IP Library Granted Patent US 12,019,513
Granted Patent B2
US 12,019,513 · App. 17/730,381 · Granted Jun 25, 2024

Apparatuses, systems, and methods for per row error scrub information

Inventor: Sujeet Ayyapureddi (Boise, ID)
Assignee: MICRON TECHNOLOGY, INC.
G06F11/106
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Quick Facts
Patent No.
US 12,019,513
App. No.
17/730,381
Granted
Jun 25, 2024
Kind
B2
Abstract

Apparatuses, systems, and methods for per row error correct and scrub (pRECS) information. There may be pRECS information associated with each row, and it may reflect a number of codewords stored along that row which were determined to include an error during error correct and scrub (ECS) operations. The memory may store the pRECS information in the memory array, for example, each row may store the pRECS information associated with that row.

Claims (55)

1. An apparatus comprising:

a memory array comprising:

a plurality of rows each configured to store a plurality of codewords; and

a plurality of count values, each associated with one of the plurality of rows; and

an error correction and scrub (ECS) circuit configured to determine a number of the plurality of codewords along each of the plurality of rows which include errors and set an associated one of the plurality of count values as the number,

wherein each of the plurality of rows includes a respective plurality of memory cells, a first portion of which are used to store data, a second portion of which are used to store metadata associated with the data, and a third portion of which are used neither for data or metadata, and wherein each of the plurality of count values is stored in the third portion of the plurality of memory cells along the associated one of the rows.

2. The apparatus of claim 1 , wherein each of the plurality of count value is stored in memory cells along the associated one of the plurality of rows.

3. The apparatus of claim 2 , wherein the memory cells are addressed by a common value of a column select signal.

4. The apparatus of claim 1 , wherein the ECS circuit includes a plurality of count registers, each associated with a bank of the memory array, each of the plurality of count registers configured to store a value which is written to the memory array as one of the plurality of count values.

5. The apparatus of claim 1 , wherein the ECS circuit is configured to generate a column address, perform an ECS operation on one of the plurality of codewords specified by the column address, increment a count register if the one of the plurality of codewords includes an error, update the column address, and write a value of the count register as one of the plurality of count values if the updated column address wraps.

6. A method comprising:

performing an error correction and scrub (ECS) operation on the codewords stored along each of a plurality of rows of a memory array;

generating a plurality of per-row ECS error counts, wherein each per-row ECS error count is associated with one of the plurality of rows and indicates a number of the codewords stored along the associated one of the plurality of rows which included an error;

storing the per-row ECS error counts in the memory array;

storing data along a first portion of a plurality of memory cells along each of the plurality of rows;

storing metadata associated with the data along a second portion of the plurality of memory cells along each of the plurality of rows; and

storing the each of the per-row ECS error counts in a third portion of the plurality of memory cells along the associated one of the plurality of rows, wherein the third portion is used to store neither data nor metadata.

7. The method of claim 6 , further comprising storing each of the per-row ECS error counts in memory cells of the associated one of the plurality of rows.

8. The method of claim 6 , further comprising:

performing the ECS operation on a selected one of the codewords specified by a row address and a column address;

incrementing a per-row ECS count register if the selected one of the codewords included an error;

updating the column address;

determining if the column address has wrapped; and

updating the row address if the column address has wrapped.

9. The method of claim 8 , further comprising:

writing a value of the per-row ECS count register to the memory array as one of the per-row ECS error counts if the column address has wrapped; and

resetting the per-row ECS count register if the column address has wrapped.

10. The method of claim 6 , further comprising generating an overall count of the number of codewords along all of the rows of the memory which include an error.

11. An apparatus comprising:

a row comprising a plurality of memory cells, wherein a first portion of the plurality of memory cells are configured to store a plurality of codewords, and wherein a second portion of the plurality of memory cells are configured to store a count value of a number of the plurality of codewords detected as including an error, wherein only column addresses associated with the first portion is used for addressable memory.

12. The apparatus of claim 11 , further comprising an error correction and scrub (ECS) logic circuit configured to count a number of the plurality of code words which include an error and write the count to the second portion.

13. The apparatus of claim 12 ,

wherein the row is associated with one of a plurality of banks,

wherein the ECS logic circuit includes a plurality of per-row ECS error count registers, each associated with one of the plurality of banks, and

wherein the ECS logic circuit is configured to count the number of the plurality of code words which include an error by incrementing one of the plurality of per-row ECS error count registers associated with the one of the plurality of banks associated with the row.

14. The apparatus of claim 11 , further comprising an error correction code (ECC) circuit configured to read a selected one of the plurality of codewords, determine if the selected one of the plurality of codewords includes an error, correct the error and write the corrected codeword back to the row.

15. A method comprising:

performing an error correction and scrub (ECS) operation on each of a plurality of codewords along a row;

counting a number of the plurality of codewords which include an error; and

storing the number in a portion of memory cells of the row, wherein the portion of memory cells is not used as addressable memory.

16. The method of claim 15 , further comprising:

incrementing a per-row ECS register in an ECS circuit each time the ECS operation detects an error; and

writing a value of the per-row ECS register to the portion of the memory cells when an ECS operation is performed on a final one of the plurality of codewords.

17. The method of claim 15 , wherein each of the ECS operations comprises:

determining if the codeword includes an error;

correcting the error; and

writing the corrected codeword bank to the row.

18. The method of claim 15 , further comprising:

performing an ECS operation on each of a second plurality of codewords along a second row;

counting a second number of the second plurality of codewords which include an error; and

storing the second number in a portion of memory cells of the second row.

19. The method of claim 15 , further comprising:

comparing the number to a saved number in an errors per row count (EpRC) register;

saving a row address associated with the row if the number is greater than the saved number; and

replacing the saved number with the number if the number is greater than the saved number.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 27, 2022
From: AYYAPUREDDI, SUJEET
To: MICRON TECHNOLOGY, INC.
Reel/Frame 059728/0820 →
Continuity (1)
Related Publication 20230350748A1 · Nov 2, 2023
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