IP Library › Granted Patent US 12,276,891
Granted Patent B2
US 12,276,891 · App. 18/397,437 · Granted Apr 15, 2025

Liquid crystal display device and electronic device

Inventor: Hajime Kimura (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
G02F1/136286G02F1/133345G02F1/1337G02F1/134363G02F1/1362G02F1/136277G02F1/1368G09G3/20G09G3/3659H01L27/1214H01L27/1218H04N9/3102G02F1/133553G02F1/134372G02F1/136231G09G3/342G09G3/3685G09G2300/0876G09G2310/0235G09G2310/024G09G2310/027G09G2310/0275G09G2310/0297G09G2320/0233G09G2320/0252G09G2320/0261G09G2320/106G09G2340/0435G09G2340/16G09G2352/00
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,276,891
App. No.
18/397,437
Granted
Apr 15, 2025
Kind
B2
Abstract

To provide a semiconductor device, a liquid crystal display device, and an electronic device which have a wide viewing angle and in which the number of manufacturing steps, the number of masks, and manufacturing cost are reduced compared with a conventional one. The liquid crystal display device includes a first electrode formed over an entire surface of one side of a substrate; a first insulating film formed over the first electrode; a thin film transistor formed over the first insulating film; a second insulating film formed over the thin film transistor; a second electrode formed over the second insulating film and having a plurality of openings; and a liquid crystal over the second electrode. The liquid crystal is controlled by an electric field between the first electrode and the second electrode.

Claims (72)

1. A semiconductor device having a pixel portion comprising a plurality of pixels, the pixel portion comprising:

a common electrode over a first substrate;

a first conductive layer over the first substrate, the first conductive layer directly connected to the common electrode;

a transistor over the first substrate, the transistor having a semiconductor layer comprising polycrystalline silicon;

a gate wiring, a part of the gate wiring being configured to be a gate electrode of the transistor;

a source wiring, a part of the source wiring being configured to be one of a source electrode and a drain electrode of the transistor;

a second conductive layer over and in contact with the semiconductor layer;

an insulating film over the common electrode, the first conductive layer, and the second conductive layer;

a pixel electrode over the insulating film, the pixel electrode directly connected to the second conductive layer; and

a liquid crystal layer over the common electrode and the pixel electrode,

wherein the first conductive layer, the source wiring, and the second conductive layer comprise a same material,

wherein the pixel electrode has a plurality of slits,

wherein the gate electrode is provided over the semiconductor layer,

wherein the gate electrode and a first region of the common electrode overlap with each other,

wherein the one of the source electrode and the drain electrode is provided over and in contact with the semiconductor layer, and

wherein the one of the source electrode and the drain electrode and a second region of the common electrode and overlap with each other.

2. The semiconductor device according to claim 1 , wherein the gate wiring comprises molybdenum.

3. The semiconductor device according to claim 1 , wherein the insulating film comprises silicon nitride.

4. The semiconductor device according to claim 1 , wherein each of the first conductive layer, the source wiring, and the second conductive layer has a stacked-layer structure comprising a layer containing aluminum interposed between layers containing one of molybdenum and titanium.

5. The semiconductor device according to claim 1 , further comprising:

a color filter over the liquid crystal layer; and

a second substrate over the color filter.

6. The semiconductor device according to claim 1 , wherein the common electrode is provided across the plurality of pixels of the pixel portion.

7. A semiconductor device having a pixel portion comprising a plurality of pixels, the pixel portion comprising:

a common electrode over a first substrate;

a first conductive layer over the first substrate, the first conductive layer directly connected to the common electrode;

a transistor over the first substrate, the transistor having a semiconductor layer comprising polycrystalline silicon;

a gate wiring, a part of the gate wiring being configured to be a gate electrode of the transistor;

a source wiring, a part of the source wiring being configured to be one of a source electrode and a drain electrode of the transistor;

a second conductive layer over and in contact with the semiconductor layer;

an insulating film over the common electrode, the first conductive layer, and the second conductive layer;

a pixel electrode over the insulating film, the pixel electrode directly connected to the second conductive layer; and

a liquid crystal layer over the common electrode and the pixel electrode,

wherein the first conductive layer, the source wiring, and the second conductive layer comprise a same material,

wherein the pixel electrode has a plurality of slits,

wherein the gate electrode is provided over the semiconductor layer,

wherein the gate electrode and a first region of the common electrode overlap with each other,

wherein the one of the source electrode and the drain electrode is provided over and in contact with the semiconductor layer,

wherein the one of the source electrode and the drain electrode and a second region of the common electrode and overlap with each other, and

wherein the pixel electrode and a third region of the common electrode overlap with each other.

8. The semiconductor device according to claim 7 , wherein the gate wiring comprises molybdenum.

9. The semiconductor device according to claim 7 , wherein the insulating film comprises silicon nitride.

10. The semiconductor device according to claim 7 , wherein each of the first conductive layer, the source wiring, and the second conductive layer has a stacked-layer structure comprising a layer containing aluminum interposed between layers containing one of molybdenum and titanium.

11. The semiconductor device according to claim 7 , further comprising:

a color filter over the liquid crystal layer; and

a second substrate over the color filter.

12. The semiconductor device according to claim 7 , wherein the common electrode is provided across the plurality of pixels of the pixel portion.

13. A semiconductor device having a pixel portion comprising a plurality of pixels, the pixel portion comprising:

a common electrode over a first substrate;

a first conductive layer over the first substrate, the first conductive layer directly connected to the common electrode;

a transistor over the first substrate, the transistor having a semiconductor layer comprising polycrystalline silicon;

a gate wiring, a part of the gate wiring being configured to be a gate electrode of the transistor;

a source wiring, a part of the source wiring being configured to be one of a source electrode and a drain electrode of the transistor;

a second conductive layer over and in contact with the semiconductor layer;

an insulating film over the common electrode, the first conductive layer, and the second conductive layer;

a pixel electrode over the insulating film, the pixel electrode directly connected to the second conductive layer; and

a liquid crystal layer over the common electrode and the pixel electrode,

wherein the first conductive layer, the source wiring, and the second conductive layer comprise a same material,

wherein the pixel electrode has a plurality of slits,

wherein the gate electrode is provided over the semiconductor layer,

wherein the gate electrode and a first region of the common electrode overlap with each other,

wherein the one of the source electrode and the drain electrode is provided over and in contact with the semiconductor layer,

wherein the one of the source electrode and the drain electrode and a second region of the common electrode and overlap with each other, and

wherein each of the common electrode and the pixel electrode comprises a light-transmitting conductive layer.

14. The semiconductor device according to claim 13 , wherein each of the common electrode and the pixel electrode comprises indium tin oxide.

15. The semiconductor device according to claim 13 , wherein the gate wiring comprises molybdenum.

16. The semiconductor device according to claim 13 , wherein the insulating film comprises silicon nitride.

17. The semiconductor device according to claim 13 , wherein each of the first conductive layer, the source wiring, and the second conductive layer has a stacked-layer structure comprising a layer containing aluminum interposed between layers containing one of molybdenum and titanium.

18. The semiconductor device according to claim 13 , further comprising:

a color filter over the liquid crystal layer; and

a second substrate over the color filter.

19. The semiconductor device according to claim 13 , wherein the common electrode is provided across the plurality of pixels of the pixel portion.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 27, 2023
From: KIMURA, HAJIME
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 065963/0888 →
Priority Claims (1)
JP 2006-297009 · Oct 31, 2006 · national
Continuity (11)
Continuation 18113795 · Feb 24, 2023
Continuation 17848727 · Jun 24, 2022
Continuation 17325402 · May 20, 2021
Continuation 16912911 · Jun 26, 2020
Continuation 15823026 · Nov 27, 2017
Continuation 14628459 · Feb 23, 2015
Continuation 14322999 · Jul 3, 2014
Continuation 13409288 · Mar 1, 2012
Continuation 12977217 · Dec 23, 2010
Continuation 11923128 · Oct 24, 2007
Related Publication 20240201548A1 · Jun 20, 2024
References Cited (232)
US 5610740A · Kamamori et al. · 1997 [cited by applicant]
US 5870160A · Yanagawa et al. · 1999 [cited by applicant]
US 6034757A · Yanagawa et al. · 2000 [cited by applicant]
US 6108066A · Yanagawa et al. · 2000 [cited by applicant]
US 6281953B1 · Lee et al. · 2001 [cited by applicant]
US 6362032B1 · Kim et al. · 2002 [cited by applicant]
US 6433842B1 · Kaneko et al. · 2002 [cited by applicant]
US 6462723B1 · Yamazaki et al. · 2002 [cited by applicant]
US 6562645B2 · Sung et al. · 2003 [cited by applicant]
US 6590627B2 · Tomioka et al. · 2003 [cited by applicant]
US 6603453B2 · Yamazaki et al. · 2003 [cited by applicant]
US 6710835B2 · Kurahashi et al. · 2004 [cited by applicant]
US 6759281B1 · Kim et al. · 2004 [cited by applicant]
US 6784457B2 · Yamazaki et al. · 2004 [cited by applicant]
US 6784966B2 · Maeda et al. · 2004 [cited by applicant]
US 6914656B2 · Sakamoto et al. · 2005 [cited by applicant]
US 6958799B2 · Tomioka et al. · 2005 [cited by applicant]
US 6960787B2 · Yamazaki et al. · 2005 [cited by applicant]
US 6961111B1 · Kuramasu · 2005 [cited by applicant]
US 6970222B2 · Nakayoshi et al. · 2005 [cited by applicant]
US 7088409B2 · Itou et al. · 2006 [cited by applicant]
US 7098480B2 · Kim et al. · 2006 [cited by applicant]
US 7196760B2 · Maeda et al. · 2007 [cited by applicant]
US 7202929B2 · Ootsu et al. · 2007 [cited by applicant]
US 7247882B2 · Yamazaki et al. · 2007 [cited by applicant]
US 7248324B2 · Ono et al. · 2007 [cited by applicant]
US 7251005B2 · Ono et al. · 2007 [cited by applicant]
US 7251006B2 · Ono et al. · 2007 [cited by applicant]
US 7251008B2 · Maeda et al. · 2007 [cited by applicant]
US 7253863B2 · Ono et al. · 2007 [cited by applicant]
US 7256854B2 · Ono et al. · 2007 [cited by applicant]
US 7271869B2 · Ono et al. · 2007 [cited by applicant]
US 7307673B2 · Nakayoshi et al. · 2007 [cited by applicant]
US 7352425B2 · Ono et al. · 2008 [cited by applicant]
US 7393726B2 · Kim et al. · 2008 [cited by applicant]
US 7411646B2 · Maeda et al. · 2008 [cited by applicant]
US 7417249B2 · Akimoto et al. · 2008 [cited by applicant]
US 7423701B2 · Nakayoshi et al. · 2008 [cited by applicant]
US 7423713B2 · Kurasawa · 2008 [cited by applicant]
US 7456924B2 · Ono et al. · 2008 [cited by applicant]
US 7486345B2 · Ono et al. · 2009 [cited by applicant]
US 7564529B2 · Ahn · 2009 [cited by applicant]
US 7605876B2 · Nakayoshi et al. · 2009 [cited by applicant]
US 7609352B2 · Maeda et al. · 2009 [cited by applicant]
US 7612855B2 · Ono et al. · 2009 [cited by applicant]
US 7683996B2 · Ono et al. · 2010 [cited by applicant]
US 7692748B2 · Ono et al. · 2010 [cited by applicant]
US 7697100B2 · Ono et al. · 2010 [cited by applicant]
US 7705949B2 · Ono et al. · 2010 [cited by applicant]
US 7710526B2 · Kim et al. · 2010 [cited by applicant]
US 7733455B2 · Ono et al. · 2010 [cited by applicant]
US 7759176B2 · Kim et al. · 2010 [cited by applicant]
US 7782436B2 · Ahn · 2010 [cited by applicant]
US 7791072B2 · Kumomi et al. · 2010 [cited by applicant]
US 7816682B2 · Kimura · 2010 [cited by applicant]
US 7821609B2 · Ootsu et al. · 2010 [cited by applicant]
US 7847904B2 · Kimura · 2010 [cited by applicant]
US 7851797B2 · Yamazaki et al. · 2010 [cited by applicant]
US 7864282B2 · Shimura et al. · 2011 [cited by applicant]
US 7872696B2 · Nakayoshi et al. · 2011 [cited by applicant]
US 7872722B2 · Kimura · 2011 [cited by applicant]
US 7928938B2 · Osame et al. · 2011 [cited by applicant]
US 7936429B2 · Ono et al. · 2011 [cited by applicant]
US 7943939B2 · Kim et al. · 2011 [cited by applicant]
US 8035786B2 · Ono et al. · 2011 [cited by applicant]
US 8045116B2 · Ono et al. · 2011 [cited by applicant]
US 8072569B2 · Kaneko et al. · 2011 [cited by applicant]
US 8077282B2 · Shimura et al. · 2011 [cited by applicant]
US 8130354B2 · Kimura · 2012 [cited by applicant]
US 8203661B2 · Nakayoshi et al. · 2012 [cited by applicant]
US 8218118B2 · Ono et al. · 2012 [cited by applicant]
US 8218119B2 · Ono et al. · 2012 [cited by applicant]
US 8237166B2 · Kumomi et al. · 2012 [cited by applicant]
US 8248548B2 · Nakayoshi et al. · 2012 [cited by applicant]
US 8248549B2 · Nakayoshi et al. · 2012 [cited by applicant]
US 8310641B2 · Nakayoshi et al. · 2012 [cited by applicant]
US 8338865B2 · Kimura · 2012 [cited by applicant]
US 8345205B2 · Ono et al. · 2013 [cited by applicant]
US 8493522B2 · Nakayoshi et al. · 2013 [cited by applicant]
US 8493537B2 · Ono et al. · 2013 [cited by applicant]
US 8537318B2 · Kimura · 2013 [cited by applicant]
US 8564752B2 · Ono et al. · 2013 [cited by applicant]
US 8610862B2 · Kimura · 2013 [cited by applicant]
US 8648989B2 · Ono et al. · 2014 [cited by applicant]
US 8760609B2 · Nakayoshi et al. · 2014 [cited by applicant]
US 8780307B2 · Kimura · 2014 [cited by applicant]
US 8835925B2 · Kim et al. · 2014 [cited by applicant]
US 8841671B2 · Kimura · 2014 [cited by applicant]
US 8872182B2 · Kimura · 2014 [cited by applicant]
US 8964156B2 · Kimura · 2015 [cited by applicant]
US 9086600B2 · Nakayoshi et al. · 2015 [cited by applicant]
US 9213204B2 · Nakayoshi et al. · 2015 [cited by applicant]
US 9291863B2 · Onogi et al. · 2016 [cited by applicant]
US 9488880B2 · Nakayoshi et al. · 2016 [cited by applicant]
US 9829761B2 · Kimura · 2017 [cited by applicant]
US 9946125B2 · Onogi et al. · 2018 [cited by applicant]
US 20020140891A1 · Tomioka et al. · 2002 [cited by applicant]
US 20030001832A1 · Yamazaki et al. · 2003 [cited by applicant]
US 20030218664A1 · Sakamoto et al. · 2003 [cited by applicant]
US 20040036826A1 · Maeda et al. · 2004 [cited by applicant]
US 20040263747A1 · Chae · 2004 [cited by applicant]
US 20050030451A1 · Liu · 2005 [cited by applicant]
US 20050105032A1 · Ono · 2005 [cited by examiner]
US 20050105033A1 · Itou et al. · 2005 [cited by applicant]
US 20050162601A1 · Matsuoka et al. · 2005 [cited by applicant]
US 20050259207A1 · Yang et al. · 2005 [cited by applicant]
US 20050264731A1 · Itou et al. · 2005 [cited by applicant]
US 20060092356A1 · Morimoto et al. · 2006 [cited by applicant]
US 20060092363A1 · Hasegawa et al. · 2006 [cited by applicant]
US 20060138426A1 · Yoo et al. · 2006 [cited by applicant]
US 20060146255A1 · Ahn · 2006 [cited by applicant]
US 20060187371A1 · Nakayoshi et al. · 2006 [cited by applicant]
US 20060192912A1 · Itou et al. · 2006 [cited by applicant]
US 20060215086A1 · Kurasawa · 2006 [cited by applicant]
US 20060215087A1 · Matsushima et al. · 2006 [cited by applicant]
US 20060267891A1 · Nishimura et al. · 2006 [cited by applicant]
US 20070057261A1 · Jeong et al. · 2007 [cited by applicant]
US 20070126968A1 · Uochi · 2007 [cited by applicant]
US 20070126969A1 · Kimura et al. · 2007 [cited by applicant]
US 20070146591A1 · Kimura et al. · 2007 [cited by applicant]
US 20070194379A1 · Hosono et al. · 2007 [cited by applicant]
US 20070236640A1 · Kimura · 2007 [cited by applicant]
US 20070284627A1 · Kimura · 2007 [cited by applicant]
US 20070285595A1 · Hirao · 2007 [cited by applicant]
US 20080002079A1 · Kimura · 2008 [cited by applicant]
US 20080024416A1 · Onogi et al. · 2008 [cited by applicant]
US 20090096974A1 · Ono et al. · 2009 [cited by applicant]
US 20090201455A1 · Murai · 2009 [cited by applicant]
US 20090278122A1 · Hosono et al. · 2009 [cited by applicant]
US 20090280600A1 · Hosono et al. · 2009 [cited by applicant]
US 20110032435A1 · Kimura · 2011 [cited by applicant]
US 20110101352A1 · Hosono et al. · 2011 [cited by applicant]
US 20110187762A1 · Osame et al. · 2011 [cited by applicant]
US 20110201162A1 · Hosono et al. · 2011 [cited by applicant]
US 20120012838A1 · Hosono et al. · 2012 [cited by applicant]
US 20120113372A1 · Kato et al. · 2012 [cited by applicant]
US 20130128174A1 · Kimura · 2013 [cited by applicant]
US 20130201419A1 · Ono et al. · 2013 [cited by applicant]
US 20130286313A1 · Nakayoshi et al. · 2013 [cited by applicant]
US 20140043556A1 · Ono et al. · 2014 [cited by applicant]
US 20140098334A1 · Kimura · 2014 [cited by applicant]
US 20160231628A1 · Onogi et al. · 2016 [cited by applicant]
US 20170010509A1 · Nakayoshi et al. · 2017 [cited by applicant]
US 20170146873A1 · Onogi et al. · 2017 [cited by applicant]
CN 001373390A · 2002 [cited by applicant]
CN 001412608A · 2003 [cited by applicant]
CN 001841140A · 2006 [cited by applicant]
EP 0509827A · 1992 [cited by applicant]
EP 1737044A · 2006 [cited by applicant]
EP 1843194A · 2007 [cited by applicant]
EP 2226847A · 2010 [cited by applicant]
EP 2246894A · 2010 [cited by applicant]
EP 2413366A · 2012 [cited by applicant]
JP 63092923A · 1988 [cited by applicant]
JP 01274115A · 1989 [cited by applicant]
JP 04317027A · 1992 [cited by applicant]
JP 08078329A · 1996 [cited by applicant]
JP 09179134A · 1997 [cited by applicant]
JP 10003092A · 1998 [cited by applicant]
JP 2000284326A · 2000 [cited by applicant]
JP 2000347220A · 2000 [cited by applicant]
JP 2001005038A · 2001 [cited by applicant]
JP 2001051292A · 2001 [cited by applicant]
JP 2001154218A · 2001 [cited by applicant]
JP 2001174818A · 2001 [cited by applicant]
JP 2001175198A · 2001 [cited by applicant]
JP 2001235765A · 2001 [cited by applicant]
JP 2001330844A · 2001 [cited by applicant]
JP 2002090781A · 2002 [cited by applicant]
JP 2002221736A · 2002 [cited by applicant]
JP 2002258262A · 2002 [cited by applicant]
JP 2002323704A · 2002 [cited by applicant]
JP 2003068757A · 2003 [cited by applicant]
JP 2003107445A · 2003 [cited by applicant]
JP 2003195352A · 2003 [cited by applicant]
JP 2004271971A · 2004 [cited by applicant]
JP 2004361700A · 2004 [cited by applicant]
JP 2005055863A · 2005 [cited by applicant]
JP 2005148602A · 2005 [cited by applicant]
JP 3742836 · 2006 [cited by applicant]
JP 2006086514A · 2006 [cited by applicant]
JP 2006106110A · 2006 [cited by applicant]
JP 2006126855A · 2006 [cited by applicant]
JP 2006165528A · 2006 [cited by applicant]
JP 2006184325A · 2006 [cited by applicant]
JP 2006216112A · 2006 [cited by applicant]
JP 2006276111A · 2006 [cited by applicant]
JP 2006276112A · 2006 [cited by applicant]
JP 2006286719A · 2006 [cited by applicant]
JP 2006286772A · 2006 [cited by applicant]
JP 2006286773A · 2006 [cited by applicant]
JP 2007183628A · 2007 [cited by applicant]
JP 2007286115A · 2007 [cited by applicant]
JP 2007334317A · 2007 [cited by applicant]
JP 2008009425A · 2008 [cited by applicant]
JP 2008032899A · 2008 [cited by applicant]
JP 2008116502A · 2008 [cited by applicant]
JP 2010014846A · 2010 [cited by applicant]
JP 2014002392A · 2014 [cited by applicant]
KR 20010060835A · 2001 [cited by applicant]
KR 20020002052A · 2002 [cited by applicant]
KR 20020041426A · 2002 [cited by applicant]
KR 20020070756A · 2002 [cited by applicant]
KR 20030031443A · 2003 [cited by applicant]
KR 20040012200A · 2004 [cited by applicant]
KR 20050058105A · 2005 [cited by applicant]
KR 20050067735A · 2005 [cited by applicant]
KR 20060001165A · 2006 [cited by applicant]
KR 20060079040A · 2006 [cited by applicant]
KR 20060105222A · 2006 [cited by applicant]
KR 20060110202A · 2006 [cited by applicant]
TW 589480 · 2004 [cited by applicant]
TW 200809357 · 2008 [cited by applicant]
WO WO2001018597 · 2001 [cited by applicant]
WO WO2001033292 · 2001 [cited by applicant]
WO WO2005088726 · 2005 [cited by applicant]
Chinese Office Action (Application No. 200710184974.X) dated Aug. 5, 2010. [cited by applicant]
Lee.S et al., “29.2: 18.1 Ultra-FFS TFT-LCD With Super Image Quality and Fast Response Time”, SID Digest '01 : SID International Symposium Digest of Technical Papers, 2001, vol. 32, pp. 484-487. [cited by applicant]
Song.J et al., “Electro-optic Characteristics of Fringe-Field Driven Transflective LCD with Dual Cell Gap”, IDW/AD '05(Proceedings of The 12th International Display Workshops in conjunction with Asia Display ), Dec. 6, … [cited by applicant]
Choi.M et al., “P-110: A Single Gap Transflective Display Using a Fringe-Field Driven Homogeneously Aligned Nematic Liquid Crystal Display”, SID Digest '05 : SID International Symposium Digest of Technical Papers, 2005,… [cited by applicant]
Lu.R et al., “Transflective Liquid Crystal Display Using In-plane Switching Effect”, Conference Record of The 2006 IDRC (International Display Research Conference), Sep. 1, 2006, pp. 39-42. [cited by applicant]
Lee.G et al., “Design of Wide-Viewing-Angle Transflective IPS LCD”, Conference Record of The 2006 IDRC (International Display Research Conference), Sep. 1, 2006, pp. 75-77. [cited by applicant]
Aoki.N, “Advanced IPS Technology for Mobile Applications”, SID Digest '06 : SID International Symposium Digest of Technical Papers, 2006, vol. 37, pp. 1087-1090. [cited by applicant]
Sakamoto.M et al., “Development of the Novel Transflective LCD Module Using Super-Fine-TFT Technology”, SID Digest '06 : SID International Symposium Digest of Technical Papers, 2006, vol. 37, pp. 1669-1672. [cited by applicant]
Lee.G et al., “Optical Configurations of Horizontal-Switching Transflective LCDs in Double Cellgap Structure”, IDW/AD '05(Proceedings of The 12th International Display Workshops in conjunction with Asia Display ), 2005,… [cited by applicant]
Itou.O et al., “A Wide Viewing Angle Transflective IPS LCD Applying New Optical Design”, SID Digest '06 : SID International Symposium Digest of Technical Papers, 2006, vol. 37, pp. 832-835. [cited by applicant]
You.J et al., “23.4: Characteristics and Reliabilities of the Ion Beam Irradiated Polyimide as an LC Alignment Layer”, SID Digest '05 : SID International Symposium Digest of Technical Papers, 2005, vol. 36, pp. 1089-109… [cited by applicant]
Taiwanese Office Action (U.S. Appl. No. 96/139,500) dated Oct. 21, 2013. [cited by applicant]
Korean Office Action (Application No. 2007-0109956) dated Dec. 29, 2013. [cited by applicant]
Korean Office Action (Application No. 2014-0023558) dated Apr. 30, 2014. [cited by applicant]
Korean Office Action (Application No. 2014-0023558) dated Nov. 28, 2014. [cited by applicant]
Korean Office Action (Application No. 2017-0035225) dated May 8, 2018. [cited by applicant]