Planarizing probe card
View Patent ↗A novel planarizing probe card for testing a semiconductor device is presented. The probe card is adapted to come into contact with a probe card mount that is in adjustable contact with the prober. The probe card includes a printed circuit board affixed to a stiffener and a probe head that is in electrical contact with the printed circuit board. The probe head also includes a plurality of probe contactor tips that define a first plane. The stiffener further contains at least two planarizing adjusters that comes into contact with the probe card mount. The adjusters may be actuated to alter the position of first plane. A surface of the semiconductor device under test may define a second plane, and the adjusters may be adjusted to position the first plane to be substantially parallel to the second plane.
1. A probe testing apparatus comprising:
a prober;
a test head;
a probe card mount, wherein the probe card mount is attached to the test head, the test head and the probe card mount are in adjustable contact with a prober through a first set of planarizing adjusters;
a probe card for testing a semiconductor device, the probe card is in adjustable contact with a probe card mount, the probe card comprising:
a printed circuit board affixed to a stiffener, wherein the stiffener provides rigid support to the printed circuit board;
a probe head that is in electrical contact with the printed circuit board, the probe head further comprising a plurality of probe contactor tips, the plurality of probe contactor tips defining a first plane; and
the stiffener further comprising a second set of planarizing adjusters that come into contact with the probe card mount and wherein the first and second set of adjusters may be actuated to alter the position of first plane.
2. The probe testing apparatus of claim 1 , wherein a surface of the semiconductor device defines a second plane, and the first and second set of adjusters position the first plane to be substantially parallel to the second plane.
3. The probe testing apparatus of claim 1 , wherein the semiconductor device lies on a probe chuck, and a surface of the probe chuck defines a second plane, and the first and second set of adjusters position the first plane to be substantially parallel to the second plane.
4. The probe testing apparatus of claim 1 , wherein a surface of the semiconductor device defines a second plane, and the first and second set of adjusters position the first plane to less than 10 micrometers from parallel of the second plane.
5. The probe testing apparatus of claim 1 , wherein each adjusters may be adjusted +/−100 micrometers.
6. The probe testing apparatus of claim 1 , wherein the second set of adjusters comprises at least three adjusters spaced at about 120 degrees apart from each other.
7. The probe testing apparatus of claim 1 further comprising an interposer that is in electrical contact with the printed circuit board and the probe head.
8. The probe testing apparatus of claim 1 wherein the probe head further comprises a plurality of cantilever probe contactors.
9. The probe testing apparatus of claim 1 wherein the probe head further comprises a plurality of torsional probe contactors.
10. A probe testing apparatus comprising:
a prober;
a probe card mount, wherein the probe card mount is in adjustable contact with a prober through a first set of planarizing adjusters;
a probe card for testing a semiconductor device, the probe card is in adjustable contact with a probe card mount, the probe card comprising:
a stiffener comprising a first stiffener part and a second stiffener part;
a printed circuit board affixed to the first stiffener part and the second stiffener part, wherein the stiffener provides rigid support to the printed circuit board; and
a second set of planarizing adjusters that may be actuated to alter the position of the first stiffener part relative to the second stiffener part, thereby deflecting the printed circuit board;
a probe head that is in electrical contact with the printed circuit board, the probe head further comprising a plurality of probe contactor tips, the plurality of probe contactor tips defining a first plane;
the stiffener further comprising a third set of planarizing adjusters that come into contact with the probe card mount;
wherein the first, second and third set of planarizing adjusters may be actuated to alter the position of first plane.