IP Library Granted Patent US 8,883,034
Granted Patent B2
US 8,883,034 · App. 12/462,638 · Granted Nov 11, 2014

Composition and method for polishing bulk silicon

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,883,034
App. No.
12/462,638
Granted
Nov 11, 2014
Kind
B2
Abstract

The invention provides a polishing composition comprising (a) silica, (b) one or more compounds that increases the removal rate of silicon, (c) one or more tetraalkylammonium salts, and (d) water, wherein the polishing composition has a pH of about 7 to about 11. The invention further provides a method of polishing a substrate with the polishing composition.

Claims (26)

1. A chemical-mechanical polishing composition consisting essentially of:

(a) about 0.5 wt. % to about 20 wt. % of silica,

(b) about 0.02 wt. % to about 5 wt. % of one or more organic carboxylic acids,

(c) about 0.05 wt. % to about 2 wt. % of one or more aminophosphonic acids,

(d) about 0.1 wt. % to about 5 wt. % of one or more tetraalkylammonium salts selected from the group consisting of tetraalkylammonium hydroxide, chloride, bromide, sulfate, and hydrogensulfate salts,

(e) potassium bicarbonate,

(f) optionally potassium hydroxide, and

(g) water,

wherein the polishing composition has a pH of about 8 to about 11.

2. The polishing composition of claim 1 , wherein the silica is present in the polishing composition in an amount of from about 5 wt. % to about 20 wt% .

3. The polishing composition of claim 2 , wherein the silica is present in the polishing composition in an amount of from about 10 wt. % to about 15 wt. %.

4. The polishing composition of claim 1 , wherein the silica is wet-process silica.

5. The polishing composition of claim 1 , wherein the organic carboxylic acid is present in the polishing composition in an amount of from about 0.1 wt. % to about 2 wt. %.

6. The polishing composition of claim 1 , wherein at least one organic carboxylic acid is a hydroxycarboxylic acid.

7. The polishing composition of claim 6 , wherein the organic carboxylic acid is an aliphatic hydroxycarboxylic acid.

8. The polishing composition of claim 7 , wherein the organic carboxylic acid is selected from the group consisting of lactic acid, 2-hydroxybutyric acid, benzilic acid, and combinations thereof.

9. The polishing composition of claim 1 , wherein at least one organic carboxylic acid is a hydroxybenzoic acid.

10. The polishing composition of claim 9 , wherein the organic carboxylic acid is selected from the group consisting of salicylic acid, 2,6-dihydroxybenzoic acid, and combinations thereof.

11. The polishing composition of claim 9 , wherein the organic carboxylic acid is an amino hydroxybenzoic acid.

12. The polishing composition of claim 1 , wherein at least one carboxylic acid is an amino acid.

13. The polishing composition of claim 12 , wherein the amino acid is selected from the group consisting of proline, glycine, alanine, and combinations thereof.

14. The polishing composition of claim 1 , wherein the at least one aminophosphonic acid is present in the polishing composition in an amount of from about 0.1 wt . % to about 1 wt. %.

15. The polishing composition of claim 14 , wherein the aminophosphonic acid is selected from the group consisting of ethylenediaminetetra(methylene phosphonic acid), amino tri(methylene phosphonic acid), diethylenetriaminepenta(methylene phosphonic acid), and combinations thereof.

16. The polishing composition of claim 15 , wherein the aminophophonic acid is amino tri(methylene phosphonic acid).

17. The polishing composition of claim 1 , wherein potassium hydroxide is present in the polishing composition.

18. The polishing composition of claim 1 , wherein the polishing composition has a pH of about 8 to about 10.

Assignments (10)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
RELEASE OF SECURITY INTEREST Recorded Nov 16, 2018
From: BANK OF AMERICA, N.A.
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 047587/0119 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
NOTICE OF SECURITY INTEREST IN PATENTS Recorded Feb 16, 2012
From: CABOT MICROELECTRONICS CORPORATION
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 027727/0275 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 18, 2010
From: REISS, BRIAN; CLARK, JOHN; JONES, LAMON; GILLILAND, JEFFREY; WHITE, MICHAEL
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 023956/0694 →