IP Library Granted Patent US 10,968,366
Granted Patent B2
US 10,968,366 · App. 16/208,742 · Granted Apr 6, 2021

Composition and method for metal CMP

Inventors: Steven Kraft (Plainfield, IL); Fernando Hung Low (Aurora, IL); Daniel Clingerman (Chicago, IL); Roman A. Ivanov (Aurora, IL); Steven Grumbine (Aurora, IL)
Assignee: CMC Materials, Inc.
C09G1/02C09G1/00C09G1/04C09K3/1454C09K3/1463H01L21/3212C09K3/1436
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Quick Facts
Patent No.
US 10,968,366
App. No.
16/208,742
Granted
Apr 6, 2021
Kind
B2
Abstract

A chemical mechanical polishing composition for polishing a substrate includes a liquid carrier and cationic metal oxide abrasive particles dispersed in the liquid carrier. The cationic metal oxide abrasive particles have a surface modified with at least one compound consisting of a silyl group having at least one quaternary ammonium group. A method for chemical mechanical polishing a substrate including a metal layer includes contacting the substrate with the above described polishing composition, moving the polishing composition relative to the substrate, and abrading the substrate to remove a portion of the metal layer from the substrate and thereby polish the substrate.

Claims (63)

1. A chemical mechanical polishing composition comprising:

a liquid carrier;

cationic metal oxide abrasive particles dispersed in the liquid carrier, the cationic metal oxide abrasive particles having a surface modified with at least one compound comprising a silyl group represented by general formula (2) or general formula (3):

—Si(X) n -[L-CR 1 (OH)—C(R 2 ) 2 -A] 3-n   (2)

wherein X is the same or different and each represents a hydroxyl group, a hydrolyzable substituent, a non-hydrolyzable substituent, or a bond with an O—Si of another silyl group or the particle;

n is 0, 1, or 2;

L is a linkage group;

R 1 is a hydrogen atom or an alkyl group that contains an amino group, a hydroxyl group, or an unsaturated bond;

R 2 is the same or different, and each represents a hydrogen atom or an alkyl group that contains an amino group, a hydroxyl group, or an unsaturated bond; and

A is a quaternary ammonium group;

wherein X is the same or different and each represents a hydroxyl group, a hydrolyzable substituent, a non-hydrolyzable substituent, or a bond with an O—Si of another silyl group or the particle;

n′ is 0, 1, or 2;

L′ is a linkage group; and

A′ is a quaternary ammonium group;

wherein the metal oxide abrasive particles have an aggregation ratio in a range from about 1.5 to about 5.0, and wherein the cationic metal oxide abrasive particles have an isoelectric point greater than about 9.

2. The composition of claim 1 , wherein

the silyl group is represented by the general formula (2); and

L is —CH 2 CH 2 CH 2 OCH 2 —, R 1 and R 2 are H, and A is —N′R′R″R′″ wherein R′, R″, and R′″ are the same or different and include substantially any carbon containing compound.

3. The composition of claim 1 , wherein

the silyl group is represented by the general formula (3); and

L is —CH 2 CH 2 — and A′ is —N′R′R″R′″ wherein R′, R″, and R′″ are the same or different and include substantially any carbon containing compound.

4. The composition of claim 1 , wherein the liquid carrier is water.

5. The composition of claim 1 , wherein the metal oxide abrasive particles are silica particles.

6. The composition of claim 1 , wherein the metal oxide abrasive particles have a mean particle size in a range from about 30 to about 90 nm.

7. The composition of claim 1 , having a pH from about 6 to about 8.

8. The composition of claim 1 , wherein the cationic metal oxide abrasive particles comprise colloidal silica particles having a zeta potential of at least 20 mV at a pH of greater than 6.

9. The composition of claim 1 , comprising less than about 2 weight percent of the cationic metal oxide abrasive particles.

10. The composition of claim 1 , wherein the liquid carrier has a total dissolved silicon concentration of less than about 150 ppm.

11. The composition of claim 1 , wherein the liquid carrier has a residual silane concentration of less than about 100 ppm.

12. The composition of claim 1 , further comprising a hydrogen peroxide oxidizer and a metal corrosion inhibitor.

13. A chemical mechanical polishing composition comprising:

a liquid carrier;

cationic metal oxide abrasive particles dispersed in the liquid carrier, the cationic metal oxide abrasive particles having a surface modified with at least one compound comprising a silyl group represented by general formula (2) or general formula (3):

—Si(X) n -[L-CR 1 (OH)—C(R 2 ) 2 -A] 3-n   (2)

wherein X is the same or different and each represents a hydroxyl group, a hydrolyzable substituent, a non-hydrolyzable substituent, or a bond with an O—Si of another silyl group or the particle;

n is 0, 1, or 2;

L is a linkage group;

R 1 is a hydrogen atom or an alkyl group that contains an amino group, a hydroxyl group, or an unsaturated bond;

R 2 is the same or different, and each represents a hydrogen atom or an alkyl group that contains an amino group, a hydroxyl group, or an unsaturated bond; and

A is a quaternary ammonium group;

wherein X′ is the same or different and each represents a hydroxyl group, a hydrolyzable substituent, a non-hydrolyzable substituent, or a bond with an O—Si of another silyl group or the particle;

n′ is 0, 1, or 2;

L′ is a linkage group; and

A′ is a quaternary ammonium group;

wherein the metal oxide abrasive particles have an aggregation ratio in a range from about 1.5 to about 5.0, further comprising a triazole pyridine compound and having a pH in a range from about 6 to about 8.

14. A chemical mechanical polishing composition comprising:

a liquid carrier;

cationic metal oxide abrasive particles dispersed in the liquid carrier, the cationic metal oxide abrasive particles having a surface modified with at least one compound comprising a silyl group represented by the general formula:

—Si(X) n -[L-O—R-A] 3-n   (1)

wherein X is the same or different and each represents a hydroxyl group, a hydrolyzable substituent, a non-hydrolyzable substituent, or a bond with an O—Si of another silyl group or the particle;

n is 0, 1, or 2;

L is a linkage group;

O is an oxygen heteroatom;

R is an alkyl group that contains an amino group, a hydroxyl group, or an unsaturated bond; and

A is a quaternary ammonium group;

wherein the liquid carrier is water and the metal oxide abrasive particles have a mean particle size in a range from about 30 to about 90 nm.

15. The composition of claim 14 , wherein L is —CH 2 CH 2 CH 2 —, R is —CH 2 CH(OH)CH 2 —, and A is —N + R′R″R′″ wherein R′, R″, and R′″ are the same or different and include substantially any carbon containing compound.

16. The composition of claim 14 , having a pH from about 6 to about 8 and wherein the wherein the cationic metal oxide abrasive particles comprise colloidal silica particles having a zeta potential of at least 20 mV.

17. The composition of claim 14 , comprising less than about 2 weight percent of the metal oxide abrasive particles.

18. The composition of claim 14 , wherein the liquid carrier has a total dissolved silicon concentration of less than about 150 ppm.

19. The composition of claim 14 , wherein the liquid carrier has a residual silane concentration of less than about 100 ppm.

20. The composition of claim 14 , further comprising a hydrogen peroxide oxidizer and a metal corrosion inhibitor.

21. The composition of claim 14 , further comprising a triazole pyridine compound and having a pH in a range from about 6 to about 8.

Assignments (9)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
SECURITY AGREEMENT Recorded Jul 2, 2021
From: CMC MATERIALS, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 056752/0645 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 24, 2019
From: KRAFT, STEVEN; HUNG LOW, FERNANDO; IVANOV, ROMAN A.; GRUMBINE, STEVEN; CLINGERMAN, DANIEL
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 049280/0194 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 4, 2018
From: KRAFT, STEVEN; HUNG LOW, FERNANDO; CLINGERMAN, DANIEL; IVANOV, ROMAN A.; GRUMBINE, STEVEN
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 047665/0896 →