IP Library › Granted Patent US 12,531,187
Granted Patent B2
US 12,531,187 · App. 18/538,661 · Granted Jan 20, 2026

Multilayered capacitor

Inventors: Seung Ah Kim (Suwon-si, KR); Gyuho Yeon (Suwon-si, KR); Chaedong Lee (Suwon-si, KR); Hyunhee Gu (Suwon-si, KR)
Assignee: SAMSUNG ELECTRO-MECHANICS CO., LTD.
H01G4/2325H01G4/30H01G4/0085H01G4/1227
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Quick Facts
Patent No.
US 12,531,187
App. No.
18/538,661
Granted
Jan 20, 2026
Kind
B2
Abstract

A multilayered capacitor includes a capacitor body including a dielectric layer and an internal electrode, and an external electrode disposed on the capacitor body. The external electrode includes a first region including a portion of a sintered metal layer and a portion of a plating layer and a second region including another portion of the sintered metal layer, a conductive resin layer, and another portion of the plating layer. An average thickness T e1 of the plating layer in the first region and an average thickness T e2 of the plating layer in the second region satisfy 0.2×T e1 <T e2 ≤0.8×T e1 .

Claims (47)

1 . A multilayered capacitor, comprising:

a capacitor body including a dielectric layer and an internal electrode; and

an external electrode disposed on the capacitor body,

wherein the external electrode includes a sintered metal layer connected to the internal electrode, a conductive resin layer including a resin and configured to cover a portion of the sintered metal layer and to expose another portion of the sintered metal layer, and a plating layer configured to cover the sintered metal layer and the conductive resin layer,

the external electrode includes a first region including the another portion of the sintered metal layer and a portion of the plating layer, and a second region including the portion of the sintered metal layer, the conductive resin layer, and another portion of the plating layer, and

an average thickness T e1 of the plating layer in the first region and an average thickness T e2 of the plating layer in the second region satisfy 0.2×T e1 <T e2 ≤0.8×T e1 .

2 . The multilayered capacitor of claim 1 , wherein

a minimum thickness of the plating layer in the first region is greater than a maximum thickness of the plating layer in the second region.

3 . The multilayered capacitor of claim 1 , wherein

T e1 is about 6 μm to about 12 μm.

4 . The multilayered capacitor of claim 1 , wherein

T e2 is about 2 μm to about 8 μm.

5 . The multilayered capacitor of claim 1 , wherein

the capacitor body has first and second surfaces opposing each other in a stacking direction of the dielectric layer and internal electrode, third and fourth surfaces opposing each other in a longitudinal direction, and fifth and sixth surfaces opposing each other in a width direction.

6 . The multilayered capacitor of claim 5 , wherein

the external electrode includes a first electrode portion on the first surface, a second electrode portion on the second surface, a third electrode portion on the fifth and sixth surfaces, and a fourth electrode portion on one of the third and fourth surfaces.

7 . The multilayered capacitor of claim 6 , wherein

the first electrode portion includes the sintered metal layer, the conductive resin layer, and the plating layer, and

the second electrode portion includes the sintered metal layer and the plating layer and does not include the conductive resin layer.

8 . The multilayered capacitor of claim 6 , wherein

the third electrode portion has the first region and the second region.

9 . The multilayered capacitor of claim 8 , wherein

the second region is closer to the first surface than the first region, and

the first region is closer to the second surface than the second region.

10 . The multilayered capacitor of claim 8 , wherein

in the third electrode portion, an average length of the second region in the stacking direction is less than or equal to about 95% of the total third electrode portion.

11 . The multilayered capacitor of claim 6 , wherein

the fourth electrode portion has the first region and the second region.

12 . The multilayered capacitor of claim 11 , wherein

in the fourth electrode portion, an average length of the second region in the stacking direction is less than or equal to about 95% of the total fourth electrode portion.

13 . The multilayered capacitor of claim 11 , wherein

the second region is closer to the first surface than the first region, and

the first region is closer to the second surface than the second region.

14 . The multilayered capacitor of claim 13 , wherein

the sintered metal layer is disposed in the first electrode portion, the second electrode portion, the first and second regions of the third electrode portion, and the first and second regions of the fourth electrode portion.

15 . The multilayered capacitor of claim 13 , wherein

the conductive resin layer is disposed in the first electrode portion, the second region of the third electrode portion, and the second region of the fourth electrode portion.

16 . The multilayered capacitor of claim 13 , wherein

the plating layer is disposed in the first electrode portion, the second electrode portion, the first region and the second region of the third electrode portion, and the first region and the second region of the fourth electrode portion.

17 . The multilayered capacitor of claim 1 , wherein

the sintered metal layer includes a conductive metal and glass.

18 . The multilayered capacitor of claim 1 , wherein

in the conductive resin layer,

the resin includes an epoxy resin, and

the conductive metal includes copper (Cu), silver (Ag), nickel (Ni), or a mixture thereof.

19 . The multilayered capacitor of claim 1 , wherein

the plating layer includes nickel (Ni), copper (Cu), tin (Sn), palladium (Pd), platinum (Pt), gold (Au), silver (Ag), tungsten (W), titanium (Ti), lead (Pb), an alloy thereof, or a mixture thereof.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 15, 2023
From: KIM, SEUNG AH; YEON, GYUHO; LEE, CHAEDONG; GU, HYUNHEE
To: SAMSUNG ELECTRO-MECHANICS CO., LTD.
Reel/Frame 065889/0433 →
Priority Claims (1)
KR 10-2023-0022144 · Feb 20, 2023 · national
Continuity (1)
Related Publication 20240282531A1 · Aug 22, 2024
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