IP Library Granted Patent US 10,792,785
Granted Patent B2
US 10,792,785 · App. 15/615,591 · Granted Oct 6, 2020

Chemical-mechanical processing slurry and methods for processing a nickel substrate surface

Inventor: Ke Zhang (Singapore, SG)
Assignee: Cabot Microelectronics Corporation
B24B37/044C09G1/02C09K3/1463C09K3/1472
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Quick Facts
Patent No.
US 10,792,785
App. No.
15/615,591
Granted
Oct 6, 2020
Kind
B2
Abstract

Described are slurry compositions useful in chemical-mechanical processing of a nickel layer of a substrate, wherein the slurry compositions contain abrasive particles that include silica particles that are cationically charged at a low pH.

Claims (14)

1. A method of treating a nickel-phosphorus surface at a low pH, the method comprising:

providing a substrate having a nickel-phosphorus surface,

providing a slurry having a pH below 3, the slurry comprising:

liquid carrier,

cationic silica abrasive particles dispersed in the liquid carrier, the cationic silica abrasive particles containing cationic compound that is a nitrogen-containing compound or a phosphorus-containing compound, wherein the silica abrasive particles exhibit a zeta potential in a range from 5 to 60 millivolts in the slurry at the slurry pH, and

oxidizing agent, and

contacting the substrate surface with the slurry to remove nickel-phosphorus material from the surface.

2. The method of claim 1 wherein the silica abrasive particles exhibit a zeta potential in a range from 10 to 50 millivolts in the slurry.

3. The method of any of claim 1 wherein the slurry contains abrasive particles that include at least 95 weight percent silica particles based on total weight abrasive particles, and the silica particles contain at least 60 weight percent cationic silica particles based on total weight silica particles.

4. The method of claim 1 wherein the slurry contains abrasive particles that include less than 5 percent by weight alumina particles based on total weight abrasive particles.

5. The method of claim 1 wherein the cationic silica abrasive particles have a particle size of a least 50 nanometers.

6. The method of claim 1 wherein the cationic compound is an aminosilane compound.

7. The method of claim 6 wherein the aminosilane compound is aminopropyltrimethoxysilane.

8. The method of claim 1 wherein the slurry pH is below 2.

Assignments (8)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 6, 2017
From: ZHANG, KE
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 042619/0841 →
Continuity (2)
Provisional Application 62346778 · Jun 7, 2016
Related Publication 20170348820A1 · Dec 7, 2017