IP Library Granted Patent US 8,623,766
Granted Patent B2
US 8,623,766 · App. 13/237,881 · Granted Jan 7, 2014

Composition and method for polishing aluminum semiconductor substrates

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Quick Facts
Patent No.
US 8,623,766
App. No.
13/237,881
Granted
Jan 7, 2014
Kind
B2
Abstract

The invention provides a chemical-mechanical polishing composition comprising coated α-alumina particles, an organic carboxylic acid, and water. The invention also provides a chemical-mechanical polishing composition comprising an abrasive having a negative zeta potential in the polishing composition, an organic carboxylic acid, at least one alkyldiphenyloxide disulfonate surfactant, and water, wherein the polishing composition does not further comprise a heterocyclic compound. The abrasive is colloidally stable in the polishing composition. The invention further provides methods of polishing a substrate with the aforesaid polishing compositions.

Claims (35)

1. A method of chemically-mechanically polishing a substrate, which method comprises:

(i) providing a substrate comprising at least one layer of aluminum,

(ii) providing a polishing pad,

(iii) providing a polishing composition comprising:

(a) an abrasive consisting of α-alumina particles, wherein the α-alumina particles are coated with a copolymer comprising at least one sulfonate monomer and at least one monomer selected from the group consisting of carboxylate monomers, phosphonate monomers, and phosphate monomers,

(b) a complexing agent for aluminum, and

(c) water,

(iv) contacting a surface of the substrate with the polishing pad and the polishing composition, and

(v) abrading at least a portion of the surface of the substrate to remove at least some aluminum from the surface of the substrate and to polish the surface of the substrate,

wherein the polishing composition has a pH of about 1 to about 6, and wherein the abrasive is colloidally stable in the polishing composition.

2. The method of claim 1 , wherein the copolymer comprises a combination of at least one sulfonate monomer and at least one carboxylate monomer.

3. The method of claim 2 , wherein at least one carboxylate monomer comprises at least one acrylate monomer.

4. The method of claim 1 , wherein the complexing agent for aluminum comprises an organic carboxylic acid.

5. The method of claim 4 , wherein the organic carboxylic acid is selected from the group consisting of malonic acid, phthalic acid, lactic acid, tartaric acid, gluconic acid, citric acid, malic acid, glycolic acid, maleic acid, and combinations thereof.

6. The method of claim 1 , wherein the polishing composition further comprises an agent that oxidizes aluminum.

7. The method of claim 6 , wherein the agent that oxidizes aluminum is selected from the group consisting of hydrogen peroxide, organic peroxy acids, persulfate, nitrate, periodate, perbromate, bromate, ferric salts, and combinations thereof.

8. The method of claim 1 , wherein the polishing composition further comprises a surfactant.

9. The method of claim 8 , wherein the surfactant is an alkyldiphenyloxide disulfonate surfactant.

10. The method of claim 1 , wherein the substrate further comprises at least one layer selected from the group consisting of tungsten, titanium, titanium nitride, tantalum, and tantalum nitride.

11. A method of chemically-mechanically polishing a substrate, which method comprises:

(i) providing a substrate comprising at least one layer of aluminum,

(ii) providing a polishing pad,

(iii) providing a polishing composition comprising:

(a) an abrasive, wherein the abrasive comprises particles having a negative zeta potential in the polishing composition,

(b) a complexing agent for aluminum,

(c) at least one alkyldiphenyloxide disulfonate surfactant, and

(d) water,

(iv) contacting a surface of the substrate with the polishing pad and the polishing composition, and

(v) abrading at least a portion of the surface of the substrate to remove at least some aluminum from the surface of the substrate and to polish the surface of the substrate,

wherein the polishing composition has a pH of about 1 to about 6, and wherein the abrasive is colloidally stable in the polishing composition.

12. The method of claim 11 , wherein the abrasive is selected from the group consisting of wet process silica, fumed silica, and surface-coated α-alumina.

13. The method of claim 11 , wherein the complexing agent for aluminum comprises an organic carboxylic acid.

14. The method of claim 13 , wherein the organic carboxylic acid is selected from the group consisting of malonic acid, phthalic acid, lactic acid, tartaric acid, gluconic acid, citric acid, malic acid, glycolic acid, maleic acid, and combinations thereof.

15. The method of claim 11 , wherein the polishing composition further comprises an agent that oxidizes aluminum.

16. The method of claim 15 , wherein the agent that oxidizes aluminum is selected from the group consisting of hydrogen peroxide, organic peroxy acids, persulfate, nitrate, periodate, perbromate, bromate, ferric salts, and combinations thereof.

Assignments (10)
CHANGE OF NAME Recorded Nov 22, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065663/0466 →
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
RELEASE OF SECURITY INTEREST Recorded Nov 16, 2018
From: BANK OF AMERICA, N.A.
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 047587/0119 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
NOTICE OF SECURITY INTEREST IN PATENTS Recorded Feb 16, 2012
From: CABOT MICROELECTRONICS CORPORATION
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 027727/0275 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 11, 2011
From: CUI, JI; GRUMBINE, STEVEN; WHITENER, GLENN; LIN, CHIH-AN
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 027041/0421 →