IP Library Granted Patent US 9,818,618
Granted Patent B2
US 9,818,618 · App. 14/700,580 · Granted Nov 14, 2017

Multi-layer polishing pad for CMP

Inventors: Brian Mrzyglod (Elburn, IL); Jayakrishnan Nair (Naperville, IL); Garrett Blake (Naperville, IL)
Assignee: Cabot Microelectronics Corporation
H01L21/30625B24B37/042B24B37/22B24B37/24B24D11/00B24D11/001B24D18/0045
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Quick Facts
Patent No.
US 9,818,618
App. No.
14/700,580
Granted
Nov 14, 2017
Kind
B2
Abstract

The invention is directed to a multi-layer polishing pad for chemical-mechanical polishing comprising a top layer, a middle layer and a bottom layer, wherein the top layer and bottom layer are joined together by the middle layer, and without the use of an adhesive. The invention is also directed to a multi-layer polishing pad comprising an optically transmissive region, wherein the layers of the multi-layer polishing pad are joined together without the use of an adhesive.

Claims (23)

1. A multi-layer polishing pad for chemical-mechanical polishing comprising a top layer, a middle layer and a bottom layer, wherein the top layer and the bottom layer are bonded together by the middle layer, and wherein the layers are bonded without the use of an adhesive, wherein the middle layer comprises a thermoplastic polyurethane, wherein the thermoplastic polyurethane of the middle layer has a lower Vicat softening temperature than the top layer or the bottom layer, and wherein the middle layer has a Vicat softening temperature between about 260° F. and about 300° F.

2. The polishing pad of claim 1 , wherein the top layer comprises a polishing surface.

3. The polishing pad of claim 1 , wherein the bottom layer comprises a polycarbonate material.

4. The polishing pad of claim 1 , wherein the top layer comprises a polymer resin selected from the group consisting of a thermoplastic polyurethane, polycarbonates, nylons, polyolefins, polyvinylalcohols, polyacrylates, polytetrafluoroethylene, polyethyleneterephthalate, polyimides, polyaramides, polyarylenes, polyacrylates, polystyrenes, polymethylmethacrylates, copolymers thereof, and mixtures thereof.

5. The polishing pad of claim 4 , wherein the polymer resin is a thermoplastic polyurethane.

6. The polishing pad of claim 1 , wherein the thickness of the middle layer is from about 3 mil to about 5 mil.

7. The polishing pad of claim 1 , wherein the top layer and the bottom layer are porous.

8. A chemical-mechanical polishing apparatus comprising:

a platen that rotates,

the polishing pad of claim 1 affixed to the rotating platen, and

a carrier that holds a workpiece to be polished by contacting the rotating polishing pad.

9. The chemical-mechanical polishing apparatus of claim 8 , further comprising an in situ endpoint detection system.

10. A method of polishing a workpiece comprising

(i) providing the polishing pad of claim 1 ,

(ii) contacting a workpiece with the polishing pad, and

(iii) moving the polishing pad relative to the workpiece to abrade the workpiece and thereby polish the workpiece.

11. A method of producing a multi-layer polishing pad comprising the steps of (i) joining together multiple layers of polymer sheets comprising a top layer, a middle layer and a bottom layer, wherein the middle layer comprises a polymer resin having lower Vicat softening temperature as compared to the top layer and the bottom layer, (ii) subjecting the multi-layer polymer sheet to a temperature that is above the Vicat softening temperature of the middle layer but below the Vicat softening temperature of the top layer and the bottom layer, and (iii) forming a bond between the middle layer and the top layer, and a bond between the middle layer and the bottom layer, wherein the polymer resin comprises a thermoplastic polyurethane.

12. The method of claim 11 , wherein the multi-layer polymer sheet is subjected to a temperature between about 260° F. and about 300° F.

13. The method of claim 12 , wherein subjecting the multi-layer polymer sheet to a temperature between about 260° F. and about 300° F. is done by lamination.

14. The method of claim 11 , wherein the bottom layer comprises a polycarbonate.

15. The method of claim 11 , wherein the middle layer comprises a thermoplastic polyurethane.

16. The method of claim 11 , wherein the top layer comprises a polymer resin selected from the group consisting of a thermoplastic polyurethane, polycarbonates, nylons, polyolefins, polyvinylalcohols, polyacrylates, polytetrafluoroethylene, polyethyleneterephthalate, polyimides, polyaramides, polyarylenes, polyacrylates, polystyrenes, polymethylmethacrylates, copolymers thereof, and mixtures thereof.

17. The method of claim 11 , wherein the top layer and the bottom layer are porous.

Assignments (9)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 19, 2017
From: MRZYGLOD, BRIAN; NAIR, JAYAKRISHNAN; BLAKE, GARRETT
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 043629/0741 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 19, 2017
From: MRZYGLOD, BRIAN; NAIR, JAYAKRISHNAN; BLAKE, GARRETT
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 043629/0986 →
Continuity (3)
Provisional Application 61989669 · May 7, 2014
Provisional Application 62022770 · Jul 10, 2014
Related Publication 20150325451A1 · Nov 12, 2015