CMP system utilizing halogen adduct
View Patent ↗The invention provides a chemical-mechanical polishing system for polishing a substrate comprising (a) a polishing component selected from an abrasive, a polishing pad, or both an abrasive and a polishing pad, (b) an aqueous carrier, and (c) the halogen adduct resulting from the reaction of (1) an oxidizing agent selected from the group consisting of iodine, bromine, and a combination thereof, and (2) a carbon acid having a pKa of about 3 to about 14, wherein the halogen adduct is present in a concentration of about 0.01 mM or more in the aqueous carrier. The invention also provides a method of polishing a substrate comprising (i) providing the aforementioned chemical-mechanical polishing system, (ii) contacting the substrate with the polishing system, and (iii) abrading at least a portion of the surface of the substrate with the polishing system to polish the substrate.
1. A chemical-mechanical polishing system for polishing a substrate comprising:
(a) a polishing component selected from an abrasive, a polishing pad, or both an abrasive and a polishing pad,
(b) an aqueous carrier, and
(c) a halogen adduct resulting from the reaction of (1) an oxidizing agent selected from the group consisting of iodine, bromine, and a combination thereof, and (2) a carbon acid having a pKa of about 3 to about 14, wherein the halogen adduct is present in a concentration of about 0.001 mM or more in the aqueous carrier, and wherein the carbon acid has the following structure:
wherein R 1 is selected from the group consisting of OH, R 4 , and OR 4 , wherein R 4 is a substituted or unsubstituted C 1 -C 4 alkyl; R 2 is selected from the group consisting of
wherein n is 0 or 1; and R 3 is selected from the group consisting of H, NO 2 , and a substituted or unsubstituted C 1 -C 6 alkyl.
2. The polishing system of claim 1 , wherein the oxidizing agent is iodine, and wherein the halogen adduct is present in a concentration of about 0.001 mM to about 30 mM in the aqueous carrier.
3. The polishing system of claim 2 , wherein the halogen adduct is present in a concentration of about 0.004 mM to about 8 mM in the aqueous carrier.
4. The polishing system of claim 1 , wherein the polishing system further comprises a second oxidizing agent, wherein the second oxidizing agent comprises a quinone moiety.
5. The polishing system of claim 1 , wherein the polishing system further comprises a second oxidizing agent selected from the group consisting of hydrogen peroxide, potassium peroxymonosulfate, persulfate salts, periodate salts, perchlorate salts, iodate salts, potassium permanganate, bromate salts, chlorate salts, and n-methylmorpholine-N-oxide.
6. The polishing system of claim 1 , wherein the carbon acid has a pKa of about 6 to about 13.
7. The polishing system of claim 1 , wherein R 2 is
8. A chemical-mechanical polishing system for polishing a substrate comprising:
(a) a polishing component selected from an abrasive, a polishing pad, or both an abrasive and a polishing pad,
(b) an aqueous carrier, and
(c) a halogen adduct resulting from the reaction of (1) an oxidizing agent selected from the group consisting of iodine, bromine, and a combination thereof, and (2) a carbon acid having a pKa of about 3 to about 14, wherein the halogen adduct is present in a concentration of about 0.001 mM or more in the aqueous carrier, wherein the carbon acid has the following structure:
wherein R 5 is selected from the group consisting of NO 2 , CN, HSO 3 , F, Cl, Br, I, CF 3 , CO 2 CF 3 , CO 2 CH 2 CF 3 , CO 2 CH(CF 3 ) 2 , SO 2 CF 3 , and SO 2 R 8 , wherein R 8 is a substituted or unsubstituted C 1 -C 4 alkyl; and R 6 and R 7 are independently selected from the group consisting of H, R 5 , and substituted or unsubstituted C 1 -C 4 alkyls; or R 6 and R 7 are joined together to form a 4-8 membered ring.
9. The polishing system of claim 1 , wherein the carbon acid is selected from the group consisting of acetyl acetone, ethylacetoacetate, dimethyl malonate, malonamide, malonic acid, methyl malonate monoamide, diethyl nitromalonate, phenyl malonic acid, 1,3-acetonedicarboxylic acid, aceto acetamide, dimethyl methylmalonate, and nitromethane.
10. The polishing system of claim 1 , wherein the polishing component comprises an abrasive suspended in the aqueous carrier, and wherein the abrasive is a metal oxide selected from the group consisting of alumina, silica, ceria, zirconia, titania, germania, and combinations thereof.
11. The polishing system of claim 10 , wherein the metal oxide abrasive is silica.
12. The polishing system of claim 1 , wherein the polishing component comprises an abrasive, and wherein the abrasive is fixed to the polishing pad.
13. The polishing system of claim 1 , wherein the polishing system further comprises an acid.
14. The polishing system of claim 13 , wherein the acid is selected from the group consisting of acetic acid, nitric acid, phosphoric acid, oxalic acid, and combinations thereof.
15. The polishing system of claim 13 , wherein the acid is present in an amount sufficient to adjust the pH of the aqueous carrier and any other components dissolved or suspended therein to a range of about 2 to about 6.
16. The polishing system of claim 15 , wherein the acid is present in an amount sufficient to adjust the pH of the aqueous carrier and any other components dissolved or suspended therein to a range of about 2 to about 3.