Method of polishing group III-V materials
Disclosed is a method of chemically-mechanically polishing a substrate. The method comprises, consists of, or consists essentially of (a) contacting a substrate containing at least one Group III-V material, with a polishing pad and a chemical-mechanical polishing composition comprising water, abrasive particles having a negative surface charge, and an oxidizing agent for oxidizing the Group III-V material in an amount of from about 0.01 wt. % to about 5 wt. %, wherein the polishing composition has a pH of from about 2 to about 5; (b) moving the polishing pad and the chemical-mechanical polishing composition relative to the substrate; and (c) abrading at least a portion of the substrate to polish the substrate. In some embodiments, the Group III-V material is a semiconductor that includes at least one element from Group III of the Periodic Table and at least one element from Group V of the Periodic Table.
1. A method of chemically-mechanically polishing a substrate, the method comprising:
(a) contacting a substrate containing at least one Group III-V material, and additionally containing silicon oxide, silicon nitride, or polysilicon, or combinations thereof; with a polishing pad and a chemical-mechanical polishing composition consisting essentially of water, colloidal silica abrasive particles having a zeta potential of from about −10 mV to about −60 mV, wherein the colloidal silica abrasive particles have an average particle size of from about 20 nm to about 200 nm, and an oxidizing agent for oxidizing the Group III-V material in an amount of from about 0.01 wt. % to about 5 wt. %, wherein the polishing composition has a pH of from about 2 to about 5;
(b) moving the polishing pad and the chemical-mechanical polishing composition relative to the substrate; and
(c) abrading at least a portion of the at least one Group III-V material, as well as the silicon oxide, silicon nitride, or polysilicon, to polish the substrate.
2. The method of claim 1 , wherein the Group III-V material contains Si, In, P, Ga, As, Ge, N, or any combination thereof.
3. The method of claim 2 , wherein the Group III-V material contains GaAs, AlAs, GaN, AlN, InN, GaInP, SiGe, InGaAs, InP, or any combination thereof.
4. The method of claim 3 , wherein the Group III-V material contains GaAs, InGaAs, InP, or any combination thereof.
5. The method of claim 1 , wherein the abrasive particles have a zeta potential of from about −20 mV to about −30 mV.
6. The method of claim 1 , wherein the abrasive particles are present in an amount of about 0.01 wt. % to about 5 wt. % of the polishing composition.
7. The method of claim 1 , wherein the oxidizing agent is hydrogen peroxide, an amine oxide, a quinone, peroxy carboxylic acid, hypervalent oxyhalide, persulfate, redox-active metal ion or coordination complex thereof, or any combination thereof.
8. The method of claim 7 , wherein the oxidizing agent is an amine oxide comprising pyridine-N-oxide, trimethylamine-N-oxide, 2-hydroxypyridine N-oxide, 8-hydroxyquinoline N-oxide, picolinic acid N-oxide, pyrazine N-oxide, or any combination thereof.
9. The method of claim 7 , wherein the oxidizing agent is a quinone comprising 2,6-dimethoxy-1,4-benzoquinone, 2,6-dimethylbenzoquinone, naphthaquinone, anthraquinone, sulfonated naphthaquinone such as, 1,2-naphthaquinone-4-sulfonic acid, sulfonated anthraquinone such as, anthraquinone-2-sulfonic acid, 1,5-diaminoanthraquinone, catechol, or any combination thereof.
10. The method of claim 7 , wherein the oxidizing agent is hydrogen peroxide.
11. The method of claim 1 , wherein the oxidizing agent is present in an amount of about 0.01 wt. % to about 1 wt. % of the polishing composition.
12. The method of claim 1 , wherein the pH of the composition is from about 2.3 to about 5.