. A chemical mechanical polishing composition useful for processing a tungsten-containing surface, comprising:

liquid carrier,

abrasive particles dispersed in the liquid carrier, wherein the abrasive particles are colloidal silica particles having a permanent positive charge in a range from about 6 mV to about 50 mV,

cyclodextrin selected from alpha-, beta-, gamma-cyclodextrin, or a combination thereof, and

cationic surfactant having a cation and a hydrophobic tail that extends from the cation and that includes a chain comprising at least 7 carbon atoms, the cationic surfactant being capable of forming a complex with the cyclodextrin in the slurry.

2. The composition of claim 1 wherein the cationic surfactant has the structure:

wherein:

n is at least 1,

X is P + or N + ,

R 1 is a straight or branched alkyl group, optionally substituted, optionally containing unsaturation, that contains at least 7 carbon atoms,

R 2 , R 3 , and R 4 can independent be selected from:

hydrogen,

a saturated or unsaturated cyclic group that may be substituted or unsubstituted and may optionally include a heteroatom, a charged group, or both, and

a linear or branched alkyl group that may optionally include one or more of unsaturation, a heteroatom, or charged group and

a saturated or unsaturated ring structure formed from two or three of R 2 , R 3 , and R 4 , the ring optionally being substituted.

3. The composition of claim 2 wherein R 1 is a linear alkyl of from 7 to 20 carbon atoms.

4. The composition of claim 2 wherein R 2 is an alkyl group comprising not more than 6 carbon atoms.

5. The composition of claim 2 wherein each of R 3 and R 4 is independently an alkyl having from 1 to 6 carbon atoms.

6. The composition of claim 2 wherein the cationic surfactant is dicationic.

7. The composition of claim 6 wherein the surfactant has the formula:

wherein

R1 is an alkyl group having from 8 to 20 carbon atoms,

each R 3 , R 4 , R 5 , R 6 , and R 7 is independently an alkyl group having from 1 to 5 carbon atoms, and

Z is a divalent linking group having from 1 to 5 carbon atoms.

8. The composition of claim 7 wherein the dicationic surfactant is N,N,N′,N′, N′-pentamethyl-N-tallow-1,3-propanediammonium dichloride.

9. The composition of claim 1 wherein the cationic surfactant has the formula:

wherein:

n is at least 1,

X is P + or N + ,

R 1 is a straight or branched alkyl group, optionally containing unsaturation, that contains at least 7 carbon atoms, and

R 8 , R 9 , R 10 , R 11 , and R 12 can independent be selected from:

hydrogen,

a saturated or unsaturated cyclic group that may be substituted or unsubstituted and may optionally include a heteroatom, a charged group, or both, and

a linear or branched alkyl group that may optionally include one or more of unsaturation, a heteroatom, or charged group.

10. The composition of claim 9 wherein each of R 8 , R 9 , R 11 , and R 12 is hydrogen and R 10 is an unsaturated cyclic group that may be substituted or unsubstituted and may optionally include a heteroatom (e.g., nitrogen), a charged group (e.g., a charged nitrogen heteroatom), or both.

11. The composition of claim 1 comprising from about 0.001 to about 0.5 weight percent of the cationic surfactant based on total weight composition.

12. The composition of claim 1 comprising from about 0.01 to about 2 weight percent of the beta-cyclodextrin based on total weight composition.

13. The composition of claim 1 comprising a cationic surfactant-cyclodextrin complex of the beta-cyclodextrin associated with the cationic surfactant.

14. The composition of claim 13 comprising from about 0.001 to about 0.5 weight percent of the cationic surfactant-beta cyclodextrin complex.

15. The composition of claim 1 wherein 30 percent or more of the silica abrasive particles include three or more aggregated primary particles.

16. The composition according to claim 1 wherein the silica abrasive particles include a cationic compound incorporated into the particles, wherein the cationic compound is a charged nitrogen-containing compound or a charged phosphorous-containing compound.

17. The composition of claim 1 wherein the silica abrasive particles have a permanent positive charge of at least 10 millivolts.

18. The composition of claim 1 wherein the silica abrasive particles have a mean particle size in a range from about 30 to about 70 nanometers.

19. The composition of claim 1 comprising from about 1 to about 4 weight percent abrasive particles.

20. The composition of claim 1 further comprising:

from about 0.001 to about 1 weight percent inhibitor, wherein the inhibitor is an amino alkyl, an amino acid, or a combination thereof, and

from about 0.001 to about 0.5 weight percent catalyst.

21. The composition of claim 20 wherein the catalyst is a soluble iron-containing catalyst.

22. The composition of claim 1 further comprising an oxidizing agent.

Assignments (8)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 28, 2015
From: DOCKERY, KEVIN; HUANG, HELIN; FU, LIN; LI, TINA
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 036901/0277 →
Continuity (1)
Related Publication 20170121560A1 · May 4, 2017