IP Library Granted Patent US 11,034,862
Granted Patent B2
US 11,034,862 · App. 16/664,235 · Granted Jun 15, 2021

Polishing composition and method utilizing abrasive particles treated with an aminosilane

Inventors: Steven Grumbine (Aurora, IL); Shoutian Li (Naperville, IL); William Ward (Glen Ellyn, IL); Pankaj Singh (Naperville, IL); Jeffrey Dysard (Spring, TX)
Assignee: CMC Materials, Inc.
C09G1/02B24B37/044C09K3/1436C09K3/1463H01L21/31053
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Quick Facts
Patent No.
US 11,034,862
App. No.
16/664,235
Granted
Jun 15, 2021
Kind
B2
Abstract

The inventive method comprises chemically-mechanically polishing a substrate with an inventive polishing composition comprising a liquid carrier and abrasive particles that have been treated with a compound.

Claims (14)

1. A method of chemically-mechanically polishing a substrate, which method comprises:

(i) contacting a substrate with a chemical-mechanical polishing composition comprising:

(a) a liquid carrier, and

(b) an abrasive suspended in the liquid carrier, wherein the abrasive comprises colloidal silica particles having a surface which has been treated with a compound selected from the group consisting of an aminosilane compound, a phosphonomumsilane compound, and a sulfonium silane compound, wherein the colloidal silica particles have a percent surface coverage from about 5% to about 32%, and

(c) about 0.0001 wt.% to about 3 wt.% of a corrosion inhibitor, and

(d) an oxidizing agent,

(ii) moving the polishing composition relative to the substrate, and

(iii) abrading at least a portion of the substrate to polish the substrate, wherein the substrate comprises at least one layer of silicon oxide or at least one layer of silicon nitride, and wherein the substrate further comprises at least one metal layer, and wherein at least a portion of the substrate is removed to polish the substrate.

2. The method of claim 1 , wherein the metal layer is selected from the group consisting of tungsten, tantalum, titanium, ruthenium, copper and aluminum.

3. The method of claim 1 , wherein the polishing composition has a pH of about 1 to about 7.

4. The method of claim 1 , wherein the surface of the abrasive has been treated with an aminosilane compound that contains an ammopropyl group.

5. The method of claim 1 , wherein the oxidizing agent is selected from the group consisting of bromates, bromites, chlorates, chlorites, hydrogen peroxide, hypochlorites, iodates, hydroxylamine salts, monoperoxy sulfate, monoperoxy sulfite, monoperoxyphosphate, monoperoxyhypophosphate, monoperoxypyrophosphate, organohalo-oxy compounds, periodates, permanganate, peroxyacetic acid, and mixtures thereof.

6. The method of claim 1 , wherein the polishing composition has a pH of about 1.5 to about 5.

7. The method of claim 1 , wherein the polishing composition has a pH of about 2 to about 4.

Assignments (8)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
SECURITY AGREEMENT Recorded Jul 2, 2021
From: CMC MATERIALS, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 056752/0645 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 25, 2019
From: GRUMBINE, STEVEN; LI, SHOUTIAN; WARD, WILLIAM; SINGH, PANKAJ; DYSARD, JEFFREY
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 050833/0017 →