IP Library Granted Patent US 12,733,254
Granted Patent B2
US 12,733,254 · App. 18/540,524 · Granted Sep 8, 2026

Complementary transistor and semiconductor device

Inventors: Hidetoshi Oishi (Saga, JP); Koichi Matsumoto (Kanagawa, JP); Kazuyuki Tomida (Kanagawa, JP)
Assignee: Sony Group Corporation
H10D84/853H10B10/00H10D12/211H10D30/01H10D30/024H10D30/47H10D30/6211H10D30/6219H10D30/6713H10D30/6727H10D30/6741H10D30/675H10D30/6757H10D30/751H10D62/115H10D62/80H10D62/82H10D62/83H10D62/8303H10D62/882H10D64/511H10D84/0167H10D84/0193H10D84/038H10D84/85H10D86/01H10D86/201H10P30/204H10P30/208
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Quick Facts
Patent No.
US 12,733,254
App. No.
18/540,524
Granted
Sep 8, 2026
Kind
B2
Abstract

A complementary transistor is constituted of a first transistor TR 1 and a second transistor TR 2 , active regions 32, 42 of the respective transistors are formed by layering first A layers 33, 43 and the first B layers 35, 45 respectively, surface regions 20 1 , 20 2 provided in a base correspond to first A layers 33, 43 respectively, first B layers 35, 45 each have a conductivity type different from that of the first A layers 33, 43 , and extension layers 36, 46 of the first B layer are provided on insulation regions 21 1 , 21 2 respectively.

Claims (58)

1 . A complementary transistor, comprising:

a first transistor including:

a first control electrode; and

a first active region located below the first control electrode and formed by layering a first A layer and a first B layer; and

a second transistor including:

a second control electrode; and

a second active region located below the second control electrode formed by layering a second A layer and a second B layer,

wherein the first B layer is constituted of a two-dimensional material or graphene, and the second B layer is constituted of a two-dimensional material or graphene.

2 . The complementary transistor according to claim 1 , wherein the two-dimensional material includes one kind of two-dimensional material selected from a group consisting of MoS2, MoSe2, MoTe2, WS2, WSe2, WTe2, ZrS2, ZrSe2, ZrTe2, HfS2, HfSe2 and HfTe2.

3 . The complementary transistor according to claim 1 , wherein a first surface region is provided in a base and has a first conductivity type corresponding to the first A layer and the first B layer has a property as a second conductivity type different from the first conductivity type.

4 . The complementary transistor according to claim 3 , wherein a second surface region is provided in the base and has the second conductivity type corresponding to the second A layer and the second B layer has a property as the first conductivity type.

5 . The complementary transistor according to claim 3 , wherein the base is constituted of a semiconductor substrate.

6 . The complementary transistor according to claim 5 , wherein the base is constituted of a two-dimensional material layer.

7 . The complementary transistor according to claim 3 , wherein the base is constituted of silicon or germanium, the first B layer is constituted of MoS2, WTe2 or graphene and the second B layer is constituted of HfTe2.

8 . The complementary transistor according to claim 3 , wherein the base is constituted of MoS2, the first B layer is constituted of WTe2, and the second B layer is constituted of ZrS2, HfS2 or HfSe2.

9 . The complementary transistor according to claim 4 , wherein

a portion of the base constituting the first surface region and a portion of the base constituting the second surface region are constituted of different materials, and

the first B layer and the second B layer are constituted of the same material.

10 . The complementary transistor according to claim 9 , wherein

the portion of the base constituting the first surface region is constituted of a silicon semiconductor substrate,

the portion of the base constituting the second surface region is constituted of a semiconductor layer formed in the silicon semiconductor substrate, and

the first B layer and the second B layer are constituted of the same two-dimensional material.

11 . The complementary transistor according to claim 9 , wherein

the portion of the base constituting the first surface region is constituted of a semiconductor layer formed in a silicon semiconductor substrate,

the portion of the base constituting the second surface region is constituted of the silicon semiconductor substrate, and

the first B layer and the second B layer are constituted of the same two-dimensional material.

12 . The complementary transistor according to claim 9 , wherein

the portion of the base constituting the first surface region is constituted of a first semiconductor layer formed in a semiconductor substrate,

the portion of the base constituting the second surface region is constituted of a second semiconductor layer formed in the semiconductor substrate, and

the first B layer and the second B layer are constituted of the same two-dimensional material.

13 . The complementary transistor according to claim 9 , wherein

the portion of the base constituting the first surface region and the portion of the base constituting the second surface region are constituted of different materials, and

the first B layer and the second B layer are constituted of different materials.

14 . The complementary transistor according to claim 1 , wherein

a first interlayer insulation film is formed between the first A layer and the first B layer, and

a second interlayer insulation film is formed between the second A layer and the second B layer.

15 . A complementary transistor, comprising:

a semiconductor substrate;

a first transistor including:

a first control electrode; and

a first active region located below the first control electrode and formed by layering a first A layer and a first B layer; and

a second transistor including:

a second control electrode; and

a second active region located below the second control electrode formed by layering a second A layer and a second B layer,

wherein the first B layer is constituted of a two-dimensional material or graphene, and the second B layer is constituted of a two-dimensional material or graphene.

16 . The complementary transistor according to claim 15 , further comprising a buffer layer provided between the first control electrode and the semiconductor substrate.

17 . The complementary transistor according to claim 16 , wherein the buffer layer includes a material selected from the group consisting of InP, InAlAs, InGaAs, GaAs, and GaSb.

18 . The complementary transistor according to claim 15 , wherein the two-dimensional material includes one kind of two-dimensional material selected from a group consisting of MoS2, MoSe2, MoTe2, WS2, WSe2, WTe2, ZrS2, ZrSe2, ZrTe2, HfS2, HfSe2 and HfTe2.

19 . A complementary transistor, comprising:

a semiconductor substrate;

a first transistor including:

a first control electrode; and

a first active region located below the first control electrode and formed by layering a first A layer and a first B layer;

a second transistor including:

a second control electrode; and

a second active region located below the second control electrode formed by layering a second A layer and a second B layer; and

a buffer layer provided between the first control electrode and the semiconductor substrate.

20 . The complementary transistor according to claim 19 , wherein the buffer layer includes a material selected from the group consisting of InP, InAlAs, InGaAs, GaAs, and GaSb.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 15, 2023
From: OISHI, HIDETOSHI; MATSUMOTO, KOICHI; TOMIDA, KAZUYUKI
To: SONY CORPORATION
Reel/Frame 065882/0342 →
CHANGE OF NAME Recorded Dec 15, 2023
From: SONY CORPORATION
To: SONY GROUP CORPORATION
Reel/Frame 066045/0349 →
Priority Claims (2)
JP 2016-142699 · Jul 20, 2016 · national
JP 2017-118682 · Jun 16, 2017 · national
Continuity (4)
Continuation 17224617 · Apr 7, 2021
Continuation 16893280 · Jun 4, 2020
Continuation 16316702 · Jun 23, 2017
Related Publication 20240113120A1 · Apr 4, 2024
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