Sensing circuit with sampled reference current or voltage for flash memory system
A circuit and method are disclosed for operating a non-volatile memory device, comprising time sampling a reference current or voltage in a floating holding node to obtain a hold voltage and applying the hold voltage in sensing circuitry.
1. A method of operating a non-volatile memory device comprising a sensing circuit coupled to a selected memory cell, the method comprising:
closing one or more switches to cause the device to operate in a first mode, wherein during the first mode a reference element draws a current and the current is mirrored by a current mirror to generate a reference current, the current mirror comprising a first transistor and a second transistor; and
opening the one or more switches to cause the device to operate in a second mode, wherein during the second mode the reference element is detached from the second transistor of the current mirror and the second transistor of the current mirror continues providing the reference current and the reference current is compared against a current drawn by a selected memory cell to determine a value stored in the selected memory cell.
2. The method of claim 1 , wherein the first transistor of the current mirror is a PMOS transistor and the second transistor of the current mirror is a PMOS transistor.
3. The method of claim 2 , wherein a gate of the second transistor of the current mirror is coupled to a capacitor.
4. The method of claim 1 , wherein the non-volatile memory device comprises an array of split gate memory cells.
5. The method of claim 1 , wherein the reference element is a memory cell.
6. The method of claim 1 , wherein the reference element is a resistor or a capacitor.
7. The method of claim 2 , wherein a gate of the second transistor of the current mirror is coupled to an operational amplifier.
8. A non-volatile memory device comprising:
a selected memory cell;
a sensing circuit coupled to a selected memory cell; and
a circuit comprising a current mirror and one or more switches, the current mirror comprising a first transistor and a second transistor, wherein when the one or more switches are closed, a reference element draws a current from the first transistor and the current is mirrored in the second transistor as a reference current, and when the one or more switches are open, the reference element is detached from the second transistor and the second transistor provides the reference current to the sensing circuit to determine a value stored in the selected memory cell.
9. The device of claim 8 , wherein the first transistor of the current mirror is a PMOS transistor and the second transistor of the current mirror is a PMOS transistor.
10. The device of claim 9 , wherein a gate of the second transistor of the current mirror is coupled to a capacitor.
11. The device of claim 8 , further comprising an array of split gate memory cells.
12. The device of claim 8 , wherein the reference element comprises a memory cell.
13. The device of claim 8 , wherein the reference element is a resistor or a capacitor.
14. The device of claim 9 , wherein a gate of the second transistor of the current mirror is coupled to an operational amplifier.