Granted Patent B2

US 12,561,206 · App. 17/974,981 · Granted Feb 24, 2026

Inventors: Alicia Wen Ju Yurie Leong (Austin, TX); William Robert Alverson (Del Valle, TX); Joshua Taylor Knight (Georgetown, TX); Jerry Anton Ahrens (Sister Bay, WI); Grant Evan Ley (Eden, UT); Anil Harwani (Austin, TX); Amitabh Mehra (Fort Collins, CO); Jayesh Hari Joshi (Austin, TX)

Assignee: Advanced Micro Devices, Inc.

G06F11/1417G11C29/52

Abstract

Claims (34)

1 . A system comprising:

a memory; and

a memory controller configured to:

receive a test request to test specified overclocked memory settings that comprise values of memory settings specified for testing stability of the memory operated using the specified overclocked memory settings;

responsive to the test request, power off the system and initiate a boot up process of the system;

during the boot up process of the system, directly access the memory to test operation of the memory with the specified overclocked memory settings, including testing different voltage or delay levels for different bits of the memory; and

output test results based on the testing.

2 . The system of claim 1 , wherein the test results predict the stability of the memory if the memory is configured to operate with the specified overclocked memory settings.

3 . The system of claim 1 , wherein the memory controller is configured to test the operation of the memory with the specified overclocked memory settings by performing at least one of reference voltage (Vref) or delay-locked loop (DLL) shmoos.

4 . The system of claim 1 , wherein the memory controller is configured to test the operation of the memory with the specified overclocked memory settings by generating one or more eye diagrams of the memory.

5 . The system of claim 1 , wherein the memory controller is configured to output the test results by communicating the test results to an operating system to enable the operating system to display the test results via a user interface.

6 . The system of claim 1 , wherein the test results include a score indicative of the test results.

7 . The system of claim 1 , wherein the test results include a graph or chart depicting the stability of the memory over time if the memory is configured to operate with the specified overclocked memory settings.

8 . The system of claim 1 , wherein the test results include a recommendation to adjust one or more parameters of the specified overclocked memory settings to improve the stability of the memory over a subsequent period of time.

9 . A method comprising:

receiving a test request to test specified overclocked memory settings that comprise values of memory settings specified for testing stability of a memory operated using the specified overclocked memory settings;

directly accessing the memory by a memory controller to test, during a boot up process of a computing device and in response to receiving the test request, operation of the memory with the specified overclocked memory settings, including testing one or more portions of the memory for rowhammering; and

exposing test results via a user interface, the test results predicting the stability of the memory over a subsequent time period if the memory is configured to operate with the specified overclocked memory settings.

10 . The method of claim 9 , wherein the test results include a score indicative of the test results.

11 . The method of claim 9 , wherein the test results include a graph or chart depicting the stability of the memory over time if the memory is configured to operate with the specified overclocked memory settings.

12 . The method of claim 9 , wherein the test results include a recommendation to adjust one or more parameters of the specified overclocked memory settings to improve the stability of the memory over the subsequent time period.

13 . The method of claim 9 , wherein overclocked memory settings are based on user input specifying the overclocked memory settings.

14 . The method of claim 13 , wherein the testing occurs responsive to receiving the test request to test the operation of the memory with the specified overclocked memory settings via user input to the user interface.

15 . The method of claim 9 , wherein the testing includes performing at least one of reference voltage (Vref) or delay-locked loop shmoos.

16 . The method of claim 9 , wherein the testing includes performing virtual timing and signal analysis.

17 . An apparatus comprising:

a memory; and

a memory controller configured to:

receive a test request to test specified overclocked memory settings that comprise values of memory settings specified for testing stability of the memory operated using the specified overclocked memory settings;

directly access the memory to test, during a boot up process of a computing device and in response to receiving the test request, operation of the memory with the specified overclocked memory settings by performing at least one of reference voltage (Vref) or delay-locked loop (DLL) shmoos; and

expose test results via a user interface, the test results predicting the stability of the memory over a subsequent time period if the memory is configured to operate with the specified overclocked memory settings.

18 . The apparatus of claim 17 , wherein the memory settings include overclocked memory settings.

19 . The apparatus of claim 18 , wherein the overclocked memory settings are specified by a user.

20 . The apparatus of claim 17 , wherein the test results include a recommendation to adjust one or more parameters of the specified overclocked memory settings to improve the stability of the memory over the subsequent time period.

Assignments (1)

Continuity (1)

References Cited (68)