IP Library Granted Patent US 12,306,579
Granted Patent B2
US 12,306,579 · App. 17/524,353 · Granted May 20, 2025

Toner

Inventors: Kazuyuki Sato (Kanagawa, JP); Tomohisa Sano (Shizuoka, JP); Daisuke Yoshiba (Shizuoka, JP); Tohru Hiramatsu (Shizuoka, JP)
Assignee: CANON KABUSHIKI KAISHA
G03G9/0825G03G9/0819G03G9/0839G03G9/08711G03G9/08755G03G9/09733
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Quick Facts
Patent No.
US 12,306,579
App. No.
17/524,353
Granted
May 20, 2025
Kind
B2
Abstract

The toner is a toner including a toner particle comprising a binder resin, a crystalline material, wherein, when a ratio of an area occupied by the crystalline material in a toner surface observed with a scanning electron microscope after ruthenium-staining the toner under a specific condition (1) is represented by S 1 (%), a ratio of an area occupied by the crystalline material in the toner surface observed with the scanning electron microscope after ruthenium-staining the toner under a condition (2) is represented by S 2 (%), and a dispersion diameter of a plurality of domains formed of the crystalline material on the toner surface observed with the scanning electron microscope after the ruthenium-staining the toner under the condition (2) is represented by R 2 (nm), the following expressions (1), (2), and (3) are satisfied. 0 . 0 ≤ S 1 ≤ 0.5 ( 1 ) 1. ≤ S 2 ≤ 10. ( 2 ) 20 ≤ R 2 ≤ 200 ( 3 )

Claims (39)

1. A toner, comprising:

a toner particle comprising a binder resin, a crystalline material and a colorant;

the crystalline material being a wax or a crystalline polyester resin; and

the colorant being a hydrophobized magnetic material that is hydrophobic-treated with a silane coupling agent, wherein

0

.

0

S

1

0.5

1.

S

2

10.

,

and

20

R

2

200

when S 1 (%) is a ratio of an area occupied by the crystalline material per area of a toner particle surface observed with a scanning electron microscope (SEM) after ruthenium-staining the toner in a ruthenium tetroxide (RuO 4 ) gas atmosphere at 100 Pa for 5 minutes, and

S 2 (%) is a ratio of an area occupied by the crystalline material per area of the toner particle surface and R 2 (nm) is a dispersion diameter of a plurality of domains formed of the crystalline material on the toner particle surface, observed with the scanning electron microscope (SEM) after ruthenium-staining the toner in the ruthenium tetroxide (RuO 4 ) gas atmosphere at 500 Pa for 15 minutes.

2. The toner according to claim 1 , wherein R i <R 2 when R i (nm) is a dispersion diameter of a plurality of internal domains formed in a cross-section of the toner particle cut with a microtome and observed with a transmission electron microscope (TEM) after ruthenium-staining the toner in the ruthenium tetroxide (RuO 4 ) gas atmosphere at 500 Pa for 15 minutes.

3. The toner according to claim 1 , wherein the wax is an ester wax.

4. The toner according to claim 1 , wherein a peak intensity ratio [Si—O—Si]/[Si—C] of ATR-IR of a component extracted from the hydrophobized magnetic material with toluene is 1.4 to 2.5.

5. The toner according to claim 1 , wherein the hydrophobized magnetic material has a surface vicinity existence index of 4.0 to 8.0 pieces/1 μm 2 obtained by observing the toner particle with the scanning electron microscope (SEM).

6. The toner according to claim 1 , wherein the hydrophobized magnetic material has a hydrophobizing degree of 55 to 80.

7. The toner according to claim 1 , wherein a value (mass change ratio/specific surface area) is 0.002 to 0.020%·g/m 2 , obtained by dividing a mass change ratio of the hydrophobized magnetic material when the hydrophobized magnetic material is left to stand under an environment of a temperature of 30° C. and a relative humidity of 0% for 24 hours and then left to stand under an environment of a temperature of 30° C. and a relative humidity of 80% for 1 hour, by a specific surface area of the hydrophobized magnetic material.

8. The toner according to claim 1 , wherein, in the hydrophobized magnetic material, a spectrum of Si obtained based on a total electron yield (TEY) method using a near-edge X-ray absorption fine structure (NEXAFS) has

a peak A in a range of 1,844.4 to 1,844.8 eV,

a peak B in a range of 1,846.1 to 1,846.6 eV, and

I A /(I A +I B )/M Si is 40 to 55

when I A is an area of the peak A, I B is an area of the peak B, and M Si is the number of moles of Si derived from a silane compound contained in 1 g of the hydrophobized magnetic material.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 7, 2021
From: SATO, KAZUYUKI; SANO, TOMOHISA; YOSHIBA, DAISUKE; HIRAMATSU, TOHRU
To: CANON KABUSHIKI KAISHA
Reel/Frame 058326/0606 →
Priority Claims (1)
JP 2020-199150 · Nov 30, 2020 · national
Continuity (1)
Related Publication 20220171302A1 · Jun 2, 2022
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