Probe card with balanced lateral force
View Patent ↗A novel method and structure for counter-balancing a lateral force exerted by a probe card onto a device under test (“DUT”) is disclosed. Many DUTs (particularly memory devices) are tested in parallel (i.e., many die at a time) and have unequal numbers of contact pads on top vs. bottom and/or right vs. left sides of the die. The probe card used to test the DUT would necessarily have an uneven distribution of probes that match the contact pads and, as a consequence, may exert a net lateral force on the DUT. By manipulating the individual characteristics of the individual probes, a probe card may be constructed that zeroes the lateral force. Characteristics such as the direction and stiffness of the individual probes can be varied to zero the net lateral force.
1. A probe card comprising:
At least two identical single die probe areas;
a plurality of individual probes within one of the single die probe areas;
wherein the structure and orientation for each of the individual probes within the plurality achieve substantially no net lateral force exerted by the plurality during touchdown; and
a plurality of individual probes within a second of the single die probe areas;
wherein the structure and orientation for each of the individual probes within the plurality achieve substantially no net lateral force exerted by the plurality during touchdown.
2. The probe card of claim 1 , further comprising at least five identical single die probe areas and wherein the net lateral force exerted by the at least four areas is substantially zero during touchdown.
3. A probe card comprising:
a plurality of identical single die probe areas, each of which is comprised of a top array of probes and a bottom array of probes, wherein the number of probes in the top array is not equal to the number of probes in the bottom array; and
the top array and bottom array further comprise individual probes whose structure and orientation achieve substantially no net lateral force exerted by the top and bottom arrays during touchdown.
4. The probe card of claim 3 , wherein the plurality of identical single die probe areas further comprises at least four single die probe areas and wherein the net lateral force exerted by the at least four areas is substantially zero during touchdown.
5. The probe card of claim 1 , wherein the structure of an individual probe of the plurality is stiffened to increase the amount of lateral force exerted by the individual probe during touchdown.
6. The method of claim 1 , wherein the structure of an individual probe of the plurality is softened to decrease the amount of lateral force exerted by the individual probe during touchdown.
7. The probe card of claim 3 , wherein the structure of an individual probe of the top array is stiffened to increase the amount of lateral force exerted by the individual probe during touchdown.
8. The probe card of claim 3 , wherein the structure of an individual probe of the bottom array is stiffened to increase the amount of lateral force exerted by the individual probe during touchdown.
9. The method of claim 3 , wherein the structure of an individual probe of the top array is softened to decrease the amount of lateral force exerted by the individual probe during touchdown.
10. The method of claim 3 , wherein the structure of an individual probe of the bottom array is softened to decrease the amount of lateral force exerted by the individual probe during touchdown.