IP Library Granted Patent US 7,173,401
Granted Patent B1
US 7,173,401 · App. 11/195,263 · Granted Feb 6, 2007

Differential amplifier and low drop-out regulator with thereof

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Quick Facts
Patent No.
US 7,173,401
App. No.
11/195,263
Granted
Feb 6, 2007
Kind
B1
Abstract

A differential amplifier having a positive input terminal, a negative input terminal, an output terminal, a bias terminal and a ground terminal is provided. The differential amplifier comprises a differential pair circuit and a current mirror circuit. Wherein, the differential pair circuit is coupled to the positive input terminal, the negative input terminal, the output terminal, and the bias terminal of the differential amplifier. The current mirror circuit receives a constant current from a current source, and mirrors the constant current to the differential pair circuit. The current mirror circuit further connects to the ground terminal of the differential amplifier, and the terminal of the current mirror circuit receiving the constant current is coupled to a first source/drain terminal of a first PMOS transistor. A second source/drain and a gate of the first PMOS transistor are connected to the bias terminal and the output terminal of the differential amplifier, respectively.

Claims (20)

1. A low drop-out (LDO) regulator, comprising:

a differential amplifier circuit having a positive input terminal, a negative input terminal, an output terminal, a bias terminal and a ground terminal, comprising:

a differential pair circuit electrically coupled to the negative input terminal and the output terminal, receiving an input voltage from the positive input terminal, and electrically coupled to a positive bias through the bias terminal;

a current source for providing a constant current;

a current mirror circuit for receiving the constant current and mirroring the constant current to the differential pair circuit, and the current mirror circuit being grounded through the ground terminal; and

a first PMOS transistor having a first source/drain terminal electrically coupled to the current mirror circuit for receiving the constant current, a second source/drain terminal electrically coupled to the positive bias through the bias terminal, and a gate electrically coupled to the output terminal;

a first passive element having a first terminal being grounded, and a second terminal electrically coupled to the negative input terminal; and

a second PMOS transistor having a first source/drain terminal electrically coupled to the negative input terminal and the second terminal of the first passive element, a gate electrically coupled to the output terminal, and a second source/drain terminal electrically coupled to the positive bias.

2. The low drop-out regulator of claim 1 , wherein the differential pair circuit comprises:

a first NMOS transistor having a first source/drain terminal electrically coupled to the current mirror circuit for receiving the constant current mirrored by the current mirror circuit, a gate electrically coupled to the positive input terminal, and a second source/drain terminal electrically coupled to the output terminal;

a second NMOS transistor having a gate electrically coupled to the negative input terminal, and a first source/drain terminal electrically coupled to the first source/drain terminal of the first NMOS transistor;

a third PMOS transistor having a first source/drain terminal electrically coupled to the second source/drain terminal of the first NMOS transistor, and a second source/drain terminal electrically coupled to the positive bias through the bias terminal; and

a fourth PMOS transistor having a first source/drain terminal electrically coupled to a gate thereof, a second source/drain terminal of the second NMOS transistor, and a gate of the third PMOS transistor respectively, and a second source/drain terminal electrically coupled to the positive bias through the bias terminal.

3. The low drop-out regulator of claim 1 , wherein the current mirror circuit comprises:

a third NMOS transistor having a first source/drain terminal being grounded through the ground terminal, and a second source/drain terminal electrically coupled to the differential pair circuit; and

a fourth NMOS transistor having a first source/drain terminal being grounded, a second source/drain terminal receiving the constant current, and a gate electrically coupled to the gate of the third NMOS transistor.

4. The low drop-out regulator of claim 1 , wherein a parasitic capacitor is connected between the output terminal of the differential amplifier circuit and the second PMOS transistor.

5. The low drop-out regulator of claim 1 , wherein the first passive element is a resistor.

6. The low drop-out regulator of claim 1 , further comprising a second passive element having a first terminal electrically coupled to the negative input terminal and the second terminal of the first passive element, and a second terminal electrically coupled to the first source/drain terminal of the second PMOS transistor.

7. The low drop-out regulator of claim 6 , wherein the second passive element is a resistor.

Assignments (19)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED
Reel/Frame 059666/0545 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: MICROCHIP TECHNOLOGY INCORPORATED
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041675/0617 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 18, 2015
From: MICROCHIP TECHNOLOGY (BARBADOS) II INCORPORATED
To: MICROCHIP TECHNOLOGY INCORPORATED
Reel/Frame 036631/0442 →
MERGER Recorded Sep 4, 2015
From: ISSC TECHNOLOGIES CORP.
To: MICROCHIP TECHNOLOGY (BARBADOS) II INCORPORATED
Reel/Frame 036554/0152 →
CHANGE OF NAME Recorded Oct 7, 2011
From: INTEGRATED SYSTEM SOLUTION CORP.
To: ISSC TECHNOLOGIES CORP.
Reel/Frame 027029/0240 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 30, 2006
From: WINBOND ELECTRONICS CORP.
To: INTEGRATED SYSTEM SOLUTION CORP.
Reel/Frame 017711/0367 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 1, 2005
From: HUANG, CHUN-SHENG
To: WINBOND ELECTRONICS CORP.
Reel/Frame 016861/0727 →