IP Library › Granted Patent US 12,327,685
Granted Patent B2
US 12,327,685 · App. 18/227,563 · Granted Jun 10, 2025

Multilayer electronic component

Inventors: Hyoung Uk Kim (Suwon-si, KR); Yun Kim (Suwon-si, KR); Hyung Soon Kwon (Suwon-si, KR); Kwang Hee Nam (Suwon-si, KR); Seok Hyun Yoon (Suwon-si, KR)
Assignee: SAMSUNG ELECTRO-MECHANICS CO., LTD.
H01G4/1227C04B35/4682H01G4/30C04B2235/3206C04B2235/3217C04B2235/3225C04B2235/3236C04B2235/3262C04B2235/3293C04B2235/3418
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Quick Facts
Patent No.
US 12,327,685
App. No.
18/227,563
Granted
Jun 10, 2025
Kind
B2
Abstract

A multilayer electronic component includes: a body including a dielectric layer including a plurality of dielectric grains and internal electrodes alternately disposed with the dielectric layer; and an external electrode disposed on the body and connected to the internal electrodes At least one of the plurality of dielectric grains includes Ba, Ti, Sn, and a rare earth element and has a core-dual shell structure, which includes a core, a first shell disposed on at least a portion of the core, and a second shell disposed on at least a portion of the first shell. When an average molar ratio of Sn to Ti included in the first and second shells is S1 and S2, respectively, and an average molar ratio of the rare earth element to Ti included in the first and second shells is R1 and R2, respectively, S1>S2 and R2>R1 are satisfied.

Claims (33)

1. A multilayer electronic component, comprising:

a body including a dielectric layer including a plurality of dielectric grains and internal electrodes alternately disposed with the dielectric layer; and

an external electrode disposed on the body and connected to the internal electrodes,

wherein at least one of the plurality of dielectric grains includes Ba, Ti, Sn, and a rare earth element and has a core-dual shell structure,

the core-dual shell structure includes a core, a first shell disposed on at least a portion of the core, and a second shell disposed on at least a portion of the first shell, and

when an average molar ratio of Sn to Ti included in the first and second shells is S1 and S2, respectively, and an average molar ratio of the rare earth element to Ti included in the first and second shells is R1 and R2, respectively, S1>S2 and R2>R1 are satisfied.

2. The multilayer electronic component of claim 1 , wherein the S1 and S2 satisfy 3<S1/S2≤10.

3. The multilayer electronic component of claim 1 , wherein the R1 and R2 satisfy 4<R2/R1≤12.

4. The multilayer electronic component of claim 2 , wherein the R1 and R2 satisfy 4<R2/R1≤12.

5. The multilayer electronic component of claim 1 , wherein the S2 and R2 satisfy R2>S2.

6. The multilayer electronic component of claim 1 , wherein a molar ratio of Sn to Ti included in the first shell gradually decreases toward at least one of a boundary with the core or a boundary with the second shell from an inside of the first shell.

7. The multilayer electronic component of claim 1 , wherein the rare earth element is at least one of Dy, Tb, Y, Gd, or Ho.

8. The multilayer electronic component of claim 1 , wherein the second shell further comprises at least one of Si, Al, Mn, V or Mg.

9. The multilayer electronic component of claim 1 , wherein, in a cross-section of the core-dual shell structure, when a center of the core-dual shell structure is defined as α, and when a point, farthest from the α among surfaces of the second shell, is defined as β,

a length corresponding to the core among straight lines connecting the α and β ranges from 70 nm to 100 nm.

10. The multilayer electronic component of claim 1 , wherein, in a cross-section of the core-dual shell structure, when a center of the core-dual shell structure is defined as α, when a point, farthest from the α among surfaces of the second shell, is defined as β, and

when a length corresponding to the first shell is LS 1 and a length corresponding to the second shell is LS 2 , among the straight lines connecting the α and β,

LS 2 >LS 1 is satisfied.

11. The multilayer electronic component of claim 10 , wherein the LS 1 is greater than 0 nm and less than 20 nm.

12. The multilayer electronic component of claim 10 , wherein the LS 2 is 25 nm or more and 50 nm or less.

13. The multilayer electronic component of claim 1 , wherein an average molar ratio of Sn to Ti included in the core is Sc and an average molar ratio of the rare earth element to Ti included in the core is Rc, S1>Sc and R2>Rc is satisfied.

14. The multilayer electronic component of claim 1 , wherein an average thickness of the dielectric layer ranges from 0.6 μm to 2.0 μm.

15. A multilayer electronic component, comprising:

a body including a dielectric layer including a plurality of dielectric grains and internal electrodes alternately disposed with the dielectric layer; and

an external electrode disposed on the body and connected to the internal electrodes,

wherein at least one of the plurality of dielectric grains includes Ba, Ti, Sn, and a rare earth element and has a core-dual shell structure,

wherein the core-dual shell structure includes a core, a first shell disposed on at least a portion of the core, and a second shell disposed on at least a portion of the first shell,

wherein when an average molar ratio of Sn to Ti included in the core, the first shell, and the second shell is Sc, S1, and S2, respectively, and an average molar ratio of the rare earth element to Ti included in the core, the first shell, and the second shell is Rc, R1 and R2, respectively,

S1>S2, S1>Sc, R2>S2, R2>Sc and R2>Rc are satisfied.

16. The multilayer electronic component of claim 15 , wherein the S1 and S2 satisfy 3<S1/S2≤10.

17. The multilayer electronic component of claim 15 , wherein the R1 and R2 satisfy 4<R2/R1≤12.

18. The multilayer electronic component of claim 16 , wherein the R1 and R2 satisfy 4<R2/R1≤12.

19. The multilayer electronic component of claim 15 , wherein a molar ratio of Sn to Ti included in the first shell gradually decreases toward at least one of a boundary with the core or a boundary with a second shell from an inside of the first shell.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 28, 2023
From: KIM, HYOUNG UK; KIM, YUN; KWON, HYUNG SOON; NAM, KWANG HEE; YOON, SEOK HYUN
To: SAMSUNG ELECTRO-MECHANICS CO., LTD.
Reel/Frame 064420/0754 →
Priority Claims (1)
KR 10-2023-0045979 · Apr 7, 2023 · national
Continuity (1)
Related Publication 20240339264A1 · Oct 10, 2024
References Cited (27)
US 11569037B2 · Kang · 2023 [cited by examiner]
US 11581146B2 · Kang · 2023 [cited by examiner]
US 20060216512A1 · Fujikawa · 2006 [cited by examiner]
US 20180130601A1 · Kim et al. · 2018 [cited by applicant]
US 20190066920A1 · Kim · 2019 [cited by examiner]
US 20200058444A1 · Cha · 2020 [cited by examiner]
US 20210210288A1 · Kang · 2021 [cited by examiner]
US 20210249192A1 · Kang · 2021 [cited by examiner]
US 20220139632A1 · Kim et al. · 2022 [cited by applicant]
US 20220189694A1 · Kim et al. · 2022 [cited by applicant]
US 20220199326A1 · Kim · 2022 [cited by examiner]
US 20220301770A1 · Lee et al. · 2022 [cited by applicant]
US 20220375688A1 · Yoon · 2022 [cited by examiner]
US 20220399165A1 · Kim et al. · 2022 [cited by applicant]
US 20230129225A1 · Kang · 2023 [cited by examiner]
US 20240339264A1 · Kim · 2024 [cited by examiner]
EP 1128404A2 · 2001 [cited by applicant]
EP 4443452A2 · 2024 [cited by examiner]
JP 2001240466A · 2001 [cited by examiner]
KR 1020180051760A · 2018 [cited by applicant]
KR 1020210088910A · 2021 [cited by applicant]
KR 20210100952A · 2021 [cited by examiner]
KR 1020220086452A · 2022 [cited by applicant]
KR 1020220088099A · 2022 [cited by applicant]
KR 1020220131609A · 2022 [cited by applicant]
KR 1020220167599A · 2022 [cited by applicant]
Extended European search report dated Sep. 18, 2024 issued in corresponding European Application No. 23188916.3. [cited by applicant]