IP Library Granted Patent US 9,701,871
Granted Patent B2
US 9,701,871 · App. 14/509,081 · Granted Jul 11, 2017

Composition and method for polishing bulk silicon

Inventors: Brian Reiss (Woodridge, IL); John Clark (Pflugerville, TX); Lamon Jones (Aurora, IL); Jeffrey Gilliland (Aurora, CO); Michael White (Ridgefield, CT)
Assignee: Cabot Microelectronics Corporation
C09G1/02C09K3/1463H01L21/02024
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Quick Facts
Patent No.
US 9,701,871
App. No.
14/509,081
Granted
Jul 11, 2017
Kind
B2
Abstract

The invention provides a polishing composition comprising (a) silica, (b) one or more compounds that increases the removal rate of silicon, (c) one or more tetraalkylammonium salts, and (d) water, wherein the polishing composition has a pH of about 7 to about 11. The invention further provides a method of polishing a substrate with the polishing composition.

Claims (20)

1. A chemical mechanical polishing composition consisting essentially of:

(a) about 0.5 wt. % to about 20 wt. % of wet process silica,

(b) about 0.02 wt. % to about 5 wt. % of one or more nitrogen containing heterocyclic compounds, wherein at least one nitrogen containing heterocyclic compound is a triazole,

(c) about 0.05 wt. % to about 2 wt. % of one or more aminophosphonic acids,

(d) about 0.1 wt. % to about 5 wt. % of one or more tetraalkylammonium salts,

(e) potassium bicarbonate, and

(f) water,

wherein the polishing composition has a pH of about 7 to about 11.

2. The polishing composition of claim 1 , wherein the polishing composition contains about 10 wt. % to about 15 wt. % of silica.

3. The polishing composition of claim 1 , wherein the polishing composition contains about 0.1 wt. % to about 2 wt. % of the nitrogen containing heterocyclic compound.

4. The polishing composition of claim 1 , wherein the nitrogen containing heterocyclic compound is an aminotriazole.

5. The polishing composition of claim 4 , wherein the aminotriazole is selected from the group consisting of 3 amino 1,2,4 triazole, 3 amino 1,2,4 triazole 5 carboxylic acid, 3 amino 5 mercapto 1,2,4 triazole, and 4 amino 5 hydrazino 1,2,4 triazole 3 thiol.

6. The polishing composition of claim 1 , wherein at least one nitrogen containing heterocyclic compound is a thiazole.

7. The polishing composition of claim 6 , wherein the thiazole is selected from the group consisting of 2 amino 5 methylthiazole, 2 amino thiazoleacetic acid, and thiazole.

8. The polishing composition of claim 1 , wherein at least one nitrogen containing heterocyclic compound is a heterocyclic N oxide.

9. The polishing composition of claim 8 , wherein the nitrogen containing heterocyclic compound is selected from the group consisting of 2 hydroxypyridine N oxide, 4 methylmorpholine N oxide, and picolinic acid N oxide.

10. The polishing composition of claim 1 , wherein the polishing composition contains about 0.1 wt. % to about 1 wt. % of at least one aminophosphonic acid.

11. The polishing composition of claim 10 , wherein the aminophosphonic acid is selected from the group consisting of ethylenediaminetetra(methylene phosphonic acid), amino tri(methylene phosphonic acid), diethylenetriaminepenta(methylene phosphonic acid), and combinations thereof.

12. The polishing composition of claim 11 , wherein the aminophosphonic acid is amino tri(methylene phosphonic acid).

13. The polishing composition of claim 1 , wherein the polishing composition has a pH of about 8 to about 10.

Assignments (8)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 30, 2017
From: REISS, BRIAN; CLARK, JOHN; JONES, LAMON; GILLILAND, JEFFREY; WHITE, MICHAEL
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 042621/0958 →
Continuity (2)
Division 12462638 · Sep 16, 2009
Related Publication 20150028254A1 · Jan 29, 2015