Probe card assembly and method of forming same
View Patent ↗A probe card assembly has a probe contactor substrate having a plurality of probe contactor tips thereon and a probe card wiring board with an interposer disposed between the two. Support posts contacting the probe contactor substrate are vertically adjustable until secured by a locking mechanism which is coupled to the probe card wiring board. When the posts are secured in a fixed position, the position is one in which the plane of the plurality of probe contactor substrates is substantially parallel to a predetermined reference plane.
1. A probe card assembly comprising:
a probe contactor substrate having a plurality of probe contactor tips;
a probe card wiring board;
an interposer disposed between and electrically coupled to the probe contactor substrate and the probe card wiring board;
a support structure for adjusting the probe contactor substrate substantially along its x-axis, its y-axis, and its z-axis and in tilt, tip, and yaw, the support structure being adjustable until secured; and
a lock for securing an end of the support structure in a fixed position.
2. The probe card assembly of claim 1 , wherein the support structure includes a flexible region to accommodate angular variance of the probe contactor substrate with respect to the lock.
3. The probe card assembly of claim 2 wherein the flexible region is a thinned portion of the support structure.
4. The probe card assembly of claim 2 wherein the flexible region is a spring element.
5. The probe card assembly of claim 1 , wherein the lock is a set screw locking collar.
6. The probe card assembly of claim 5 , wherein the set screw locking collar includes a support collar having an aperture through which to receive a set screw to securely affix the vertical position of the support structure.
7. The probe card assembly of claim 1 , wherein the lock includes a collet.
8. The probe card assembly of claim 1 , wherein the lock is an adhesive bonded locking collar.
9. The probe card assembly of claim 1 wherein the support structure is coupled to the probe contactor substrate.
10. The probe card assembly of claim 1 wherein the support structure and the lock are removable from the probe card assembly after the support structure has been fixedly secured to the lock.
11. The probe card assembly of claim 1 wherein the lock is coupled to the probe card wiring board.
12. The probe card assembly of claim 1 wherein the support structure contacts the probe contactor substrate.
13. The probe card assembly of claim 1 further including a support frame coupled to the probe contactor substrate and wherein the support structure contacts the support frame.
14. The probe card assembly of claim 13 wherein the support structure is coupled to the support frame.
15. The probe card assembly of claim 1 wherein the fixed position is one in which a plane of the plurality of probe contactor tips is substantially parallel to a predetermined reference plane.
16. The probe card assembly of claim 15 , wherein the reference plane is a plane of the probe card wiring board.
17. The probe card assembly of claim 15 , wherein the reference plane is determined by a plurality of reference points.
18. A probe card assembly comprising:
a probe contactor substrate having a plurality of probe contactor tips;
a probe card wiring board;
an interposer disposed between and electrically coupled to the probe contactor substrate and the probe card wiring board;
a support post for adjusting the probe contactor substrate substantially along its x-axis, its y-axis, and its z-axis and in tilt, tip, and yaw, the support post being adjustable until secured; and
a lock, coupled to a mounting structure, for fixedly securing an end of the support post in a fixed position, wherein the fixed position is one in which a plane of the plurality of probe contactor tips is substantially parallel to a predetermined reference plane.
19. The probe card assembly of claim 18 , wherein the reference plane is a plane of the probe card wiring board.
20. The probe card assembly of claim 18 wherein the reference plane is determined by a plurality of mounting points.
21. The probe card assembly of claim 18 , wherein the support post includes a flexible region to accommodate angular misalignment of the probe contactor substrate with respect to the reference plane.
22. The probe card assembly of claim 21 wherein the flexible region is a thinned portion of the support post.
23. The probe card assembly of claim 21 wherein the flexible region is a spring element.
24. The probe card assembly of claim 18 , wherein the lock is a set screw locking collar.
25. The probe card assembly of claim 24 , wherein the set screw locking collar includes a support collar having an aperture through which to receive a set screw to securely affix the vertical position of the support post.
26. The probe card assembly of claim 18 , wherein the lock includes a collet.
27. The probe card assembly of claim 18 , wherein the lock is an adhesive bonded locking collar.
28. The probe card assembly of claim 18 wherein the support post is coupled to the probe contactor substrate.
29. The probe card assembly of claim 18 wherein the support post and the lock are removable from the probe card assembly after the support post has been fixedly secured to the lock.
30. The probe card assembly of claim 18 wherein the support post contacts the probe contactor substrate.
31. The probe card assembly of claim 18 further including a support frame coupled to the probe contactor substrate and wherein the support post contacts the support frame.
32. The probe card assembly of claim 31 wherein the support structure is coupled to the support frame.
33. The probe card assembly of claim 18 wherein the mounting structure is a stiffener coupled to the probe card wiring board.
34. The probe card assembly of claim 18 wherein the mounting structure is the probe card wiring board.