IP Library Granted Patent US 9,951,054
Granted Patent B2
US 9,951,054 · App. 12/761,016 · Granted Apr 24, 2018

CMP porous pad with particles in a polymeric matrix

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Quick Facts
Patent No.
US 9,951,054
App. No.
12/761,016
Granted
Apr 24, 2018
Kind
B2
Abstract

The invention provides a chemical-mechanical polishing pad comprising a polymeric matrix and 0.1-15 wt. % of metal oxide particles. The polymeric matrix has pores, the metal oxide particles are uniformly distributed throughout the pores, and the metal oxide particles have a specific surface area of about 25 m 2 /g to about 450 m 2 /g. The invention further provides a method of polishing a substrate with the polishing pad.

Claims (24)

1. A chemical-mechanical polishing pad comprising a polymeric matrix and 0.1-15 wt. % of metal oxide particles, wherein the pad has pores, the metal oxide particles are uniformly distributed throughout the pores, and the metal oxide particles have a specific surface area of about 25 m 2 /g to about 450 m 2 /g, wherein the polymeric matrix comprises thermoplastic polyurethane.

2. The polishing pad of claim 1 , wherein the metal oxide particles comprise silica particles.

3. The polishing pad of claim 2 , wherein the metal oxide particles comprise fumed silica particles.

4. The polishing pad of claim 1 , wherein the pad has a Shore A hardness measurement of about 65 to about 85.

5. The polishing pad of claim 1 , wherein the pad has a void volume of about 20% to about 60%.

6. The polishing pad of claim 1 , wherein the average pore size is about 50 μm to about 150 μm.

7. The polishing pad of claim 1 , wherein the pad has a glass transition temperature Tg of about −30° C. to about +10° C.

8. The polishing pad of claim 1 , wherein the pad has an elastic modulus E of about 30 MPa to about 100 MPa at 30° C.

9. The polishing pad of claim 1 , wherein the pad has a water contact angle of about 20° to about 70° in 15 min.

10. The polishing pad of claim 1 , wherein the metal oxide particles comprise fumed silica particles, the polymeric matrix comprises thermoplastic polyurethane, and where the pad has a void volume of about 20% to about 60%, an average pore size of about 50 μm to about 150 μm, a Shore A hardness measurement of about 65 to about 85, a glass transition temperature of about −30° C. to about +10° C., an elastic modulus E of about 30 MPa to about 100 MPa at 30° C., and a water contact angle of about 20° to about 70° in 15 min.

11. A method of polishing a substrate, the method comprising:

(i) providing a polishing pad having a polishing layer comprised of a polymeric matrix and 0.1-15 wt % of metal oxide particles, wherein the pad has pores, the metal oxide particles are uniformly distributed throughout the pores, the metal oxide particles have a specific surface area of about 25 m 2 /g to about 450 m 2 /g, and the polymeric matrix comprises thermoplastic polyurethane,

(ii) applying a chemical-mechanical polishing composition to the polishing layer of the polishing pad,

(iii) contacting the polishing layer of the polishing pad with a substrate, and

(iv) moving the polishing pad with respect to the substrate so as to abrade at least a portion of the substrate and thereby polish the substrate.

12. The method of claim 11 , wherein the metal oxide particles comprise silica particles.

13. The method of claim 12 , wherein the metal oxide particles comprise fumed silica particles.

14. The method of claim 11 , wherein the pad has a Shore A hardness measurement of about 65 to about 85.

15. The method of claim 11 , wherein the pad has a void volume of about 20% to about 60%.

16. The method of claim 11 , wherein the average pore size is about 50 μm to about 150 μm.

17. The method of claim 11 , wherein the pad has a transition temperature Tg of about −30° C. to about +10° C.

18. The method of claim 11 , wherein the pad has an elastic modulus E of about 30 MPa to about 100 MPa at 30° C.

19. The method of claim 11 , wherein the pad has a water contact angle of about 20° to about 70° in 15 min.

20. The method of claim 11 , wherein the metal oxide particles comprise fumed silica particles, the polymeric matrix comprises thermoplastic polyurethane, and where the pad has a void volume of about 20% to about 60%, an average pore size of about 50 μm to about 150 μm, a Shore A hardness measurement of about 65 μm to about 85 μm, a glass transition temperature of about −30° C. to about +10° C., an elastic modulus E of about 30 MPa to about 100 MPa at 30° C., and a water contact angle of about 20° to about 70° in 15 min.

Assignments (10)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
RELEASE OF SECURITY INTEREST Recorded Nov 16, 2018
From: BANK OF AMERICA, N.A.
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 047587/0119 →
NOTICE OF SECURITY INTEREST IN PATENTS Recorded Feb 16, 2012
From: CABOT MICROELECTRONICS CORPORATION
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 027727/0275 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 23, 2010
From: LI, SHOUTIAN; VACASSY, ROBERT; KASTHURI, JAISHANKAR
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 024874/0159 →