IP Library Granted Patent US 9,528,030
Granted Patent B1
US 9,528,030 · App. 14/918,756 · Granted Dec 27, 2016

Cobalt inhibitor combination for improved dishing

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Quick Facts
Patent No.
US 9,528,030
App. No.
14/918,756
Filed
Oct 21, 2015
Granted
Dec 27, 2016
Kind
B1
Art Unit
1716
USPC
438/693
Abstract

The invention provides a chemical-mechanical polishing composition that contains (a) abrasive particles, (b) an azole compound having an octanol-water log P of about 1 to about 2, (c) a cobalt corrosion inhibitor, wherein the cobalt corrosion inhibitor comprises an anionic head group and a C 8 -C 14 aliphatic tail group, (d) a cobalt accelerator, (e) an oxidizing agent that oxidizes cobalt, and (f) water, wherein the polishing composition has a pH of about 3 to about 8.5. The invention further provides a method of chemically-mechanically polishing a substrate with the inventive chemical-mechanical polishing composition. Typically, the substrate contains cobalt.

Claims (37)

1. A chemical-mechanical polishing composition comprising:

(a) abrasive particles,

(b) an azole compound having an octanol-water log P of about 1 to about 2,

(c) a cobalt corrosion inhibitor, wherein the cobalt corrosion inhibitor comprises an anionic head group and a C 8 -C 14 aliphatic tail group,

(d) a cobalt accelerator,

(e) an oxidizing agent that oxidizes cobalt, and

(f) water,

wherein the polishing composition has a pH of about 3 to about 8.5.

2. The polishing composition of claim 1 , wherein the polishing composition comprises about 0.1 wt. % to about 4 wt. % of abrasive particles.

3. The polishing composition of claim 1 , wherein the azole compound is benzotriazole or 5-phenyltetrazole.

4. The polishing composition of claim 1 , wherein the cobalt corrosion inhibitor has the formula: RCON(CH 3 )COOH wherein R is a C 8 -C 13 aliphatic group.

5. The polishing composition of claim 1 , wherein the cobalt accelerator is selected from a compound having the formula: NR 1 R 2 R 3 wherein R 1 , R 2 , and R 3 are independently selected from hydrogen, carboxyalkyl, substituted carboxyalkyl, hydroxyalkyl, substituted hydroxyalkyl and aminocarbonylalkyl, and wherein none or only one of R 1 , R 2 , and R 3 is hydrogen; dicarboxyheterocycles; heterocyclylalkyl-α-amino acids; N-(amidoalkyl)amino acids; unsubstituted heterocycles; alkyl-substituted heterocycles; substituted-alkyl-substituted heterocycles; N-aminoalkyl-α-amino acids; and combinations thereof.

6. The polishing composition of claim 5 , wherein the cobalt accelerator is selected from iminodiacetic acid, picolinic acid, dipicolinic acid, bicine, [(2-amino-2-oxoethyl)amino]acetic acid, lysine, imidazole, histidine, 2-[bis(2-hydroxyethyl)amino]-2-(hydroxymethyl)-1,3-propanediol, and combinations thereof.

7. The polishing composition of claim 1 , wherein the polishing composition comprises about 10 ppm to about 1000 ppm of the azole compound and about 10 ppm to about 1000 ppm of the cobalt corrosion inhibitor.

8. The polishing composition of claim 1 , wherein the oxidizing agent is hydrogen peroxide.

9. The polishing composition of claim 1 , wherein the polishing composition has a pH of about 7 to about 8.5.

10. A method of chemically mechanically polishing a substrate comprising:

(i) contacting a substrate with a polishing pad and a chemical-mechanical polishing composition comprising:

(a) abrasive particles,

(b) an azole compound having an octanol-water log P of about 1 to about 2,

(c) a cobalt corrosion inhibitor, wherein the cobalt corrosion inhibitor comprises an anionic head group and a C 8 -C 14 aliphatic tail group,

(d) a cobalt accelerator,

(e) an oxidizing agent that oxidizes cobalt, and

(f) water,

wherein the polishing composition has a pH of about 3 to about 8.5,

(ii) moving the polishing pad and the chemical mechanical polishing composition relative to the substrate, and

(iii) abrading at least a portion of the substrate to polish the substrate.

11. The method of claim 10 , wherein the polishing composition comprises about 0.1 wt. % to about 4 wt. % of abrasive particles.

12. The method of claim 10 , wherein the azole compound is benzotriazole or 5-phenyltetrazole.

13. The method of claim 10 , wherein the cobalt corrosion inhibitor has the formula: RCON(CH 3 )COOH wherein R is a C 8 -C 13 aliphatic group.

14. The method of claim 10 , wherein the cobalt accelerator is selected from a compound having the formula: NR 1 R 2 R 3 wherein R 1 , R 2 , and R 3 are independently selected from hydrogen, carboxyalkyl, substituted carboxyalkyl, hydroxyalkyl, substituted hydroxyalkyl and aminocarbonylalkyl, and wherein none or only one of R 1 , R 2 , and R 3 is hydrogen; dicarboxyheterocycles; heterocyclylalkyl-α-amino acids; N-(amidoalkyl)amino acids; unsubstituted heterocycles; alkyl-substituted heterocycles; substituted-alkyl-substituted heterocycles; N-aminoalkyl-α-amino acids; and combinations thereof.

15. The method of claim 14 , wherein the cobalt accelerator is selected from iminodiacetic acid, picolinic acid, dipicolinic acid, bicine, [(2-amino-2-oxoethyl)amino]acetic acid, lysine, imidazole, histidine, 2-[bis(2-hydroxyethyl)amino]-2-(hydroxymethyl)-1,3-propanediol, and combinations thereof.

16. The method of claim 10 , wherein the polishing composition comprises about 10 ppm to about 1000 ppm of the azole compound and about 10 ppm to about 1000 ppm of the cobalt corrosion inhibitor.

17. The method of claim 10 , wherein the oxidizing agent is hydrogen peroxide.

18. The method of claim 10 , wherein the polishing composition has a pH of about 7 to about 8.5.

19. The method of claim 10 , wherein the substrate comprises cobalt, and least a portion of the cobalt is abraded to polish the substrate.

20. The method of claim 19 , wherein the substrate comprises a semiconductor device.

Assignments (8)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 21, 2015
From: KRAFT, STEVEN; CARTER, PHILLIP W.; SEABOLD, JASON A.
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 036843/0310 →