IP Library › Granted Patent US 12,727,176
Granted Patent B2
US 12,727,176 · App. 18/463,900 · Granted Sep 1, 2026

Three-dimensional memory devices and manufacturing methods thereof and three-dimensional memories

Inventor: SiPing Hu (Wuhan, CN)
Assignee: Yangtze Memory Technologies Co., Ltd.
H10B80/00H10W90/00H10W80/211H10W80/312H10W80/327H10W90/792
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,727,176
App. No.
18/463,900
Granted
Sep 1, 2026
Kind
B2
Abstract

The present disclosure provides a three-dimensional memory device and a manufacturing method thereof, and a three-dimensional memory. The three-dimensional memory device includes a first memory cell and at least one second memory cell sequentially stacked on the first memory cell. Each memory cell includes a first set of contacts, and a memory array device and a CMOS device that are stacked and electrically connected with each other, and the first set of contacts is disposed on a side of the memory array device facing away from the CMOS device and electrically connected with the CMOS device. The second memory cell further comprises a second set of contacts that is disposed on a side of the CMOS device facing away from the memory array device and electrically connected with the CMOS device. The memory array device of the first memory cell is bonded with the CMOS device of the adjacent second memory cell, and the first set of contacts of the first memory cell is correspondingly electrically connected with the second set of contacts of the adjacent second memory cell.

Claims (24)

1 . A three-dimensional memory device, comprising at least two memory cells that are stacked sequentially, wherein the at least two memory cells include a first memory cell and at least one second memory cell stacked on the first memory cell, and a memory cell of the at least two memory cells comprises:

a memory array device;

a CMOS device stacked with and connected to the memory array device; and

a first set of contacts disposed on a side of the memory array device facing away from the CMOS device and connected with the CMOS device,

wherein the second memory cell further comprises a second set of contacts that is disposed on a side of the CMOS device of the second memory cell facing away from the memory array device of the second memory cell and is connected with the CMOS device of the second memory cell,

wherein the memory array device of the first memory cell is bonded with the CMOS device of an adjacent second memory cell, and the first set of contacts of the first memory cell is correspondingly connected with the second set of contacts of the adjacent second memory cell,

wherein, when there is one second memory cell, the second memory cell is an outer second memory cell stacked on the first memory cell, and the first set of contacts of the outer second memory cell is used to connect to an external device, and

wherein, when there are multiple second memory cells, the multiple second memory cells are sequentially stacked on the first memory cell, and, for two adjacent ones of the second memory cells, the first set of contacts of a second memory cell close to the first memory cell is correspondingly connected with the second set of contacts of a second memory cell far away from the first memory cell, a second memory cell farthest away from the first memory cell along a stacking direction is defined as the outer second memory cell, and the first set of contacts of the outer second memory cell is used to connect to the external device.

2 . The three-dimensional memory device of claim 1 , further comprising an isolation layer and an array pad embedded in the isolation layer, wherein the isolation layer covers a side of the outer second memory cell facing away from the first memory cell and the first set of contacts of the outer second memory cell, and the array pad is correspondingly connected with the first set of contacts of the outer second memory cell and is used to connect to the external device.

3 . The three-dimensional memory device of claim 2 , further comprising a protective layer, wherein the protective layer covers a side of the isolation layer facing away from the outer second memory cell, and wherein the protective layer is provided with an opening in a position corresponding to the array pad, and the array pad is exposed through the opening to connect to the external device.

4 . The three-dimensional memory device of claim 1 , wherein the memory array device comprises an array substrate, and the first set of contacts of the memory cell of the at least two memory cells is disposed on a side of the array substrate of the memory array device facing away from the CMOS device, and

wherein the CMOS device comprises a CMOS substrate, and the second set of contacts of the second memory cell is disposed on a side of the CMOS substrate of the second memory cell facing away from the memory array device of the second memory cell.

5 . The three-dimensional memory device of claim 4 , wherein the memory cell of the at least two memory cells further comprises an interconnection channel that is disposed in the memory array device and the CMOS device of the memory cell where the interconnection channel is located, and

the interconnection channel is connected with the first set of contacts and the CMOS device of the memory cell where the interconnection channel is located, respectively, wherein the first set of contacts is connected to the CMOS device through the interconnection channel.

6 . The three-dimensional memory device of claim 5 , wherein the second memory cell further comprises conductive channels which penetrate through the CMOS substrate of the second memory cell and are connected with the second set of contacts and the CMOS device of the second memory cell respectively, wherein the second set of contacts is connected with the CMOS device of the second memory cell where the conductive channels are located through the conductive channels.

7 . The three-dimensional memory device of claim 1 , wherein the memory array device of the first memory cell and the memory array device of the second memory cell each include a preset number of layers of memory layers, and a value of the preset number of layers is an integer greater than 0 and less than 500.

8 . A three-dimensional memory, comprising:

a three-dimensional memory device comprising at least two memory cells that are stacked sequentially, wherein the at least two memory cells include a first memory cell and at least one second memory cell stacked on the first memory cell, and a memory cell of the at least two memory cells comprises:

a memory array device and a CMOS device that are stacked and electrically connected with each other; and

a first set of contacts disposed on a side of the memory array device facing away from the CMOS device and connected with the CMOS device,

wherein the second memory cell further comprises a second set of contacts that is disposed on a side of the CMOS device of the second memory cell facing away from the memory array device of the second memory cell and is connected with the CMOS device of the second memory cell,

wherein the memory array device of the first memory cell is bonded with the CMOS device of an adjacent second memory cell, and the first set of contacts of the first memory cell is correspondingly connected with the second set of contacts of the adjacent second memory cell,

wherein, when there is one second memory cell, the second memory cell is an outer second memory cell stacked on the first memory cell, and the first set of contacts of the outer second memory cell is used to connect to an external device, and

wherein, when there are multiple second memory cells, the multiple second memory cells are sequentially stacked on the first memory cell, and, for two adjacent ones of the second memory cells, the first set of contacts of a second memory cell close to the first memory cell is correspondingly connected with the second set of contacts of a second memory cell far away from the first memory cell, a second memory cell farthest away from the first memory cell along a stacking direction is defined as the outer second memory cell, and the first set of contacts of the outer second memory cell is used to connect to the external device.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 11, 2023
From: HU, SIPING
To: YANGTZE MEMORY TECHNOLOGIES CO., LTD
Reel/Frame 064855/0726 →
Priority Claims (1)
CN 202110330026.2 · Mar 27, 2021 · national
Continuity (2)
Continuation PCTCN2022082306 · Mar 22, 2022
Related Publication 20230422528A1 · Dec 28, 2023
References Cited (56)
US 10600781B1 · Xiao · 2020 [cited by applicant]
US 10636813B1 · Xiao · 2020 [cited by applicant]
US 11322483B1 · Ogawa · 2022 [cited by examiner]
US 11631690B2 · Okina · 2023 [cited by examiner]
US 11784794B2 · McElheny · 2023 [cited by examiner]
US 12381183B2 · Koyanagi · 2025 [cited by examiner]
US 20160005744A1 · Someya · 2016 [cited by applicant]
US 20180261575A1 · Tagami · 2018 [cited by applicant]
US 20190043836A1 · Fastow et al. · 2019 [cited by applicant]
US 20190189632A1 · Lee · 2019 [cited by applicant]
US 20190363129A1 · Yokoyama et al. · 2019 [cited by applicant]
US 20200098776A1 · Sugisaki · 2020 [cited by applicant]
US 20200105721A1 · Park · 2020 [cited by applicant]
US 20200227397A1 · Yada · 2020 [cited by applicant]
US 20200295043A1 · Nishida et al. · 2020 [cited by applicant]
US 20200328186A1 · Liu · 2020 [cited by applicant]
US 20200395328A1 · Fastow · 2020 [cited by examiner]
US 20210083005A1 · Bateman · 2021 [cited by examiner]
US 20220028846A1 · Alsmeier · 2022 [cited by examiner]
US 20220199641A1 · Fukuzumi · 2022 [cited by examiner]
US 20220293198A1 · Sakakibara · 2022 [cited by examiner]
US 20230422528A1 · Hu · 2023 [cited by applicant]
CN 108573959A · 2018 [cited by applicant]
CN 109075170A · 2018 [cited by applicant]
CN 109148459A · 2019 [cited by applicant]
CN 109300903A · 2019 [cited by applicant]
CN 109417075A · 2019 [cited by applicant]
CN 110010612A · 2019 [cited by applicant]
CN 110620117A · 2019 [cited by applicant]
CN 110914991A · 2020 [cited by applicant]
CN 111211126A · 2020 [cited by applicant]
CN 112510031A · 2021 [cited by applicant]
CN 112802855A · 2021 [cited by applicant]
JP 2014165191A · 2014 [cited by applicant]
JP 2020047814A · 2020 [cited by applicant]
JP 2022521618A · 2022 [cited by applicant]
KR 20190142715A · 2019 [cited by applicant]
KR 20200037895A · 2020 [cited by applicant]
KR 20210000753A · 2021 [cited by applicant]
WO 2018135194A1 · 2018 [cited by applicant]
WO 2020124877A1 · 2020 [cited by applicant]
Korean Intellectual Property Office, “Request for the Submission of an Opinion,” issued in connection with Korean Patent Application No. 2023-7023075, dated Jul. 19, 2024, 25 pages. [English Translation Included]. [cited by applicant]
Japan Patent Office, “Search Report by Registered Search Organization,” issued in connection with Japanese Patent Application No. 2023-546108, dated Jul. 31, 2024, 50 pages. [English Translation Included]. [cited by applicant]
Japan Patent Office, “Notice of Reasons for Refusal,” issued in connection with Japanese Patent Application No. 2023-546108, dated Aug. 5, 2024, 15 pages. [English Translation Included]. [cited by applicant]
European Patent Office, “Communication pursuant to Article 94(3) EPC,” issued in connection with European Patent Application No. 22 778 678.7-1211, mailed on Jun. 11, 2025, 5 pages. [cited by applicant]
European Patent Office, “Extended European Search Report,” issued in connection with European Patent Application No. 22778678.7, dated Sep. 10, 2024, 12 pages. [cited by applicant]
Korean Intellectual Property Office, “Written Opinion,” issued in connection with Korean Patent Application No. 20237023075, dated Sep. 19, 2024, 20 pages. [English Translation Included]. [cited by applicant]
International Searching Authority, “International Search Report,” issued in connection with International Patent Application No. PCT/CN2022/082306, mailed on May 25, 2022, 9 pages. [English Translation Included]. [cited by applicant]
International Searching Authority, “Written Opinion of the International Searching Authority,” issued in connection with International Patent Application No. PCT/CN2022/082306, mailed on May 25, 2022, 9 pages. [English … [cited by applicant]
China National Intellectual Property Administration, “First Search,” issued in connection with Chinese Patent Application No. 202110330026.2, dated Jul. 5, 2022, 1 page. [cited by applicant]
China National Intellectual Property Administration, “First Office Action,” issued in connection with Chinese Patent Application No. 202110330026.2, dated Jul. 5, 2022, 15 pages. [English Translation Included]. [cited by applicant]
China National Intellectual Property Administration, “Notification to Grant Patent Right for Invention,” issued in connection with Chinese Patent Application No. 202110330026.2, dated Feb. 27, 2023, 3 pages. [English Tr… [cited by applicant]
International Searching Authority, “International Preliminary Report on Patentability,”with International Patent Application No. PCT/CN2022/082306, issued on Oct. 3, 2023, 11 pages. [English Translation Included]. [cited by applicant]
Korean Intellectual Property Office, “Written Decision on Registration,” issued in connection with Korean Patent Application No. 10-2023-7023075, mailed on Dec. 6, 2024, 5 pages. [English language machine translation in… [cited by applicant]
Japanese Patent Office, “Decision of Refusal,” issued in connection with Japanese Patent Application No. 2023-546108, mailed on Jan. 28, 2025, 14 pages. [English language machine translation included.]. [cited by applicant]
Japanese Patent Office, “Notice of Reasons for Refusal,” issued in connection with Japanese Patent Application No. 2025-075598, dated May 26, 2026, 10 pages. [English machine translation included.]. [cited by applicant]