IP Library Granted Patent US 9,330,703
Granted Patent B2
US 9,330,703 · App. 12/455,631 · Granted May 3, 2016

Polishing composition for nickel-phosphorous memory disks

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Quick Facts
Patent No.
US 9,330,703
App. No.
12/455,631
Granted
May 3, 2016
Kind
B2
Abstract

The invention provides a chemical-mechanical polishing composition comprising alpha alumina, fumed alumina, silica, an oxidizing agent that oxidizes nickel-phosphorous, a complexing agent, and water. The invention also provides a method of chemically-mechanically polishing a substrate comprising contacting a substrate with a polishing pad and the chemical-mechanical polishing composition, moving the polishing pad and the polishing composition relative to the substrate, and abrading at least a portion of the substrate to polish the substrate.

Claims (18)

1. A method of chemically-mechanically polishing a nickel-phosphorous-coated aluminum substrate comprising:

(i) contacting a substrate with a polishing pad and a chemical-mechanical polishing composition comprising:

(a) fumed alumina particles,

(b) alpha alumina particles,

(c) substantially spherical, non-aggregated silica particles,

(d) about 10 ppm to about 200 ppm nonionic surfactant

(d) an oxidizing agent comprising 0.05 wt. % to about 0.3 wt. % of hydrogen peroxide, about 0.1 wt. % to about 0.5 wt. % potassium hydrogen peroxymonosulfate sulfate, and about 0.5 wt. % to about 1 wt. % sodium persulfate,

(e) a complexing agent, and

(f) water,

(ii) moving the polishing pad relative to the substrate with the chemical-mechanical polishing composition there between, and

(iii) abrading at least a portion of the substrate to polish the substrate, wherein the microwaviness and edge roll-off in the polished substrate is improved compared to substrates polished with identical polishing compositions, but having only one or two of the oxidizing agents.

2. The method of claim 1 , wherein the polishing composition comprises about 0.1 wt. % to about 3 wt. % of fumed alumina particles, about 0.1 wt. % to about 1 wt. % of alpha alumina particles, and about 0.5 wt. % to about 5 wt. % of substantially spherical, non-aggregated silica particles.

3. The polishing composition of claim 1 , wherein the nonionic surfactant is a copolymer surfactant comprising siloxane units, ethylene oxide units, and propylene oxide units.

4. The method of claim 1 , wherein the polishing composition comprises about 0.1 wt. % to about 5 wt. % complexing agent.

5. The method of claim 1 , wherein the complexing agent is an amino acid.

6. The method of claim 1 , wherein the complexing agent is glycine.

7. The method of claim 1 , wherein the substrate comprises a nickel-phosphorous-coated aluminum disk.

8. The method of claim 7 , wherein the disk is a memory disk.

Assignments (10)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
RELEASE OF SECURITY INTEREST Recorded Nov 16, 2018
From: BANK OF AMERICA, N.A.
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 047587/0119 →
NOTICE OF SECURITY INTEREST IN PATENTS Recorded Feb 16, 2012
From: CABOT MICROELECTRONICS CORPORATION
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 027727/0275 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 18, 2010
From: PALANISAMY CHINNATHAMBI, SELVARAJ; SIRIWARDANE, HARESH
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 023955/0463 →