IP Library Granted Patent US 9,087,811
Granted Patent B2
US 9,087,811 · App. 13/969,013 · Granted Jul 21, 2015

Self aligned embedded gate carbon transistors

Inventors: Dechao Guo (Fishkill, NY); Shu-Jen Han (Cortlandt Manor, NY); Yu Lu (Hopewell Junction, NY); Keith Kwong Hon Wong (New York, NY)
Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
H01L29/41741H01L29/41775H01L29/66045H01L29/778H01L29/1606H01L51/0048H01L51/0545
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Quick Facts
Patent No.
US 9,087,811
App. No.
13/969,013
Granted
Jul 21, 2015
Kind
B2
Abstract

Transistors with self-aligned source/drain regions a gate structure embedded in a substrate; self-aligned source and drain contacts embedded in the substrate around the gate structure; and a channel layer over the gate structure and self-aligned source and drain contacts. The source and drain contacts extend above the channel layer.

Claims (12)

1. A transistor, comprising:

a gate structure embedded in a substrate;

self-aligned source and drain contacts embedded in the substrate around the gate structure; and

a channel layer over the gate structure and self-aligned source and drain contacts, said channel layer comprising source/drain access holes over the respective source and drain contacts to allow access to said source and drain contacts, wherein the source and drain contacts extend above the channel layer.

2. The transistor of claim 1 , wherein the channel layer comprises a carbon-based channel material.

3. The transistor of claim 1 , wherein the gate structure comprises:

a nitride layer formed in a recess of the substrate;

a metal gate formed over the nitride layer; and

a dielectric layer formed over the metal gate and nitride layer.

4. The transistor of claim 1 , wherein the substrate is an oxide that surrounds the gate structure and source and drain regions.

5. The transistor of claim 1 , wherein the gate structure and the self-aligned source and drain contacts are on a same side of the channel layer.

6. The transistor of claim 1 , further comprising a passivation layer over the channel layer that protects the channel layer, wherein the source and drain contacts are accessible through the passivation layer.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded May 12, 2021
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 056987/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 20, 2020
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES INC.
Reel/Frame 054636/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 2, 2020
From: GLOBALFOUNDRIES INC.
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 054633/0001 →
SECURITY AGREEMENT Recorded Nov 29, 2018
From: GLOBALFOUNDRIES INC.
To: WILMINGTON TRUST, NATIONAL ASSOCIATION
Reel/Frame 049490/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 5, 2015
From: GLOBALFOUNDRIES U.S. 2 LLC; GLOBALFOUNDRIES U.S. INC.
To: GLOBALFOUNDRIES INC.
Reel/Frame 036779/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 3, 2015
From: INTERNATIONAL BUSINESS MACHINES CORPORATION
To: GLOBALFOUNDRIES U.S. 2 LLC
Reel/Frame 036550/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 16, 2013
From: GUO, DECHAO; HAN, SHU-JEN; LU, YU; WONG, KEITH KWONG HON
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 031027/0422 →
Continuity (2)
Continuation 13864760 · Apr 17, 2013
Related Publication 20140312413A1 · Oct 23, 2014