IP Library Granted Patent US 7,994,057
Granted Patent B2
US 7,994,057 · App. 12/234,173 · Granted Aug 9, 2011

Polishing composition and method utilizing abrasive particles treated with an aminosilane

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Quick Facts
Patent No.
US 7,994,057
App. No.
12/234,173
Granted
Aug 9, 2011
Kind
B2
Abstract

The inventive method comprises chemically-mechanically polishing a substrate with an inventive polishing composition comprising a liquid carrier, a cationic polymer, an acid, and abrasive particles that have been treated with an aminosilane compound.

Claims (32)

1. A chemical-mechanical polishing composition for polishing a substrate comprising:

(a) a liquid carrier,

(b) an abrasive suspended in the liquid carrier, wherein the abrasive comprises colloidal silica particles, and wherein the colloidal silica particles have a surface which has been treated with an aminosilane compound,

(c) at least one acidic component having a pKa of about 1 to about 4, wherein the at least one acidic component is present in an amount of about 500 ppm to about 3000 ppm, and

(d) a cationic polymer, wherein the cationic polymer is present in an amount of about 10 ppm to about 100 ppm;

wherein the polishing composition has a pH of about 1 to about 3.5.

2. The polishing composition of claim 1 , wherein the colloidal silica particles are present in the polishing composition in an amount of about 0.1 wt % to about 4 wt %.

3. The polishing composition of claim 1 , wherein the aminosilane compound is selected from the group consisting of a dipodal silane, aminopropyl trialkoxysilane, and bis(trimethoxysilylpropyl)amine.

4. The polishing composition of claim 1 , wherein the colloidal silica particles having a surface which has been treated with the aminosilane compound have a zeta potential of 5 mV or greater.

5. The polishing composition of claim 1 , wherein the aminosilane compound is present in an amount of about 50 ppm to about 500 ppm.

6. The polishing composition of claim 1 , wherein the at least one acidic component is selected from the group consisting of an inorganic acid, a carboxylic acid, an organic phosphonic acid, an acidic heterocyclic compound, 1-hydroxyethylidene-1,1-diphosphonic acid, amino tri(methylene phosphonic acid), a salt thereof, and combinations thereof.

7. The polishing composition of claim 1 , wherein the polishing composition has a pH of about 1.5 to about 3.5.

8. The polishing composition of claim 1 , wherein the cationic polymer is either a monomer of methacryloyloxyethyltrimethylammonium or diallyldimethylammonium.

9. A method of chemically-mechanically polishing a substrate, which method comprises:

(i) contacting a substrate with a chemical-mechanical polishing composition comprising:

(a) a liquid carrier,

(b) an abrasive suspended in the liquid carrier, wherein the abrasive comprises colloidal silica, and wherein the colloidal silica particles have a surface which has been treated with an aminosilane compound,

(c) at least one acidic component having a pKa of about 1 to about 4, wherein the at least one acidic component is present in an amount of about 500 ppm to about 3000 ppm, and

(d) a cationic polymer, wherein the cationic polymer is present in an amount of about 10 ppm to about 100 ppm,

wherein the polishing composition has pH of about 1 to about 3.5,

(ii) moving the polishing composition relative to the substrate, and

(iii) abrading at least a portion of the substrate to polish the substrate.

10. The method of claim 9 , wherein the colloidal silica particles are present in the polishing composition in an amount of about 0.1 wt % to about 4.0 wt %.

11. The method of claim 9 , wherein the colloidal silica particles having a surface which has been treated with the aminosilane compound have a zeta potential of 5 mV or greater.

12. The method of claim 9 , wherein the aminosilane compound is selected from the group consisting of a dipodal silane, aminopropyl trialkoxysilane, and bis(trimethoxysilylpropyl)amine.

13. The method of claim 9 , wherein the aminosilane compound is present in an amount of about 100 ppm to about 500 ppm.

14. The method of claim 9 , wherein the at least one acidic component is selected from the group consisting of an inorganic acid, a carboxylic acid, an organic phosphonic acid, an acidic heterocyclic compound, 1-hydroxyethylidene-1,1-diphosphonic acid, amino tri(methylene phosphonic acid), a salt thereof, and combinations thereof.

15. The method of claim 9 , wherein the polishing composition has a pH of about 1.5 to about 3.5.

16. The method of claim 9 , wherein the cationic polymer is either a monomer of methacryloyloxyethyltrimethylammonium or diallyldimethylammonium.

17. The method of claim 9 , wherein the substrate comprises at least one layer of silicon nitride.

18. The method of claim 17 , wherein the substrate comprises at least one layer of silicon oxide.

19. The method of claim 18 , wherein the silicon nitride is removed from the substrate at a rate greater than that of the silicon oxide.

Assignments (10)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
RELEASE OF SECURITY INTEREST Recorded Nov 16, 2018
From: BANK OF AMERICA, N.A.
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 047587/0119 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
NOTICE OF SECURITY INTEREST IN PATENTS Recorded Feb 16, 2012
From: CABOT MICROELECTRONICS CORPORATION
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 027727/0275 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 24, 2009
From: DYSARD, JEFFREY; ANJUR, SRIRAM; GRUMBINE, STEVEN; WHITE, DANIELA; WARD, WILLIAM
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 023004/0010 →