IP Library › Granted Patent US 7,412,299
Granted Patent Utility PCT National Stage
US 7,412,299 · Confirmation No. 2062

PROCESS FOR DETERMINING THE TEMPERATURE OF A SEMICONDUCTOR WAFER IN A RAPID HEATING UNIT

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2008-04-29 1449 List of References cited by applicant and considered by examiner 1 View
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2008-04-03 BIB Bibliographic Data Sheet 1 View
2008-04-03 SRNT Examiner's search strategy and results 2 View
2008-04-03 SRNT Examiner's search strategy and results 1 View
2008-02-19 A... Amendment/Request for Reconsideration-After Non-Final Rejection 3 View
2008-02-19 REM Applicant Arguments/Remarks Made in an Amendment 1 View
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2008-02-19 N417 Electronic Filing System Acknowledgment Receipt 2 View
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2007-11-16 CTNF Non-Final Rejection 13 View
2007-11-16 1449 List of References cited by applicant and considered by examiner 1 View
2007-11-16 892 List of references cited by examiner 1 View
2007-11-16 FWCLM Index of Claims 3 View
2007-11-16 SRFW Search information including classification, databases and other search related notes 1 View
2007-11-09 SRNT Examiner's search strategy and results 1 View
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2007-08-16 N570 Communication - Re: Power of Attorney (PTOL-308) 2 View
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2006-02-08 M903 Notice of Designated Office (DO) / Elected Office (EO) Acceptance Mailed 2 View
2005-08-15 LET. Miscellaneous Incoming Letter 1 View
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2005-07-18 A.PE Preliminary Amendment 1 View
2005-07-18 SPEC Specification 2 View
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2005-07-18 FOR Foreign Reference 28 View
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2005-06-23 SPEC Specification 52 View
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Quick Facts
Patent No.
US 7,412,299
App. No.
10/540,613
Filed
2005-08-15
Effective Filing
2005-06-23
Granted
2008-08-12
Pub. No.
US20060100735A1
Art Unit
2121
PTA
-3 days