Patent Assignment
Reel/Frame 020627/0141
Assignment of Assignor's Interest
Recorded: 2008-03-11
Pages: 3
Assignor
INFINEON TECHNOLOGIES AG
Executed: 2008-01-25
Assignee
QIMONDA AG
GUSTAV-HEINEMANN-RING 212, MUNICH, 81739, GERMANY
Covered Properties
(6)
Crack Stop Formation for High-Productivity Processes
Patent:
5,776,826 →
Application:
08/642,983 →
Energy Relieving Crack Stop
Patent:
5,834,829 →
Application:
08/706,586 →
Geometrical Control of Device Corner Threshold
Patent:
5,858,866 →
Application:
08/753,234 →
Geometrical Control of Device Corner Threshold
Patent:
5,998,852 →
Application:
09/078,517 →
Geometrical Control of Device Corner Threshold
Patent:
6,022,796 →
Application:
09/120,190 →
Multi-Layer Gate Stack Structure Comprising a Metal Layer for a Fet Device, and Method for Fabricating the Same
Related Assignments
(8)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Sep 5, 1996
From: DINKEL, BETTINA A.
To: SIEMENS COMPONENTS, INC.
Reel/Frame 008152/0801 →
Assignment of Assignor's Interest
Sep 3, 2004
From: SIEMENS AKTIENGESELLSCHAFT
To: INFINEON TECHNOLOGIES AG
Reel/Frame 015073/0570 →
Assignment of Assignor's Interest
Nov 18, 2004
From: SIEMENS AKTIENGESELLSCHAFT
To: INFINEON TECHNOLOGIES AG
Reel/Frame 015386/0643 →
Assignment of Assignor's Interest
Dec 8, 2004
From: LAY, CHAO-WEN; HUANG, CHENG-CHIH
To: NANYA TECHNOLOGY CORPORATION
Reel/Frame 015439/0106 →
Assignment of Assignor's Interest
Dec 8, 2004
From: GOLDBACH, MATTHIAS; JAKUBOWSKI, FRANK; KOEPE, RALF; SCHUPKE, KRISTIN
To: INFINEON TECHNOLOGIES AG
Reel/Frame 015439/0215 →
Assignment of Assignor's Interest
Oct 10, 2005
From: SIEMENS AKTIENGESELLSCHAFT
To: INFINEON TECHNOLOGIES AG
Reel/Frame 016621/0875 →
Assignment of Assignor's Interest
May 8, 2015
From: QIMONDA AG
To: INFINEON TECHNOLOGIES AG
Reel/Frame 035623/0001 →
Assignment of Assignor's Interest
Dec 7, 2015
From: INFINEON TECHNOLOGIES AG
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 037221/0885 →