IP Library › Granted Patent US 12,524,306
Granted Patent B2
US 12,524,306 · App. 18/625,539 · Granted Jan 13, 2026

Apparatuses, systems, and methods for per row error scrub information

Inventor: Sujeet Ayyapureddi (Boise, ID)
Assignee: Micron Technology, Inc.
G06F11/106
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Quick Facts
Patent No.
US 12,524,306
App. No.
18/625,539
Filed
Apr 3, 2024
Granted
Jan 13, 2026
Kind
B2
Art Unit
2113
USPC
714/6.21
Abstract

Apparatuses, systems, and methods for per row error correct and scrub (pRECS) information. There may be pRECS information associated with each row, and it may reflect a number of codewords stored along that row which were determined to include an error during error correct and scrub (ECS) operations. The memory may store the pRECS information in the memory array, for example, each row may store the pRECS information associated with that row.

Claims (59)

1 . An apparatus comprising:

a memory array comprising:

a plurality of rows configured to store a plurality of codewords; and

a plurality of count values, each associated with one of the plurality of rows; and

an error correction and scrub (ECS) circuit comprising a count register configured to track a number of errors along a current row of the plurality of rows, wherein the ECS circuit is configured to increment a value stored in the count register of the ECS responsive to detecting an error, and to update an associated one of the plurality of count values in the memory array with the value stored in the count register, and wherein the ECS circuit is configured to store overall ECS information in a mode register.

2 . The apparatus of claim 1 , wherein the ECS circuit is further configured to:

generate a column address;

perform an ECS operation on one of the plurality of codewords specified by the column address;

store the value in the count register as one of the count values in memory array if the column address wraps; and

reset the count register to an initial value.

3 . The apparatus of claim 1 , wherein the overall ECS information represents a total number of errors in the memory array.

4 . The apparatus of claim 1 , wherein the overall ECS information represents a maximum number of codewords with errors which are located on a row address and the row address.

5 . The apparatus of claim 1 , wherein the mode register is configured to designate a value of a column select signal set aside for per-row ECS information.

6 . The apparatus of claim 1 , further comprising:

an error correction circuit (ECC) configured to read a selected one of the plurality of codewords, determined if the selected one of the plurality of codewords includes an error, correct the error and write the corrected codeword back to the row.

7 . The apparatus of claim 1 , wherein the mode register includes an enable register configured to activate the ECS circuit.

8 . A method comprising:

performing an error correction and scrub (ECS) operation on codewords stored along each of a plurality of rows of a memory array;

incrementing a per-row ECS count register if a selected one of the codewords included an error;

generating a plurality of per-row ECS error counts, wherein each per-row ECS error count is associated with one of the plurality of rows and indicates a number of the codewords stored along the associated one of the plurality of rows which included an error;

writing a value of the per-row ECS count register to the memory array as one of the per-row ECS error counts; and

storing the per-row ECS error counts in the associated row in the memory array specified by a mode register.

9 . The method of claim 8 , further comprising:

designating a value of a column select signal set aside for the per-row ECS error counts.

10 . The method of claim 8 , further comprising storing each of the per-row ECS error counts in memory cells of the associated one of the plurality of rows.

11 . The method of claim 10 , further comprising:

storing a row address associated with the row which contains the most codeword errors.

12 . The method of claim 8 , further comprising:

performing the ECS operation on the selected one of the codewords specified by a row address and a column address;

updating the column address;

determining if the column address has wrapped; and

updating the row address if the column address has wrapped.

13 . The method of claim 12 , further comprising:

writing the value of the per-row ECS count register to the memory array as one of the per-row ECS error counts if the column address wrapped; and

resetting the per-row ECS count register if the column address has wrapped.

14 . The method of claim 8 , further comprising:

comparing the per-row ECS error counts to a saved number in an errors per row count (EpRC) register;

saving a row address associated with the row if the number is greater than the saved number; and

replacing the saved number with the number if the number is greater than the saved number.

15 . The method of claim 8 , further comprising:

storing overall ECS information in the mode register.

16 . A method comprising:

performing an error correction and scrub (ECS) operation on each of a plurality of codewords along a row of a memory array;

determining if the codeword includes an error;

counting a number of the plurality of codewords which include an error;

incrementing a count value stored in a count register each time a codeword with an error is detected;

storing the number in memory cells of the row;

generating overall ECS information; and

storing the overall ECS information in a mode register.

17 . The method of claim 16 , further comprising

responsive to the codeword including an error, correcting the error; and

writing the corrected codeword to the row.

18 . The method of claim 16 , further comprising:

performing the ECS operation on each of a second plurality of codewords along a second row of the memory array;

counting a second number of e second plurality of codewords which include an error; and

storing the second number in memory cells of the second row.

19 . The method of claim 18 , further comprising:

storing a third number representing the count value to the mode register if the count value exceeds a threshold when all addresses in the sequence are complete.

20 . The method of claim 19 , wherein the third number specifies a range of the count value relative to the threshold.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2024
From: AYYAPUREDDI, SUJEET
To: MICRON TECHNOLOGY, INC.
Reel/Frame 066998/0863 →
Continuity (2)
Continuation 17730381 · Apr 27, 2022
Related Publication 20240248796A1 · Jul 25, 2024
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